{"id":"https://openalex.org/W1582424008","doi":"https://doi.org/10.1007/978-3-642-16239-8_35","title":"A Novel Feature Selection Method for Fault Diagnosis","display_name":"A Novel Feature Selection Method for Fault Diagnosis","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W1582424008","doi":"https://doi.org/10.1007/978-3-642-16239-8_35","mag":"1582424008"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-16239-8_35","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-642-16239-8_35","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F978-3-642-16239-8_35.pdf","source":{"id":"https://openalex.org/S4210175514","display_name":"IFIP International Federation for Information Processing/IFIP","issn_l":"1571-5736","issn":["1571-5736","1861-2288"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://link.springer.com/content/pdf/10.1007%2F978-3-642-16239-8_35.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012749835","display_name":"Zacharias Voulgaris","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zacharias Voulgaris","raw_affiliation_strings":["ICSL lab, Georgia Institute of Technology, Atlanta, USA","[Georgia Institute of Technology.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICSL lab, Georgia Institute of Technology, Atlanta, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology.]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017655153","display_name":"Chris Sconyers","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chris Sconyers","raw_affiliation_strings":["ICSL lab, Georgia Institute of Technology, Atlanta, USA","[Georgia Institute of Technology.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICSL lab, Georgia Institute of Technology, Atlanta, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology.]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9405,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.75587273,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"262","last_page":"269"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10820","display_name":"Fuzzy Logic and Control Systems","score":0.9599000215530396,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature-selection","display_name":"Feature selection","score":0.8007473945617676},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.6711786985397339},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6363542079925537},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6285472512245178},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5787337422370911},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5544824600219727},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5148805379867554},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.5069887638092041},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5045112371444702},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.45386481285095215},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16957393288612366}],"concepts":[{"id":"https://openalex.org/C148483581","wikidata":"https://www.wikidata.org/wiki/Q446488","display_name":"Feature selection","level":2,"score":0.8007473945617676},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.6711786985397339},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6363542079925537},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6285472512245178},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5787337422370911},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5544824600219727},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5148805379867554},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.5069887638092041},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5045112371444702},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.45386481285095215},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16957393288612366},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-642-16239-8_35","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-642-16239-8_35","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F978-3-642-16239-8_35.pdf","source":{"id":"https://openalex.org/S4210175514","display_name":"IFIP International Federation for Information Processing/IFIP","issn_l":"1571-5736","issn":["1571-5736","1861-2288"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},{"id":"pmh:oai:HAL:hal-01060676v1","is_oa":true,"landing_page_url":"https://inria.hal.science/hal-01060676","pdf_url":null,"source":{"id":"https://openalex.org/S4406922276","display_name":"INRIA a CCSD electronic archive server","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"6th IFIP WG 12.5 International Conference on Artificial Intelligence Applications and Innovations (AIAI), Oct 2010, Larnaca, Cyprus. pp.262-269, ⟨10.1007/978-3-642-16239-8_35⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"doi:10.1007/978-3-642-16239-8_35","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-642-16239-8_35","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F978-3-642-16239-8_35.pdf","source":{"id":"https://openalex.org/S4210175514","display_name":"IFIP International Federation for Information Processing/IFIP","issn_l":"1571-5736","issn":["1571-5736","1861-2288"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309321","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1582424008.pdf","grobid_xml":"https://content.openalex.org/works/W1582424008.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W140777655","https://openalex.org/W591732527","https://openalex.org/W1480708938","https://openalex.org/W1564855135","https://openalex.org/W1984549155","https://openalex.org/W1989344766","https://openalex.org/W2008266158","https://openalex.org/W2125019300","https://openalex.org/W2343122643","https://openalex.org/W2788350087","https://openalex.org/W2902138010","https://openalex.org/W4249190976"],"related_works":["https://openalex.org/W4205762803","https://openalex.org/W2535856026","https://openalex.org/W2265065644","https://openalex.org/W2134699697","https://openalex.org/W3147584709","https://openalex.org/W2322875716","https://openalex.org/W2977677679","https://openalex.org/W2468698815","https://openalex.org/W4386564352","https://openalex.org/W2952668426"],"abstract_inverted_index":null,"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}