{"id":"https://openalex.org/W1568364889","doi":"https://doi.org/10.1007/978-3-642-15651-9_21","title":"Integrated Cyber-Physical Fault Injection for Reliability Analysis of the Smart Grid","display_name":"Integrated Cyber-Physical Fault Injection for Reliability Analysis of the Smart Grid","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W1568364889","doi":"https://doi.org/10.1007/978-3-642-15651-9_21","mag":"1568364889"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-15651-9_21","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-15651-9_21","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042226008","display_name":"Ayman Faza","orcid":"https://orcid.org/0000-0001-6495-7547"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ayman Faza","raw_affiliation_strings":["Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034405406","display_name":"Sahra Sedigh","orcid":"https://orcid.org/0000-0002-2917-5643"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sahra Sedigh","raw_affiliation_strings":["Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060566208","display_name":"Bruce McMillin","orcid":"https://orcid.org/0000-0002-2158-0337"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bruce McMillin","raw_affiliation_strings":["Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I20382870"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":3.0415,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.90290539,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"277","last_page":"290"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10400","display_name":"Network Security and Intrusion Detection","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10714","display_name":"Software-Defined Networks and 5G","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cyber-physical-system","display_name":"Cyber-physical system","score":0.8648174405097961},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7595738768577576},{"id":"https://openalex.org/keywords/smart-grid","display_name":"Smart grid","score":0.7192978858947754},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6235678195953369},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5622382164001465},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5379963517189026},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5359097123146057},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.4754892587661743},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.46685415506362915},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4441046714782715},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4419674575328827},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.43333572149276733},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.3177046775817871},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2710845470428467},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13989201188087463},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12358114123344421},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08152160048484802}],"concepts":[{"id":"https://openalex.org/C179768478","wikidata":"https://www.wikidata.org/wiki/Q1120057","display_name":"Cyber-physical system","level":2,"score":0.8648174405097961},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7595738768577576},{"id":"https://openalex.org/C10558101","wikidata":"https://www.wikidata.org/wiki/Q689855","display_name":"Smart grid","level":2,"score":0.7192978858947754},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6235678195953369},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5622382164001465},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5379963517189026},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5359097123146057},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.4754892587661743},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.46685415506362915},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4441046714782715},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4419674575328827},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.43333572149276733},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3177046775817871},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2710845470428467},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13989201188087463},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12358114123344421},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08152160048484802},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-15651-9_21","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-15651-9_21","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6399999856948853,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W69968099","https://openalex.org/W1480629508","https://openalex.org/W1537236429","https://openalex.org/W1542396407","https://openalex.org/W1548900994","https://openalex.org/W1564247881","https://openalex.org/W1676830510","https://openalex.org/W1836531985","https://openalex.org/W1845451745","https://openalex.org/W1973309971","https://openalex.org/W2066400417","https://openalex.org/W2079495409","https://openalex.org/W2098924678","https://openalex.org/W2105991926","https://openalex.org/W2107593647","https://openalex.org/W2111668656","https://openalex.org/W2120482719","https://openalex.org/W2143709101","https://openalex.org/W2146300017","https://openalex.org/W2158759444","https://openalex.org/W2175605877","https://openalex.org/W2944338860"],"related_works":["https://openalex.org/W2971479921","https://openalex.org/W2607474334","https://openalex.org/W2138861322","https://openalex.org/W2902466307","https://openalex.org/W3145923041","https://openalex.org/W2946906624","https://openalex.org/W841176518","https://openalex.org/W188714996","https://openalex.org/W2101077206","https://openalex.org/W2157727563"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-08-22T07:34:49.880490","created_date":"2025-10-10T00:00:00"}