{"id":"https://openalex.org/W79661704","doi":"https://doi.org/10.1007/978-3-642-10430-5_76","title":"A General Framework of Measurement System Configuration for Large and Complex Components","display_name":"A General Framework of Measurement System Configuration for Large and Complex Components","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W79661704","doi":"https://doi.org/10.1007/978-3-642-10430-5_76","mag":"79661704"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-10430-5_76","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-10430-5_76","pdf_url":null,"source":{"id":"https://openalex.org/S4210208846","display_name":"Advances in intelligent and soft computing","issn_l":"1867-5662","issn":["1867-5662","1867-5670"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent and Soft Computing","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049226851","display_name":"Lianyu Zheng","orcid":"https://orcid.org/0000-0003-1489-4829"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"L. Y. Zheng","raw_affiliation_strings":["BeiHang University, Beijing, 100191, China","BeiHang University, BeiJing, China"],"affiliations":[{"raw_affiliation_string":"BeiHang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"BeiHang University, BeiJing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080748839","display_name":"Fan Yang","orcid":"https://orcid.org/0000-0002-7938-2763"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"F. L. Yang","raw_affiliation_strings":["BeiHang University, Beijing, 100191, China","BeiHang University, BeiJing, China"],"affiliations":[{"raw_affiliation_string":"BeiHang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"BeiHang University, BeiJing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053433672","display_name":"A. J. Ni","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"A. J. Ni","raw_affiliation_strings":["BeiHang University, Beijing, 100191, China","BeiHang University, BeiJing, China"],"affiliations":[{"raw_affiliation_string":"BeiHang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"BeiHang University, BeiJing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5049226851"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.8749,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.82664033,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"983","last_page":"997"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.6545383334159851},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.6004153490066528},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5690024495124817},{"id":"https://openalex.org/keywords/configuration-design","display_name":"Configuration design","score":0.5592766404151917},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5395042896270752},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.530876636505127},{"id":"https://openalex.org/keywords/system-deployment","display_name":"System deployment","score":0.5123685598373413},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4930212199687958},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.47465091943740845},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.4641963243484497},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.44080281257629395},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.4358745515346527},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.433440625667572},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.41432783007621765},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.36600443720817566},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.35885101556777954},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28764569759368896},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.11376753449440002}],"concepts":[{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.6545383334159851},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.6004153490066528},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5690024495124817},{"id":"https://openalex.org/C10451660","wikidata":"https://www.wikidata.org/wiki/Q5160113","display_name":"Configuration design","level":2,"score":0.5592766404151917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5395042896270752},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.530876636505127},{"id":"https://openalex.org/C81293917","wikidata":"https://www.wikidata.org/wiki/Q4189534","display_name":"System deployment","level":3,"score":0.5123685598373413},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4930212199687958},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.47465091943740845},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.4641963243484497},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.44080281257629395},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.4358745515346527},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.433440625667572},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.41432783007621765},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.36600443720817566},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.35885101556777954},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28764569759368896},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.11376753449440002},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-642-10430-5_76","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-10430-5_76","pdf_url":null,"source":{"id":"https://openalex.org/S4210208846","display_name":"Advances in intelligent and soft computing","issn_l":"1867-5662","issn":["1867-5662","1867-5670"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent and Soft Computing","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W87643085","https://openalex.org/W2001856064","https://openalex.org/W2034456101","https://openalex.org/W2037801229","https://openalex.org/W2092628577","https://openalex.org/W2136595036","https://openalex.org/W2142590930","https://openalex.org/W2292385115"],"related_works":["https://openalex.org/W1998546186","https://openalex.org/W2120447654","https://openalex.org/W2977179488","https://openalex.org/W2061967405","https://openalex.org/W2144453115","https://openalex.org/W2128223750","https://openalex.org/W4238532390","https://openalex.org/W2071668446","https://openalex.org/W2085930114","https://openalex.org/W79661704"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}