{"id":"https://openalex.org/W1572859132","doi":"https://doi.org/10.1007/978-3-642-03798-6_21","title":"Deformation-Aware Log-Linear Models","display_name":"Deformation-Aware Log-Linear Models","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W1572859132","doi":"https://doi.org/10.1007/978-3-642-03798-6_21","mag":"1572859132"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-642-03798-6_21","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-03798-6_21","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109868937","display_name":"Tobias Gass","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Tobias Gass","raw_affiliation_strings":["Human Language Technology and Pattern Recognition Group, RWTH Aachen University, Aachen, Germany","Human Language Technol. & Pattern Recognition Group, RWTH Aachen Univ., Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Human Language Technology and Pattern Recognition Group, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"Human Language Technol. & Pattern Recognition Group, RWTH Aachen Univ., Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009225557","display_name":"Thomas Deselaers","orcid":null},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]},{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["CH","DE"],"is_corresponding":false,"raw_author_name":"Thomas Deselaers","raw_affiliation_strings":["Human Language Technology and Pattern Recognition Group, RWTH Aachen University, Aachen, Germany","Now with the Computer Vision Laboratory, ETH Zurich, Switzerland","Human Language Technology and Pattern Recognition Group, RWTH Aachen University, Aachen, Germany and Now with the Computer Vision Laboratory, ETH Zurich, Switzerland#TAB#"],"affiliations":[{"raw_affiliation_string":"Human Language Technology and Pattern Recognition Group, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"Now with the Computer Vision Laboratory, ETH Zurich, Switzerland","institution_ids":["https://openalex.org/I35440088"]},{"raw_affiliation_string":"Human Language Technology and Pattern Recognition Group, RWTH Aachen University, Aachen, Germany and Now with the Computer Vision Laboratory, ETH Zurich, Switzerland#TAB#","institution_ids":["https://openalex.org/I887968799","https://openalex.org/I35440088"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112501010","display_name":"Hermann Ney","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hermann Ney","raw_affiliation_strings":["Human Language Technology and Pattern Recognition Group, RWTH Aachen University, Aachen, Germany","Human Language Technol. & Pattern Recognition Group, RWTH Aachen Univ., Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Human Language Technology and Pattern Recognition Group, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"Human Language Technol. & Pattern Recognition Group, RWTH Aachen Univ., Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5109868937"],"corresponding_institution_ids":["https://openalex.org/I887968799"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.4233,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55759463,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"201","last_page":"210"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14339","display_name":"Image Processing and 3D Reconstruction","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10812","display_name":"Human Pose and Action Recognition","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mnist-database","display_name":"MNIST database","score":0.9444993734359741},{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.9227792024612427},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.7990424633026123},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6396026015281677},{"id":"https://openalex.org/keywords/deformation","display_name":"Deformation (meteorology)","score":0.6311543583869934},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.599746823310852},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.5678930878639221},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5462819933891296},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4316270053386688},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.32400915026664734},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.24950796365737915},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2267112135887146},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16178101301193237},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.08080622553825378}],"concepts":[{"id":"https://openalex.org/C190502265","wikidata":"https://www.wikidata.org/wiki/Q17069496","display_name":"MNIST database","level":3,"score":0.9444993734359741},{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.9227792024612427},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.7990424633026123},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6396026015281677},{"id":"https://openalex.org/C204366326","wikidata":"https://www.wikidata.org/wiki/Q3027650","display_name":"Deformation (meteorology)","level":2,"score":0.6311543583869934},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.599746823310852},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.5678930878639221},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5462819933891296},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4316270053386688},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.32400915026664734},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.24950796365737915},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2267112135887146},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16178101301193237},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08080622553825378},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/978-3-642-03798-6_21","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-642-03798-6_21","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.150.7558","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.150.7558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www-i6.informatik.rwth-aachen.de/publications/download/615/Gass-DAGM-2009.pdf","raw_type":"text"},{"id":"pmh:oai:publications.rwth-aachen.de:125746","is_oa":false,"landing_page_url":"https://publications.rwth-aachen.de/record/125746","pdf_url":null,"source":{"id":"https://openalex.org/S4306401033","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Pattern recognition : 31st DAGM Symposium, Jena, Germany, September 9-11, 2009 ; proceedings / Joachim Denzler; Gunther Notni; Herbert S\u00fc\u00dfe (eds.)<br/>31. DAGM Symposium, Jena, Germany, 2009-09-09 - 2009-09-11","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.7699999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1512606473","https://openalex.org/W2038658268","https://openalex.org/W2089988906","https://openalex.org/W2099322038","https://openalex.org/W2101534792","https://openalex.org/W2120190345","https://openalex.org/W2135833910","https://openalex.org/W2136922672","https://openalex.org/W2143908786","https://openalex.org/W2147880316","https://openalex.org/W2156163116","https://openalex.org/W2159737176","https://openalex.org/W2167782134","https://openalex.org/W2168353336"],"related_works":["https://openalex.org/W2950475743","https://openalex.org/W4386603768","https://openalex.org/W2886711096","https://openalex.org/W4380078352","https://openalex.org/W3046591097","https://openalex.org/W2590796488","https://openalex.org/W2734358244","https://openalex.org/W2750384547","https://openalex.org/W2901671134","https://openalex.org/W2727966874"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-11T08:14:18.477133","created_date":"2025-10-10T00:00:00"}