{"id":"https://openalex.org/W1567126387","doi":"https://doi.org/10.1007/978-3-540-78761-7_21","title":"Deterministic Test Pattern Generator Design","display_name":"Deterministic Test Pattern Generator Design","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W1567126387","doi":"https://doi.org/10.1007/978-3-540-78761-7_21","mag":"1567126387"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-540-78761-7_21","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-540-78761-7_21","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085417152","display_name":"Gregor Papa","orcid":"https://orcid.org/0000-0002-0623-0865"},"institutions":[{"id":"https://openalex.org/I3006985408","display_name":"Jo\u017eef Stefan Institute","ror":"https://ror.org/05060sz93","country_code":"SI","type":"facility","lineage":["https://openalex.org/I3006985408"]}],"countries":["SI"],"is_corresponding":true,"raw_author_name":"Gregor Papa","raw_affiliation_strings":["Jo\u017eef Stefan Institute, SI-1000, Ljubljana, Slovenia","\u201cJo\u017eef Stefan\u201d Institute , Ljubljana, Slovenia"],"affiliations":[{"raw_affiliation_string":"Jo\u017eef Stefan Institute, SI-1000, Ljubljana, Slovenia","institution_ids":["https://openalex.org/I3006985408"]},{"raw_affiliation_string":"\u201cJo\u017eef Stefan\u201d Institute , Ljubljana, Slovenia","institution_ids":["https://openalex.org/I3006985408"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057191451","display_name":"Tomasz Garbolino","orcid":"https://orcid.org/0000-0002-3682-2220"},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Tomasz Garbolino","raw_affiliation_strings":["Silesian University of Technology, PL-44100, Gliwice, Poland","Silesian University of Technology, Gliwice, Poland"],"affiliations":[{"raw_affiliation_string":"Silesian University of Technology, PL-44100, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]},{"raw_affiliation_string":"Silesian University of Technology, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108583318","display_name":"Franc Novak","orcid":null},"institutions":[{"id":"https://openalex.org/I3006985408","display_name":"Jo\u017eef Stefan Institute","ror":"https://ror.org/05060sz93","country_code":"SI","type":"facility","lineage":["https://openalex.org/I3006985408"]}],"countries":["SI"],"is_corresponding":false,"raw_author_name":"Franc Novak","raw_affiliation_strings":["Jo\u017eef Stefan Institute, SI-1000, Ljubljana, Slovenia","\u201cJo\u017eef Stefan\u201d Institute , Ljubljana, Slovenia"],"affiliations":[{"raw_affiliation_string":"Jo\u017eef Stefan Institute, SI-1000, Ljubljana, Slovenia","institution_ids":["https://openalex.org/I3006985408"]},{"raw_affiliation_string":"\u201cJo\u017eef Stefan\u201d Institute , Ljubljana, Slovenia","institution_ids":["https://openalex.org/I3006985408"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5085417152"],"corresponding_institution_ids":["https://openalex.org/I3006985408"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.3301,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.56440678,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"204","last_page":"213"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7936797142028809},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.6292821764945984},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.5332977771759033},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5231503248214722},{"id":"https://openalex.org/keywords/digital-pattern-generator","display_name":"Digital pattern generator","score":0.4986293315887451},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.4717206358909607},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.46942952275276184},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.45437192916870117},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.43343666195869446},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.33419251441955566},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.25331297516822815},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0822782814502716},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.07758155465126038}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7936797142028809},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.6292821764945984},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.5332977771759033},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5231503248214722},{"id":"https://openalex.org/C151346624","wikidata":"https://www.wikidata.org/wiki/Q5276129","display_name":"Digital pattern generator","level":3,"score":0.4986293315887451},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.4717206358909607},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.46942952275276184},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.45437192916870117},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.43343666195869446},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33419251441955566},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.25331297516822815},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0822782814502716},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.07758155465126038},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-540-78761-7_21","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-540-78761-7_21","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W149897481","https://openalex.org/W1502837022","https://openalex.org/W1559956479","https://openalex.org/W1639032689","https://openalex.org/W1876699397","https://openalex.org/W1938153123","https://openalex.org/W1966253115","https://openalex.org/W2013896839","https://openalex.org/W2026796809","https://openalex.org/W2033319918","https://openalex.org/W2096757277","https://openalex.org/W2096883589","https://openalex.org/W2102248717","https://openalex.org/W2106795799","https://openalex.org/W2125899728","https://openalex.org/W2477607063","https://openalex.org/W2534969321","https://openalex.org/W2904250082","https://openalex.org/W3023540311","https://openalex.org/W4248451031"],"related_works":["https://openalex.org/W2154529098","https://openalex.org/W2188176208","https://openalex.org/W2123022840","https://openalex.org/W2105858357","https://openalex.org/W2914537975","https://openalex.org/W2119351822","https://openalex.org/W1859800149","https://openalex.org/W2118970729","https://openalex.org/W1854778394","https://openalex.org/W4288754393"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}