{"id":"https://openalex.org/W1573122268","doi":"https://doi.org/10.1007/978-3-540-76719-0_56","title":"On-Line Monitoring and Diagnosis of Failures Using Control Charts and Fault Tree Analysis (FTA) Based on Digital Production Model","display_name":"On-Line Monitoring and Diagnosis of Failures Using Control Charts and Fault Tree Analysis (FTA) Based on Digital Production Model","publication_year":2007,"publication_date":"2007-11-12","ids":{"openalex":"https://openalex.org/W1573122268","doi":"https://doi.org/10.1007/978-3-540-76719-0_56","mag":"1573122268"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-540-76719-0_56","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-540-76719-0_56","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101463302","display_name":"Hui Peng","orcid":"https://orcid.org/0000-0002-9794-9225"},"institutions":[{"id":"https://openalex.org/I142078773","display_name":"Shenyang Institute of Automation","ror":"https://ror.org/00ft6nj33","country_code":"CN","type":"facility","lineage":["https://openalex.org/I142078773","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hui Peng","raw_affiliation_strings":["Shenyang Institute of Automation, Chinese Academy of Science, Shenyang 110014, China","Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang, China"],"affiliations":[{"raw_affiliation_string":"Shenyang Institute of Automation, Chinese Academy of Science, Shenyang 110014, China","institution_ids":["https://openalex.org/I142078773"]},{"raw_affiliation_string":"Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang, China","institution_ids":["https://openalex.org/I142078773"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115598505","display_name":"Wenli Shang","orcid":"https://orcid.org/0000-0001-8332-9036"},"institutions":[{"id":"https://openalex.org/I142078773","display_name":"Shenyang Institute of Automation","ror":"https://ror.org/00ft6nj33","country_code":"CN","type":"facility","lineage":["https://openalex.org/I142078773","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenli Shang","raw_affiliation_strings":["Shenyang Institute of Automation, Chinese Academy of Science, Shenyang 110014, China","Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang, China"],"affiliations":[{"raw_affiliation_string":"Shenyang Institute of Automation, Chinese Academy of Science, Shenyang 110014, China","institution_ids":["https://openalex.org/I142078773"]},{"raw_affiliation_string":"Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang, China","institution_ids":["https://openalex.org/I142078773"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101667505","display_name":"Haibo Shi","orcid":"https://orcid.org/0000-0001-9257-3022"},"institutions":[{"id":"https://openalex.org/I142078773","display_name":"Shenyang Institute of Automation","ror":"https://ror.org/00ft6nj33","country_code":"CN","type":"facility","lineage":["https://openalex.org/I142078773","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haibo Shi","raw_affiliation_strings":["Shenyang Institute of Automation, Chinese Academy of Science, Shenyang 110014, China","Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang, China"],"affiliations":[{"raw_affiliation_string":"Shenyang Institute of Automation, Chinese Academy of Science, Shenyang 110014, China","institution_ids":["https://openalex.org/I142078773"]},{"raw_affiliation_string":"Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang, China","institution_ids":["https://openalex.org/I142078773"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101774778","display_name":"Peng Wei","orcid":"https://orcid.org/0000-0002-1081-5487"},"institutions":[{"id":"https://openalex.org/I142078773","display_name":"Shenyang Institute of Automation","ror":"https://ror.org/00ft6nj33","country_code":"CN","type":"facility","lineage":["https://openalex.org/I142078773","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Peng","raw_affiliation_strings":["Shenyang Institute of Automation, Chinese Academy of Science, Shenyang 110014, China","Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang, China"],"affiliations":[{"raw_affiliation_string":"Shenyang Institute of Automation, Chinese Academy of Science, Shenyang 110014, China","institution_ids":["https://openalex.org/I142078773"]},{"raw_affiliation_string":"Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang, China","institution_ids":["https://openalex.org/I142078773"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101463302"],"corresponding_institution_ids":["https://openalex.org/I142078773"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.16009281,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"544","last_page":"549"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9851999878883362,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9394999742507935,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.6746985912322998},{"id":"https://openalex.org/keywords/control-chart","display_name":"Control chart","score":0.6556939482688904},{"id":"https://openalex.org/keywords/statistic","display_name":"Statistic","score":0.6304240822792053},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6111093163490295},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5492803454399109},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5145809054374695},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4901157319545746},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.48737865686416626},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.44881266355514526},{"id":"https://openalex.org/keywords/production-line","display_name":"Production line","score":0.4452475607395172},{"id":"https://openalex.org/keywords/monitoring-and-control","display_name":"Monitoring and control","score":0.4330088496208191},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4277505874633789},{"id":"https://openalex.org/keywords/discrete-manufacturing","display_name":"Discrete manufacturing","score":0.4220539927482605},{"id":"https://openalex.org/keywords/shewhart-individuals-control-chart","display_name":"Shewhart individuals control chart","score":0.4178309142589569},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.4114355444908142},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.33469903469085693},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3011671304702759},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15867850184440613},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10299360752105713}],"concepts":[{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.6746985912322998},{"id":"https://openalex.org/C196985124","wikidata":"https://www.wikidata.org/wiki/Q1369242","display_name":"Control chart","level":3,"score":0.6556939482688904},{"id":"https://openalex.org/C89128539","wikidata":"https://www.wikidata.org/wiki/Q1949963","display_name":"Statistic","level":2,"score":0.6304240822792053},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6111093163490295},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5492803454399109},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5145809054374695},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4901157319545746},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.48737865686416626},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.44881266355514526},{"id":"https://openalex.org/C99862985","wikidata":"https://www.wikidata.org/wiki/Q10858068","display_name":"Production line","level":2,"score":0.4452475607395172},{"id":"https://openalex.org/C2987858997","wikidata":"https://www.wikidata.org/wiki/Q7312160","display_name":"Monitoring and control","level":2,"score":0.4330088496208191},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4277505874633789},{"id":"https://openalex.org/C2780720960","wikidata":"https://www.wikidata.org/wiki/Q5282052","display_name":"Discrete manufacturing","level":3,"score":0.4220539927482605},{"id":"https://openalex.org/C159848633","wikidata":"https://www.wikidata.org/wiki/Q7495725","display_name":"Shewhart individuals control chart","level":5,"score":0.4178309142589569},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.4114355444908142},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.33469903469085693},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3011671304702759},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15867850184440613},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10299360752105713},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C74746147","wikidata":"https://www.wikidata.org/wiki/Q5324652","display_name":"EWMA chart","level":4,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-540-76719-0_56","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-540-76719-0_56","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1966479973","https://openalex.org/W1996469419","https://openalex.org/W2001548922","https://openalex.org/W2013928026","https://openalex.org/W2021511007","https://openalex.org/W2043711423","https://openalex.org/W2061417262","https://openalex.org/W2081907259","https://openalex.org/W2419865627"],"related_works":["https://openalex.org/W4385650182","https://openalex.org/W2008371501","https://openalex.org/W2213954818","https://openalex.org/W1586634285","https://openalex.org/W2931607628","https://openalex.org/W2489717886","https://openalex.org/W2373090646","https://openalex.org/W636616287","https://openalex.org/W2543679522","https://openalex.org/W2151990703"],"abstract_inverted_index":null,"counts_by_year":[{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}