{"id":"https://openalex.org/W1481684649","doi":"https://doi.org/10.1007/978-3-540-72395-0_74","title":"KPCA Plus FDA for Fault Detection","display_name":"KPCA Plus FDA for Fault Detection","publication_year":2007,"publication_date":"2007-07-16","ids":{"openalex":"https://openalex.org/W1481684649","doi":"https://doi.org/10.1007/978-3-540-72395-0_74","mag":"1481684649"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-540-72395-0_74","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-540-72395-0_74","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003604982","display_name":"Peiling Cui","orcid":"https://orcid.org/0000-0002-6666-4999"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Peiling Cui","raw_affiliation_strings":["School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics & Astronautics, Beijing 100083, China","School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics & Astronautics, Beijing 100083, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058230907","display_name":"Jiancheng Fang","orcid":"https://orcid.org/0000-0001-7453-0387"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiancheng Fang","raw_affiliation_strings":["School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics & Astronautics, Beijing 100083, China","School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics & Astronautics, Beijing 100083, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Instrumentation Science & Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5003604982"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.12296984,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"597","last_page":"606"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9778000116348267,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.975600004196167,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/kernel-principal-component-analysis","display_name":"Kernel principal component analysis","score":0.848845362663269},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.7552267909049988},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7463407516479492},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.7183146476745605},{"id":"https://openalex.org/keywords/linear-discriminant-analysis","display_name":"Linear discriminant analysis","score":0.7122179269790649},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6523666381835938},{"id":"https://openalex.org/keywords/kernel-fisher-discriminant-analysis","display_name":"Kernel Fisher discriminant analysis","score":0.6167140007019043},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5919404625892639},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5520336627960205},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.47778138518333435},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.44705620408058167},{"id":"https://openalex.org/keywords/kernel-method","display_name":"Kernel method","score":0.2205391228199005},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.14459165930747986},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11798810958862305}],"concepts":[{"id":"https://openalex.org/C182335926","wikidata":"https://www.wikidata.org/wiki/Q17093020","display_name":"Kernel principal component analysis","level":4,"score":0.848845362663269},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7552267909049988},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7463407516479492},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.7183146476745605},{"id":"https://openalex.org/C69738355","wikidata":"https://www.wikidata.org/wiki/Q1228929","display_name":"Linear discriminant analysis","level":2,"score":0.7122179269790649},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6523666381835938},{"id":"https://openalex.org/C181367576","wikidata":"https://www.wikidata.org/wiki/Q6394184","display_name":"Kernel Fisher discriminant analysis","level":4,"score":0.6167140007019043},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5919404625892639},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5520336627960205},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.47778138518333435},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.44705620408058167},{"id":"https://openalex.org/C122280245","wikidata":"https://www.wikidata.org/wiki/Q620622","display_name":"Kernel method","level":3,"score":0.2205391228199005},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.14459165930747986},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11798810958862305},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C31510193","wikidata":"https://www.wikidata.org/wiki/Q1192553","display_name":"Facial recognition system","level":3,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-540-72395-0_74","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-540-72395-0_74","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.699999988079071,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1770825568","https://openalex.org/W1969158915","https://openalex.org/W1973076992","https://openalex.org/W1981276685","https://openalex.org/W1993426294","https://openalex.org/W1994505190","https://openalex.org/W1995235836","https://openalex.org/W1999935041","https://openalex.org/W2011372029","https://openalex.org/W2018752455","https://openalex.org/W2026282013","https://openalex.org/W2057283314","https://openalex.org/W2068193536","https://openalex.org/W2068561554","https://openalex.org/W2070383283","https://openalex.org/W2073178151","https://openalex.org/W2088032561","https://openalex.org/W2107146446","https://openalex.org/W2110948693","https://openalex.org/W2119400998","https://openalex.org/W2122538988","https://openalex.org/W2140095548","https://openalex.org/W2166042538","https://openalex.org/W2492794003","https://openalex.org/W4231106771","https://openalex.org/W4244488411","https://openalex.org/W4249625715"],"related_works":["https://openalex.org/W2141981133","https://openalex.org/W2386228546","https://openalex.org/W2086055175","https://openalex.org/W2052589448","https://openalex.org/W2379488555","https://openalex.org/W2753886092","https://openalex.org/W2765337000","https://openalex.org/W2365801610","https://openalex.org/W2388048830","https://openalex.org/W2152632846"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}