{"id":"https://openalex.org/W2171876582","doi":"https://doi.org/10.1007/978-3-540-30205-6_79","title":"A New Logic Transformation Method for Both Low Power and High Testability","display_name":"A New Logic Transformation Method for Both Low Power and High Testability","publication_year":2004,"publication_date":"2004-01-01","ids":{"openalex":"https://openalex.org/W2171876582","doi":"https://doi.org/10.1007/978-3-540-30205-6_79","mag":"2171876582"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-540-30205-6_79","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-540-30205-6_79","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043417988","display_name":"Yunsik Son","orcid":"https://orcid.org/0000-0002-2580-4393"},"institutions":[{"id":"https://openalex.org/I4210111753","display_name":"Korea Innotech (South Korea)","ror":"https://ror.org/01j9g7106","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210111753"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Y. S. Son","raw_affiliation_strings":["Waytotec, Inc, 170-8, Pan Gyo Dong, Bun Dang Gu, Sung Nam Si, Gyung Gi Do, South Korea, 463-410"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Waytotec, Inc, 170-8, Pan Gyo Dong, Bun Dang Gu, Sung Nam Si, Gyung Gi Do, South Korea, 463-410","institution_ids":["https://openalex.org/I4210111753"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085694381","display_name":"Jong Whoa Na","orcid":null},"institutions":[{"id":"https://openalex.org/I177023625","display_name":"Hansei University","ror":"https://ror.org/01bxsr356","country_code":"KR","type":"education","lineage":["https://openalex.org/I177023625"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"J. W. Na","raw_affiliation_strings":["Computer Engineering Dept, Hansei University, 604-5 Dang Jung Dong Kun Po Si, Gyung Gi Do, South Korea, 435-742"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Dept, Hansei University, 604-5 Dang Jung Dong Kun Po Si, Gyung Gi Do, South Korea, 435-742","institution_ids":["https://openalex.org/I177023625"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"770","last_page":"779"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8676170110702515},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7322394847869873},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6786519289016724},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6193318963050842},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5332574248313904},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5136075019836426},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.5069983005523682},{"id":"https://openalex.org/keywords/logic-optimization","display_name":"Logic optimization","score":0.48142191767692566},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.4479047954082489},{"id":"https://openalex.org/keywords/logic-synthesis","display_name":"Logic synthesis","score":0.3549410104751587},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35460180044174194},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34961169958114624},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3346463441848755},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2946149706840515},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12614399194717407}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8676170110702515},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7322394847869873},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6786519289016724},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6193318963050842},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5332574248313904},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5136075019836426},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.5069983005523682},{"id":"https://openalex.org/C28449271","wikidata":"https://www.wikidata.org/wiki/Q6667469","display_name":"Logic optimization","level":4,"score":0.48142191767692566},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.4479047954082489},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.3549410104751587},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35460180044174194},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34961169958114624},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3346463441848755},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2946149706840515},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12614399194717407},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-540-30205-6_79","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-540-30205-6_79","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8799999952316284,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W260727648","https://openalex.org/W1515082873","https://openalex.org/W1539883310","https://openalex.org/W2052639770","https://openalex.org/W2057339729","https://openalex.org/W2107594749","https://openalex.org/W2114470660","https://openalex.org/W2116305334","https://openalex.org/W2121258817","https://openalex.org/W2130022711","https://openalex.org/W2148596540","https://openalex.org/W2156368823","https://openalex.org/W2157986239","https://openalex.org/W2162256736","https://openalex.org/W2169837676","https://openalex.org/W4250655965"],"related_works":["https://openalex.org/W2168652618","https://openalex.org/W1939541994","https://openalex.org/W2127247647","https://openalex.org/W818963952","https://openalex.org/W2499931839","https://openalex.org/W2110968362","https://openalex.org/W4390345338","https://openalex.org/W4238178324","https://openalex.org/W2166402441","https://openalex.org/W2169337913"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}