{"id":"https://openalex.org/W2888454228","doi":"https://doi.org/10.1007/978-3-319-99707-0_58","title":"A Fundamental Study on the Effect of Visual Guidance to Inspectors Using Visual Indicator on Defect Detection in Visual Inspection Utilizing Peripheral Vision","display_name":"A Fundamental Study on the Effect of Visual Guidance to Inspectors Using Visual Indicator on Defect Detection in Visual Inspection Utilizing Peripheral Vision","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2888454228","doi":"https://doi.org/10.1007/978-3-319-99707-0_58","mag":"2888454228"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-99707-0_58","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-99707-0_58","pdf_url":null,"source":{"id":"https://openalex.org/S4210185096","display_name":"IFIP advances in information and communication technology","issn_l":"1868-422X","issn":["1868-422X","1868-4238"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://inria.hal.science/hal-02177880","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104046237","display_name":"Ryosuke Nakajima","orcid":null},"institutions":[{"id":"https://openalex.org/I6030618","display_name":"Seikei University","ror":"https://ror.org/03ptaj492","country_code":"JP","type":"education","lineage":["https://openalex.org/I6030618"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Ryosuke Nakajima","raw_affiliation_strings":["Seikei University, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Seikei University, Tokyo, Japan","institution_ids":["https://openalex.org/I6030618"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007539854","display_name":"Kosuke Fujie","orcid":null},"institutions":[{"id":"https://openalex.org/I131231118","display_name":"Aoyama Gakuin University","ror":"https://ror.org/002rw7y37","country_code":"JP","type":"education","lineage":["https://openalex.org/I131231118"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kosuke Fujie","raw_affiliation_strings":["Aoyama Gakuin University, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Aoyama Gakuin University, Kanagawa, Japan","institution_ids":["https://openalex.org/I131231118"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048897839","display_name":"Takuya HIDA","orcid":"https://orcid.org/0000-0002-9333-5082"},"institutions":[{"id":"https://openalex.org/I131231118","display_name":"Aoyama Gakuin University","ror":"https://ror.org/002rw7y37","country_code":"JP","type":"education","lineage":["https://openalex.org/I131231118"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuya Hida","raw_affiliation_strings":["Aoyama Gakuin University, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Aoyama Gakuin University, Kanagawa, Japan","institution_ids":["https://openalex.org/I131231118"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022786070","display_name":"Toshiyuki Matsumoto","orcid":"https://orcid.org/0000-0001-7726-0829"},"institutions":[{"id":"https://openalex.org/I131231118","display_name":"Aoyama Gakuin University","ror":"https://ror.org/002rw7y37","country_code":"JP","type":"education","lineage":["https://openalex.org/I131231118"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki Matsumoto","raw_affiliation_strings":["Aoyama Gakuin University, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Aoyama Gakuin University, Kanagawa, Japan","institution_ids":["https://openalex.org/I131231118"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5104046237"],"corresponding_institution_ids":["https://openalex.org/I6030618"],"apc_list":null,"apc_paid":null,"fwci":0.5657,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68322063,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"465","last_page":"472"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9796000123023987,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.8711402416229248},{"id":"https://openalex.org/keywords/peripheral-vision","display_name":"Peripheral vision","score":0.6772758364677429},{"id":"https://openalex.org/keywords/contrast","display_name":"Contrast (vision)","score":0.6213158965110779},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6168999671936035},{"id":"https://openalex.org/keywords/visual-disturbance","display_name":"Visual Disturbance","score":0.60329270362854},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5726943016052246},{"id":"https://openalex.org/keywords/luminance","display_name":"Luminance","score":0.5392407774925232},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4782642126083374},{"id":"https://openalex.org/keywords/visual-perception","display_name":"Visual perception","score":0.4480460584163666},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4229484498500824},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33675265312194824},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.186870276927948},{"id":"https://openalex.org/keywords/perception","display_name":"Perception","score":0.16174983978271484},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.11968600749969482}],"concepts":[{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.8711402416229248},{"id":"https://openalex.org/C185761835","wikidata":"https://www.wikidata.org/wiki/Q1431287","display_name":"Peripheral vision","level":2,"score":0.6772758364677429},{"id":"https://openalex.org/C2776502983","wikidata":"https://www.wikidata.org/wiki/Q690182","display_name":"Contrast (vision)","level":2,"score":0.6213158965110779},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6168999671936035},{"id":"https://openalex.org/C2910762390","wikidata":"https://www.wikidata.org/wiki/Q767669","display_name":"Visual Disturbance","level":2,"score":0.60329270362854},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5726943016052246},{"id":"https://openalex.org/C73313986","wikidata":"https://www.wikidata.org/wiki/Q355386","display_name":"Luminance","level":2,"score":0.5392407774925232},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4782642126083374},{"id":"https://openalex.org/C178253425","wikidata":"https://www.wikidata.org/wiki/Q162668","display_name":"Visual perception","level":3,"score":0.4480460584163666},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4229484498500824},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33675265312194824},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.186870276927948},{"id":"https://openalex.org/C26760741","wikidata":"https://www.wikidata.org/wiki/Q160402","display_name":"Perception","level":2,"score":0.16174983978271484},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.11968600749969482},{"id":"https://openalex.org/C141071460","wikidata":"https://www.wikidata.org/wiki/Q40821","display_name":"Surgery","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-319-99707-0_58","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-99707-0_58","pdf_url":null,"source":{"id":"https://openalex.org/S4210185096","display_name":"IFIP advances in information and communication technology","issn_l":"1868-422X","issn":["1868-422X","1868-4238"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},{"id":"pmh:oai:HAL:hal-02177880v1","is_oa":true,"landing_page_url":"https://inria.hal.science/hal-02177880","pdf_url":null,"source":{"id":"https://openalex.org/S4406922276","display_name":"INRIA a CCSD electronic archive server","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IFIP International Conference on Advances in Production Management Systems (APMS), Aug 2018, Seoul, South Korea. pp.465-472, ⟨10.1007/978-3-319-99707-0_58⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-02177880v1","is_oa":true,"landing_page_url":"https://inria.hal.science/hal-02177880","pdf_url":null,"source":{"id":"https://openalex.org/S4406922276","display_name":"INRIA a CCSD electronic archive server","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IFIP International Conference on Advances in Production Management Systems (APMS), Aug 2018, Seoul, South Korea. pp.465-472, ⟨10.1007/978-3-319-99707-0_58⟩","raw_type":"Conference papers"},"sustainable_development_goals":[{"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1018330790","https://openalex.org/W1531674329","https://openalex.org/W1999688897","https://openalex.org/W2067628563","https://openalex.org/W2079478440","https://openalex.org/W2339223515","https://openalex.org/W2527245241"],"related_works":["https://openalex.org/W1990245967","https://openalex.org/W2054177013","https://openalex.org/W4383506493","https://openalex.org/W1994772959","https://openalex.org/W2427340667","https://openalex.org/W2136398500","https://openalex.org/W2322090229","https://openalex.org/W2888454228","https://openalex.org/W3202539826","https://openalex.org/W2027983523"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}