{"id":"https://openalex.org/W2606325319","doi":"https://doi.org/10.1007/978-3-319-66266-4_2","title":"Rare Event Simulation for Dynamic Fault Trees","display_name":"Rare Event Simulation for Dynamic Fault Trees","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2606325319","doi":"https://doi.org/10.1007/978-3-319-66266-4_2","mag":"2606325319"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-66266-4_2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-66266-4_2","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.utwente.nl/en/publications/2f6c9cf1-4203-459a-b8d3-49469372b77d","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007430287","display_name":"Enno Ruijters","orcid":"https://orcid.org/0000-0002-5855-5282"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Enno Ruijters","raw_affiliation_strings":["Formal Methods and Tools, University of Twente, Enschede, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Formal Methods and Tools, University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018068523","display_name":"Dani\u00ebl Reijsbergen","orcid":"https://orcid.org/0000-0001-6975-9275"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Dani\u00ebl Reijsbergen","raw_affiliation_strings":["Laboratory for Foundations of Computer Science, University of Edinburgh, Edinburgh, Scotland"],"affiliations":[{"raw_affiliation_string":"Laboratory for Foundations of Computer Science, University of Edinburgh, Edinburgh, Scotland","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085616535","display_name":"Pieter-Tjerk de Boer","orcid":"https://orcid.org/0000-0002-0818-5295"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Pieter-Tjerk de Boer","raw_affiliation_strings":["Design and Analysis of Communication Systems, University of Twente, Enschede, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Design and Analysis of Communication Systems, University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053065289","display_name":"Mari\u00eblle Stoelinga","orcid":"https://orcid.org/0000-0001-6793-8165"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mari\u00eblle Stoelinga","raw_affiliation_strings":["Formal Methods and Tools, University of Twente, Enschede, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Formal Methods and Tools, University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5007430287"],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":7.995,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.97554158,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"20","last_page":"35"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11720","display_name":"Probability and Risk Models","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7779313325881958},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.723649263381958},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.7111228108406067},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6858941912651062},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5939725041389465},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5622584223747253},{"id":"https://openalex.org/keywords/parameterized-complexity","display_name":"Parameterized complexity","score":0.5541752576828003},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.46166661381721497},{"id":"https://openalex.org/keywords/rare-events","display_name":"Rare events","score":0.44991374015808105},{"id":"https://openalex.org/keywords/discrete-event-simulation","display_name":"Discrete event simulation","score":0.4498733580112457},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.438503623008728},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.41477686166763306},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3397024869918823},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.23826465010643005},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15220826864242554},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1467950940132141},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0775361955165863}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7779313325881958},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.723649263381958},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.7111228108406067},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6858941912651062},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5939725041389465},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5622584223747253},{"id":"https://openalex.org/C165464430","wikidata":"https://www.wikidata.org/wiki/Q1570441","display_name":"Parameterized complexity","level":2,"score":0.5541752576828003},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.46166661381721497},{"id":"https://openalex.org/C2777317252","wikidata":"https://www.wikidata.org/wiki/Q18393516","display_name":"Rare events","level":2,"score":0.44991374015808105},{"id":"https://openalex.org/C147203929","wikidata":"https://www.wikidata.org/wiki/Q574814","display_name":"Discrete event simulation","level":2,"score":0.4498733580112457},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.438503623008728},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.41477686166763306},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3397024869918823},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.23826465010643005},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15220826864242554},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1467950940132141},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0775361955165863},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1007/978-3-319-66266-4_2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-66266-4_2","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"pmh:oai:ris.utwente.nl:openaire/2f6c9cf1-4203-459a-b8d3-49469372b77d","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/2f6c9cf1-4203-459a-b8d3-49469372b77d","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ruijters, E J J, Reijsbergen, D P, de Boer, P-T & Stoelinga, M I A 2017, Rare Event Simulation for Dynamic Fault Trees. in S Tonetta, E Schoitsch & F Bitsch (eds), Computer Safety, Reliability, and Security : 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings. Lecture Notes in Computer Science, vol. 10488, Springer, pp. 20-35, International Conference on Computer Safety, Reliability, and Security, Trento, Italy, 12/09/17. https://doi.org/10.1007/978-3-319-66266-4_2","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:ris.utwente.nl:publications/7ad58f43-59f7-469d-b14d-7aa22116ef0e","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:ut:oai:ris.utwente.nl:publications/2f6c9cf1-4203-459a-b8d3-49469372b77d","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/rare-event-simulation-for-dynamic-fault-trees(2f6c9cf1-4203-459a-b8d3-49469372b77d).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Computer Safety, Reliability, and Security: 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings, 20 - 35","raw_type":"info:eu-repo/semantics/conferencepaper"}],"best_oa_location":{"id":"pmh:oai:ris.utwente.nl:openaire/2f6c9cf1-4203-459a-b8d3-49469372b77d","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/2f6c9cf1-4203-459a-b8d3-49469372b77d","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ruijters, E J J, Reijsbergen, D P, de Boer, P-T & Stoelinga, M I A 2017, Rare Event Simulation for Dynamic Fault Trees. in S Tonetta, E Schoitsch & F Bitsch (eds), Computer Safety, Reliability, and Security : 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings. Lecture Notes in Computer Science, vol. 10488, Springer, pp. 20-35, International Conference on Computer Safety, Reliability, and Security, Trento, Italy, 12/09/17. https://doi.org/10.1007/978-3-319-66266-4_2","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.46000000834465027,"display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G3640064926","display_name":null,"funder_award_id":"EP/P016456/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W81877109","https://openalex.org/W186920959","https://openalex.org/W1543835543","https://openalex.org/W1549434585","https://openalex.org/W2100047952","https://openalex.org/W2110411539","https://openalex.org/W2111540344","https://openalex.org/W2118479715","https://openalex.org/W2121337044","https://openalex.org/W2123956547","https://openalex.org/W2137477336","https://openalex.org/W2140198391","https://openalex.org/W2162253848","https://openalex.org/W2164863330","https://openalex.org/W2166255034","https://openalex.org/W2205592786","https://openalex.org/W2224779672","https://openalex.org/W2234313581","https://openalex.org/W2259883075","https://openalex.org/W2492911276","https://openalex.org/W2810491896","https://openalex.org/W2962786268","https://openalex.org/W4235897658"],"related_works":["https://openalex.org/W2169628522","https://openalex.org/W4252527915","https://openalex.org/W2409287660","https://openalex.org/W2233357156","https://openalex.org/W1976489385","https://openalex.org/W4256317220","https://openalex.org/W1506225852","https://openalex.org/W2141414364","https://openalex.org/W2376514150","https://openalex.org/W2583115580"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-03-16T09:10:04.655348","created_date":"2025-10-10T00:00:00"}