{"id":"https://openalex.org/W2621380264","doi":"https://doi.org/10.1007/978-3-319-55071-8_4","title":"Low Dose-Rate, High Total Dose Set-Up for Rad-Hard CMOS I/O Circuits Testing","display_name":"Low Dose-Rate, High Total Dose Set-Up for Rad-Hard CMOS I/O Circuits Testing","publication_year":2017,"publication_date":"2017-06-03","ids":{"openalex":"https://openalex.org/W2621380264","doi":"https://doi.org/10.1007/978-3-319-55071-8_4","mag":"2621380264"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-55071-8_4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-55071-8_4","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072470570","display_name":"C. Nick Pace","orcid":"https://orcid.org/0000-0002-9998-7129"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Calogero Pace","raw_affiliation_strings":["DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081657857","display_name":"Letizia Fragomeni","orcid":"https://orcid.org/0000-0001-5980-2428"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Letizia Fragomeni","raw_affiliation_strings":["DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017065925","display_name":"Aldo Parlato","orcid":"https://orcid.org/0000-0001-6959-5186"},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Aldo Parlato","raw_affiliation_strings":["DEIM-Universit\u00e0 di Palermo, Viale delle Scienze Ed.9, 90128, Palermo, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DEIM-Universit\u00e0 di Palermo, Viale delle Scienze Ed.9, 90128, Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056889445","display_name":"Andrea Solano","orcid":"https://orcid.org/0000-0001-5282-8676"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Solano","raw_affiliation_strings":["DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017146977","display_name":"N Marchese","orcid":"https://orcid.org/0000-0001-9030-7281"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Nicol\u00f2 Marchese","raw_affiliation_strings":["DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057061459","display_name":"Daniela Fiore","orcid":"https://orcid.org/0000-0002-0111-2034"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Daniela Fiore","raw_affiliation_strings":["DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIMES-Universit\u00e0 della Calabria, Via P. Bucci 42C, 87036, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5072470570"],"corresponding_institution_ids":["https://openalex.org/I45204951"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10732349,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"27","last_page":"33"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7172457575798035},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6080945730209351},{"id":"https://openalex.org/keywords/dose-rate","display_name":"Dose rate","score":0.4636251926422119},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4367421567440033},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4263976216316223},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33320188522338867},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2554740607738495},{"id":"https://openalex.org/keywords/medical-physics","display_name":"Medical physics","score":0.17383167147636414},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15171825885772705},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15084874629974365}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7172457575798035},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6080945730209351},{"id":"https://openalex.org/C3017588741","wikidata":"https://www.wikidata.org/wiki/Q3042357","display_name":"Dose rate","level":2,"score":0.4636251926422119},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4367421567440033},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4263976216316223},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33320188522338867},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2554740607738495},{"id":"https://openalex.org/C19527891","wikidata":"https://www.wikidata.org/wiki/Q1120908","display_name":"Medical physics","level":1,"score":0.17383167147636414},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15171825885772705},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15084874629974365},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-55071-8_4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-55071-8_4","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1967734072","https://openalex.org/W2059214545","https://openalex.org/W2067067335","https://openalex.org/W2093434399","https://openalex.org/W2097309673","https://openalex.org/W2101111387","https://openalex.org/W2131271035","https://openalex.org/W2134457592","https://openalex.org/W2148071019","https://openalex.org/W2159774720","https://openalex.org/W2524330828","https://openalex.org/W4298033106"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2089791793","https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2109445684","https://openalex.org/W4241196849"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}