{"id":"https://openalex.org/W2621367241","doi":"https://doi.org/10.1007/978-3-319-55071-8_19","title":"Performance Evaluation of Non Volatile Memories with a Low Cost and Portable Automatic Test Equipment","display_name":"Performance Evaluation of Non Volatile Memories with a Low Cost and Portable Automatic Test Equipment","publication_year":2017,"publication_date":"2017-06-03","ids":{"openalex":"https://openalex.org/W2621367241","doi":"https://doi.org/10.1007/978-3-319-55071-8_19","mag":"2621367241"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-55071-8_19","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-55071-8_19","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012225051","display_name":"Gineuve Alieri","orcid":null},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Gineuve Alieri","raw_affiliation_strings":["DEIM, University of Palermo, Viale delle Scienze Bulding 9, 90128, Palermo, Italy"],"affiliations":[{"raw_affiliation_string":"DEIM, University of Palermo, Viale delle Scienze Bulding 9, 90128, Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011270825","display_name":"Giuseppe Costantino Giaconia","orcid":"https://orcid.org/0000-0003-2457-0772"},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Costantino Giaconia","raw_affiliation_strings":["DEIM, University of Palermo, Viale delle Scienze Bulding 9, 90128, Palermo, Italy"],"affiliations":[{"raw_affiliation_string":"DEIM, University of Palermo, Viale delle Scienze Bulding 9, 90128, Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090964053","display_name":"Leonardo Mistretta","orcid":null},"institutions":[{"id":"https://openalex.org/I900890020","display_name":"University of Palermo","ror":"https://ror.org/044k9ta02","country_code":"IT","type":"education","lineage":["https://openalex.org/I900890020"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Leonardo Mistretta","raw_affiliation_strings":["DEIM, University of Palermo, Viale delle Scienze Bulding 9, 90128, Palermo, Italy"],"affiliations":[{"raw_affiliation_string":"DEIM, University of Palermo, Viale delle Scienze Bulding 9, 90128, Palermo, Italy","institution_ids":["https://openalex.org/I900890020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004258520","display_name":"Francesco La Rosa","orcid":"https://orcid.org/0000-0002-9224-4664"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Francesco La Rosa","raw_affiliation_strings":["MDG Group R&D, STMicroelectronics, Rousset, France"],"affiliations":[{"raw_affiliation_string":"MDG Group R&D, STMicroelectronics, Rousset, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018452179","display_name":"A. Angelo Cimino","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Angelo Cimino","raw_affiliation_strings":["MDG Group R&D, STMicroelectronics, Palermo, Italy"],"affiliations":[{"raw_affiliation_string":"MDG Group R&D, STMicroelectronics, Palermo, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5012225051"],"corresponding_institution_ids":["https://openalex.org/I900890020"],"apc_list":null,"apc_paid":null,"fwci":0.5299,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58955224,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"147","last_page":"152"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.6780725717544556},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6710298657417297},{"id":"https://openalex.org/keywords/stm32","display_name":"STM32","score":0.6709814667701721},{"id":"https://openalex.org/keywords/usb","display_name":"USB","score":0.6229383945465088},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.6224927306175232},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.6004448533058167},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5209382772445679},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.5146113634109497},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.5122203230857849},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4603199362754822},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4126071333885193},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3178071975708008},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.28590458631515503},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.21932020783424377},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.16056734323501587},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.12368765473365784}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.6780725717544556},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6710298657417297},{"id":"https://openalex.org/C2779096738","wikidata":"https://www.wikidata.org/wiki/Q7394773","display_name":"STM32","level":3,"score":0.6709814667701721},{"id":"https://openalex.org/C507366226","wikidata":"https://www.wikidata.org/wiki/Q42378","display_name":"USB","level":3,"score":0.6229383945465088},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.6224927306175232},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.6004448533058167},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5209382772445679},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.5146113634109497},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.5122203230857849},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4603199362754822},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4126071333885193},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3178071975708008},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.28590458631515503},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.21932020783424377},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.16056734323501587},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.12368765473365784},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-319-55071-8_19","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-55071-8_19","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},{"id":"pmh:oai:iris.unipa.it:10447/425945","is_oa":false,"landing_page_url":"http://hdl.handle.net/10447/425945","pdf_url":null,"source":{"id":"https://openalex.org/S4306401065","display_name":"Nova Science Publishers (Nova Science Publishers, Inc.)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/bookPart"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1577371739","https://openalex.org/W2061180973","https://openalex.org/W2099714761","https://openalex.org/W2109389616"],"related_works":["https://openalex.org/W2360288732","https://openalex.org/W2379137242","https://openalex.org/W2356700903","https://openalex.org/W2758694247","https://openalex.org/W2356928735","https://openalex.org/W4321442002","https://openalex.org/W2351720760","https://openalex.org/W2367975889","https://openalex.org/W2029042945","https://openalex.org/W2965916271"],"abstract_inverted_index":null,"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2017-06-09T00:00:00"}