{"id":"https://openalex.org/W2563313308","doi":"https://doi.org/10.1007/978-3-319-47913-2_16","title":"A Novel Instrumentation for an Advanced High Temperature Reverse Bias (HTRB) Testing on Power Transistors","display_name":"A Novel Instrumentation for an Advanced High Temperature Reverse Bias (HTRB) Testing on Power Transistors","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2563313308","doi":"https://doi.org/10.1007/978-3-319-47913-2_16","mag":"2563313308"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-47913-2_16","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-47913-2_16","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072470570","display_name":"C. Nick Pace","orcid":"https://orcid.org/0000-0002-9998-7129"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Calogero Pace","raw_affiliation_strings":["Department of Computer Science, Electronics, Modeling and Systems (DIMES), University of Calabria (UNICAL), Via P. Bucci 42 C, 87036, Rende (CS), Italy"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Electronics, Modeling and Systems (DIMES), University of Calabria (UNICAL), Via P. Bucci 42 C, 87036, Rende (CS), Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078097347","display_name":"Jorge Hern\u00e1ndez-Ambato","orcid":"https://orcid.org/0000-0002-1841-2789"},"institutions":[{"id":"https://openalex.org/I4210137344","display_name":"Escuela Superior Polit\u00e9cnica del Chimborazo","ror":"https://ror.org/02zyw2q61","country_code":"EC","type":"education","lineage":["https://openalex.org/I4210137344"]},{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["EC","IT"],"is_corresponding":false,"raw_author_name":"Jorge Hernandez Ambato","raw_affiliation_strings":["Department of Computer Science, Electronics, Modeling and Systems (DIMES), University of Calabria (UNICAL), Via P. Bucci 42 C, 87036, Rende (CS), Italy","Escuela Superior Polit\u00e9cnica de Chimborazo, Riobamba, Brasil"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Electronics, Modeling and Systems (DIMES), University of Calabria (UNICAL), Via P. Bucci 42 C, 87036, Rende (CS), Italy","institution_ids":["https://openalex.org/I45204951"]},{"raw_affiliation_string":"Escuela Superior Polit\u00e9cnica de Chimborazo, Riobamba, Brasil","institution_ids":["https://openalex.org/I4210137344"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084652654","display_name":"C. Giordano","orcid":null},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]},{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Carlo Giordano","raw_affiliation_strings":["Advanced Research Center on Electronic Systems, University of Bologna, Viale Risorgimento 1, Bologna, Italy","Department of Computer Science, Electronics, Modeling and Systems (DIMES), University of Calabria (UNICAL), Via P. Bucci 42 C, 87036, Rende (CS), Italy"],"affiliations":[{"raw_affiliation_string":"Advanced Research Center on Electronic Systems, University of Bologna, Viale Risorgimento 1, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"Department of Computer Science, Electronics, Modeling and Systems (DIMES), University of Calabria (UNICAL), Via P. Bucci 42 C, 87036, Rende (CS), Italy","institution_ids":["https://openalex.org/I45204951"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5072470570"],"corresponding_institution_ids":["https://openalex.org/I45204951"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.01831798,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"133","last_page":"142"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.7223459482192993},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6598738431930542},{"id":"https://openalex.org/keywords/thermal-runaway","display_name":"Thermal runaway","score":0.5875188112258911},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.578669548034668},{"id":"https://openalex.org/keywords/reverse-bias","display_name":"Reverse bias","score":0.4637186527252197},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45985016226768494},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4498273432254791},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44377580285072327},{"id":"https://openalex.org/keywords/safe-operating-area","display_name":"Safe operating area","score":0.4339090883731842},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43069562315940857},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.4301663041114807},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4000004529953003},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39446747303009033},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3090102970600128},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13649189472198486},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1007021963596344}],"concepts":[{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.7223459482192993},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6598738431930542},{"id":"https://openalex.org/C72688512","wikidata":"https://www.wikidata.org/wiki/Q908282","display_name":"Thermal runaway","level":4,"score":0.5875188112258911},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.578669548034668},{"id":"https://openalex.org/C2987974824","wikidata":"https://www.wikidata.org/wiki/Q176300","display_name":"Reverse bias","level":3,"score":0.4637186527252197},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45985016226768494},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4498273432254791},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44377580285072327},{"id":"https://openalex.org/C186339688","wikidata":"https://www.wikidata.org/wiki/Q233523","display_name":"Safe operating area","level":4,"score":0.4339090883731842},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43069562315940857},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.4301663041114807},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4000004529953003},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39446747303009033},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3090102970600128},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13649189472198486},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1007021963596344},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-47913-2_16","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-47913-2_16","pdf_url":null,"source":{"id":"https://openalex.org/S4210179954","display_name":"Lecture notes in electrical engineering","issn_l":"1876-1100","issn":["1876-1100","1876-1119"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Electrical Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W626773769","https://openalex.org/W1641947315","https://openalex.org/W1945381821","https://openalex.org/W2019925718","https://openalex.org/W2021457919","https://openalex.org/W2055234555","https://openalex.org/W2058436119","https://openalex.org/W2110438510","https://openalex.org/W2117712212","https://openalex.org/W2334828552"],"related_works":["https://openalex.org/W2520303923","https://openalex.org/W2072488564","https://openalex.org/W4376606754","https://openalex.org/W2100569039","https://openalex.org/W2079977659","https://openalex.org/W2021717040","https://openalex.org/W197968678","https://openalex.org/W1561862401","https://openalex.org/W1581464067","https://openalex.org/W2169452139"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}