{"id":"https://openalex.org/W2543418449","doi":"https://doi.org/10.1007/978-3-319-47274-4_12","title":"Quality Assessment of 3D Prints Based on Feature Similarity Metrics","display_name":"Quality Assessment of 3D Prints Based on Feature Similarity Metrics","publication_year":2016,"publication_date":"2016-10-27","ids":{"openalex":"https://openalex.org/W2543418449","doi":"https://doi.org/10.1007/978-3-319-47274-4_12","mag":"2543418449"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-47274-4_12","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-47274-4_12","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075075434","display_name":"Krzysztof Okarma","orcid":"https://orcid.org/0000-0002-6721-3241"},"institutions":[{"id":"https://openalex.org/I155313962","display_name":"West Pomeranian University of Technology in Szczecin","ror":"https://ror.org/0596m7f19","country_code":"PL","type":"education","lineage":["https://openalex.org/I155313962"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Krzysztof Okarma","raw_affiliation_strings":["Faculty of Electrical Engineering, Department of Signal Processing and Multimedia Engineering, West Pomeranian University of Technology, Szczecin, 26. Kwietnia 10, 71-126, Szczecin, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Department of Signal Processing and Multimedia Engineering, West Pomeranian University of Technology, Szczecin, 26. Kwietnia 10, 71-126, Szczecin, Poland","institution_ids":["https://openalex.org/I155313962"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006059367","display_name":"Jaros\u0142aw Fastowicz","orcid":"https://orcid.org/0000-0002-3315-1281"},"institutions":[{"id":"https://openalex.org/I155313962","display_name":"West Pomeranian University of Technology in Szczecin","ror":"https://ror.org/0596m7f19","country_code":"PL","type":"education","lineage":["https://openalex.org/I155313962"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jaros\u0142aw Fastowicz","raw_affiliation_strings":["Faculty of Electrical Engineering, Department of Signal Processing and Multimedia Engineering, West Pomeranian University of Technology, Szczecin, 26. Kwietnia 10, 71-126, Szczecin, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Department of Signal Processing and Multimedia Engineering, West Pomeranian University of Technology, Szczecin, 26. Kwietnia 10, 71-126, Szczecin, Poland","institution_ids":["https://openalex.org/I155313962"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6607,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.93509848,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"104","last_page":"111"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7187459468841553},{"id":"https://openalex.org/keywords/grayscale","display_name":"Grayscale","score":0.7152721285820007},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6755397319793701},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.6499859690666199},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.6350617408752441},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6120373010635376},{"id":"https://openalex.org/keywords/quality-assessment","display_name":"Quality assessment","score":0.5360726714134216},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4599520266056061},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.43386411666870117},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.433102011680603},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4317294955253601},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3553520441055298},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.33530837297439575},{"id":"https://openalex.org/keywords/evaluation-methods","display_name":"Evaluation methods","score":0.2750747799873352},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14439940452575684},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11753642559051514},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.09473350644111633}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7187459468841553},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.7152721285820007},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6755397319793701},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.6499859690666199},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.6350617408752441},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6120373010635376},{"id":"https://openalex.org/C3020001037","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assessment","level":3,"score":0.5360726714134216},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4599520266056061},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.43386411666870117},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.433102011680603},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4317294955253601},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3553520441055298},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33530837297439575},{"id":"https://openalex.org/C3018395757","wikidata":"https://www.wikidata.org/wiki/Q1379672","display_name":"Evaluation methods","level":2,"score":0.2750747799873352},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14439940452575684},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11753642559051514},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.09473350644111633},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-47274-4_12","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-47274-4_12","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1522949081","https://openalex.org/W2040732657","https://openalex.org/W2063680016","https://openalex.org/W2067921844","https://openalex.org/W2083795040","https://openalex.org/W2106136696","https://openalex.org/W2114603952","https://openalex.org/W2133665775","https://openalex.org/W2141983208","https://openalex.org/W2150490197","https://openalex.org/W2159269332","https://openalex.org/W2202611433","https://openalex.org/W2626610348"],"related_works":["https://openalex.org/W115686965","https://openalex.org/W2768918307","https://openalex.org/W2327130486","https://openalex.org/W2466958844","https://openalex.org/W2804751933","https://openalex.org/W2245293081","https://openalex.org/W1973829424","https://openalex.org/W3209787365","https://openalex.org/W1963681152","https://openalex.org/W4287019296"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":10}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}