{"id":"https://openalex.org/W2295181316","doi":"https://doi.org/10.1007/978-3-319-27926-8_18","title":"SoC-Based Pattern Recognition Systems for Non Destructive Testing","display_name":"SoC-Based Pattern Recognition Systems for Non Destructive Testing","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2295181316","doi":"https://doi.org/10.1007/978-3-319-27926-8_18","mag":"2295181316"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-27926-8_18","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-27926-8_18","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056574221","display_name":"O. Schiaratura","orcid":null},"institutions":[{"id":"https://openalex.org/I2800759272","display_name":"Center for Advanced Studies Research and Development in Sardinia","ror":"https://ror.org/03jdxdk20","country_code":"IT","type":"facility","lineage":["https://openalex.org/I2800759272"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Omar Schiaratura","raw_affiliation_strings":["CRS4 S.c.a.r.l., Pula, Italy"],"affiliations":[{"raw_affiliation_string":"CRS4 S.c.a.r.l., Pula, Italy","institution_ids":["https://openalex.org/I2800759272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033149818","display_name":"Pietro Ansaloni","orcid":null},"institutions":[{"id":"https://openalex.org/I4210116474","display_name":"Center for Micro-BioRobotics","ror":"https://ror.org/02nbgxg43","country_code":"IT","type":"facility","lineage":["https://openalex.org/I30771326","https://openalex.org/I4210116474"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Pietro Ansaloni","raw_affiliation_strings":["Bioretics S.r.l., Pula, Italy"],"affiliations":[{"raw_affiliation_string":"Bioretics S.r.l., Pula, Italy","institution_ids":["https://openalex.org/I4210116474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015829107","display_name":"Giovanni Lughi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210116474","display_name":"Center for Micro-BioRobotics","ror":"https://ror.org/02nbgxg43","country_code":"IT","type":"facility","lineage":["https://openalex.org/I30771326","https://openalex.org/I4210116474"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giovanni Lughi","raw_affiliation_strings":["Bioretics S.r.l., Pula, Italy"],"affiliations":[{"raw_affiliation_string":"Bioretics S.r.l., Pula, Italy","institution_ids":["https://openalex.org/I4210116474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112053804","display_name":"Mattia Neri","orcid":null},"institutions":[{"id":"https://openalex.org/I4210116474","display_name":"Center for Micro-BioRobotics","ror":"https://ror.org/02nbgxg43","country_code":"IT","type":"facility","lineage":["https://openalex.org/I30771326","https://openalex.org/I4210116474"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mattia Neri","raw_affiliation_strings":["Bioretics S.r.l., Pula, Italy"],"affiliations":[{"raw_affiliation_string":"Bioretics S.r.l., Pula, Italy","institution_ids":["https://openalex.org/I4210116474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026506233","display_name":"Matteo Roffilli","orcid":"https://orcid.org/0000-0002-7554-4470"},"institutions":[{"id":"https://openalex.org/I4210116474","display_name":"Center for Micro-BioRobotics","ror":"https://ror.org/02nbgxg43","country_code":"IT","type":"facility","lineage":["https://openalex.org/I30771326","https://openalex.org/I4210116474"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Roffilli","raw_affiliation_strings":["Bioretics S.r.l., Pula, Italy"],"affiliations":[{"raw_affiliation_string":"Bioretics S.r.l., Pula, Italy","institution_ids":["https://openalex.org/I4210116474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045060212","display_name":"Fabrizio Serpi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210116474","display_name":"Center for Micro-BioRobotics","ror":"https://ror.org/02nbgxg43","country_code":"IT","type":"facility","lineage":["https://openalex.org/I30771326","https://openalex.org/I4210116474"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Fabrizio Serpi","raw_affiliation_strings":["Bioretics S.r.l., Pula, Italy"],"affiliations":[{"raw_affiliation_string":"Bioretics S.r.l., Pula, Italy","institution_ids":["https://openalex.org/I4210116474"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019172720","display_name":"Andrea Simonetto","orcid":"https://orcid.org/0000-0003-2923-3361"},"institutions":[{"id":"https://openalex.org/I4210116474","display_name":"Center for Micro-BioRobotics","ror":"https://ror.org/02nbgxg43","country_code":"IT","type":"facility","lineage":["https://openalex.org/I30771326","https://openalex.org/I4210116474"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Simonetto","raw_affiliation_strings":["Bioretics S.r.l., Pula, Italy"],"affiliations":[{"raw_affiliation_string":"Bioretics S.r.l., Pula, Italy","institution_ids":["https://openalex.org/I4210116474"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5056574221"],"corresponding_institution_ids":["https://openalex.org/I2800759272"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.033,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.76887232,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"209","last_page":"221"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7958338856697083},{"id":"https://openalex.org/keywords/workstation","display_name":"Workstation","score":0.6991783976554871},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6850709319114685},{"id":"https://openalex.org/keywords/factory","display_name":"Factory (object-oriented programming)","score":0.6404715776443481},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6071653366088867},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5919646620750427},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5182071328163147},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4929313659667969},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.4468275308609009},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3654480576515198},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.16304638981819153},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1388712227344513},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10634180903434753}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7958338856697083},{"id":"https://openalex.org/C67953723","wikidata":"https://www.wikidata.org/wiki/Q192525","display_name":"Workstation","level":2,"score":0.6991783976554871},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6850709319114685},{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.6404715776443481},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6071653366088867},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5919646620750427},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5182071328163147},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4929313659667969},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.4468275308609009},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3654480576515198},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.16304638981819153},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1388712227344513},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10634180903434753},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-27926-8_18","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-27926-8_18","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.44999998807907104}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1482603307","https://openalex.org/W1484341170","https://openalex.org/W1487718662","https://openalex.org/W1695629801","https://openalex.org/W1986624837","https://openalex.org/W1993164261","https://openalex.org/W1994906459","https://openalex.org/W2022188538","https://openalex.org/W2072072671","https://openalex.org/W2156909104","https://openalex.org/W2157202423","https://openalex.org/W2187098286","https://openalex.org/W2399715892","https://openalex.org/W2988817687"],"related_works":["https://openalex.org/W1967186235","https://openalex.org/W2045348955","https://openalex.org/W2352028719","https://openalex.org/W2584886384","https://openalex.org/W2378667902","https://openalex.org/W2791088446","https://openalex.org/W2125564439","https://openalex.org/W2052769075","https://openalex.org/W4206808270","https://openalex.org/W2134078163"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-01-15T23:16:33.117629","created_date":"2025-10-10T00:00:00"}