{"id":"https://openalex.org/W2266217550","doi":"https://doi.org/10.1007/978-3-319-25945-1_6","title":"Automated Test Design for Boundaries of Product Line Variants","display_name":"Automated Test Design for Boundaries of Product Line Variants","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2266217550","doi":"https://doi.org/10.1007/978-3-319-25945-1_6","mag":"2266217550"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-25945-1_6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-25945-1_6","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://inria.hal.science/hal-01470159","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000890834","display_name":"Stephan Wei\u00dfleder","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123028","display_name":"Thales (Germany)","ror":"https://ror.org/031xjr712","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210123028","https://openalex.org/I4210140930"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stephan Wei\u00dfleder","raw_affiliation_strings":["Thales Transportation Systems, Sch\u00fctzenstra\u00dfe 25, 10117, Berlin, Germany"],"affiliations":[{"raw_affiliation_string":"Thales Transportation Systems, Sch\u00fctzenstra\u00dfe 25, 10117, Berlin, Germany","institution_ids":["https://openalex.org/I4210123028"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018683329","display_name":"Florian Wartenberg","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123028","display_name":"Thales (Germany)","ror":"https://ror.org/031xjr712","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210123028","https://openalex.org/I4210140930"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Wartenberg","raw_affiliation_strings":["Thales Transportation Systems, Sch\u00fctzenstra\u00dfe 25, 10117, Berlin, Germany"],"affiliations":[{"raw_affiliation_string":"Thales Transportation Systems, Sch\u00fctzenstra\u00dfe 25, 10117, Berlin, Germany","institution_ids":["https://openalex.org/I4210123028"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051555801","display_name":"Hartmut Lackner","orcid":null},"institutions":[{"id":"https://openalex.org/I39343248","display_name":"Humboldt-Universit\u00e4t zu Berlin","ror":"https://ror.org/01hcx6992","country_code":"DE","type":"education","lineage":["https://openalex.org/I39343248"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Hartmut Lackner","raw_affiliation_strings":["Humboldt-Universit\u00e4t zu Berlin, Rudower Chaussee 25, 12489, Berlin, Germany"],"affiliations":[{"raw_affiliation_string":"Humboldt-Universit\u00e4t zu Berlin, Rudower Chaussee 25, 12489, Berlin, Germany","institution_ids":["https://openalex.org/I39343248"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5051555801"],"corresponding_institution_ids":["https://openalex.org/I39343248"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.6828,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.69580236,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"86","last_page":"101"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11450","display_name":"Model-Driven Software Engineering Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7683333158493042},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.7435045838356018},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.617481529712677},{"id":"https://openalex.org/keywords/product-line","display_name":"Product line","score":0.582248866558075},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.540807843208313},{"id":"https://openalex.org/keywords/model-based-testing","display_name":"Model-based testing","score":0.490582138299942},{"id":"https://openalex.org/keywords/behavioral-modeling","display_name":"Behavioral modeling","score":0.4501299262046814},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.42905110120773315},{"id":"https://openalex.org/keywords/system-under-test","display_name":"System under test","score":0.42459186911582947},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32305049896240234},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.3165580630302429},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2163701355457306},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1618419587612152},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.15429982542991638},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11489573121070862},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.0934893786907196},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08241605758666992},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07099151611328125}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7683333158493042},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.7435045838356018},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.617481529712677},{"id":"https://openalex.org/C2988046880","wikidata":"https://www.wikidata.org/wiki/Q3084961","display_name":"Product line","level":2,"score":0.582248866558075},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.540807843208313},{"id":"https://openalex.org/C165825675","wikidata":"https://www.wikidata.org/wiki/Q1399743","display_name":"Model-based testing","level":4,"score":0.490582138299942},{"id":"https://openalex.org/C78639753","wikidata":"https://www.wikidata.org/wiki/Q3318160","display_name":"Behavioral modeling","level":2,"score":0.4501299262046814},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.42905110120773315},{"id":"https://openalex.org/C108913964","wikidata":"https://www.wikidata.org/wiki/Q2376856","display_name":"System under test","level":4,"score":0.42459186911582947},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32305049896240234},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.3165580630302429},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2163701355457306},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1618419587612152},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.15429982542991638},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11489573121070862},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.0934893786907196},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08241605758666992},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07099151611328125},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-319-25945-1_6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-25945-1_6","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"pmh:oai:HAL:hal-01470159v1","is_oa":true,"landing_page_url":"https://inria.hal.science/hal-01470159","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"27th IFIP International Conference on Testing Software and Systems (ICTSS), Nov 2015, Sharjah and Dubai, United Arab Emirates. pp.86-101, ⟨10.1007/978-3-319-25945-1_6⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-01470159v1","is_oa":true,"landing_page_url":"https://inria.hal.science/hal-01470159","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"27th IFIP International Conference on Testing Software and Systems (ICTSS), Nov 2015, Sharjah and Dubai, United Arab Emirates. pp.86-101, ⟨10.1007/978-3-319-25945-1_6⟩","raw_type":"Conference papers"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W83267564","https://openalex.org/W899947898","https://openalex.org/W1036551939","https://openalex.org/W1494019345","https://openalex.org/W1501076421","https://openalex.org/W1509343160","https://openalex.org/W1552824673","https://openalex.org/W1596127723","https://openalex.org/W1608087281","https://openalex.org/W1983721551","https://openalex.org/W1987278052","https://openalex.org/W2013711971","https://openalex.org/W2040458854","https://openalex.org/W2074724494","https://openalex.org/W2089973785","https://openalex.org/W2094810043","https://openalex.org/W2095974519","https://openalex.org/W2099213660","https://openalex.org/W2102742419","https://openalex.org/W2116885233","https://openalex.org/W2125727889","https://openalex.org/W2127248783","https://openalex.org/W2143251912","https://openalex.org/W2160325552","https://openalex.org/W2167672803","https://openalex.org/W2320062858","https://openalex.org/W2477378326","https://openalex.org/W2478938965","https://openalex.org/W2493467830","https://openalex.org/W4251824004","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2083501371","https://openalex.org/W2952740084","https://openalex.org/W12495686","https://openalex.org/W632606703","https://openalex.org/W1974635583","https://openalex.org/W2767512594","https://openalex.org/W2114897686","https://openalex.org/W2931644080","https://openalex.org/W2098804367","https://openalex.org/W1884742918"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}