{"id":"https://openalex.org/W2195963248","doi":"https://doi.org/10.1007/978-3-319-24255-2_22","title":"Modeling the Impact of Testing on Diverse Programs","display_name":"Modeling the Impact of Testing on Diverse Programs","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2195963248","doi":"https://doi.org/10.1007/978-3-319-24255-2_22","mag":"2195963248"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-24255-2_22","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-24255-2_22","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033320921","display_name":"Peter Bishop","orcid":"https://orcid.org/0000-0003-3307-5159"},"institutions":[{"id":"https://openalex.org/I4210163610","display_name":"Adelard","ror":"https://ror.org/05nns5525","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210163610"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Peter Bishop","raw_affiliation_strings":["City University and Adelard LLP, London, UK"],"affiliations":[{"raw_affiliation_string":"City University and Adelard LLP, London, UK","institution_ids":["https://openalex.org/I4210163610"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5033320921"],"corresponding_institution_ids":["https://openalex.org/I4210163610"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09915357,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"297","last_page":"309"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7726606726646423},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5739895105361938},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5419346690177917},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.49421194195747375},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46496158838272095},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.4515674114227295},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.44406935572624207},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.431851863861084},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.42356908321380615},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.40480223298072815},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.34374672174453735},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.3240469694137573},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1736222207546234},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.16736534237861633},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07663434743881226}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7726606726646423},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5739895105361938},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5419346690177917},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49421194195747375},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46496158838272095},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.4515674114227295},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.44406935572624207},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.431851863861084},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.42356908321380615},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.40480223298072815},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.34374672174453735},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.3240469694137573},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1736222207546234},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.16736534237861633},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07663434743881226},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-24255-2_22","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-24255-2_22","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1506118764","https://openalex.org/W1753527524","https://openalex.org/W1987631459","https://openalex.org/W1999823724","https://openalex.org/W2045700800","https://openalex.org/W2091732396","https://openalex.org/W2109930173","https://openalex.org/W2111453601","https://openalex.org/W2126870663","https://openalex.org/W2129262519","https://openalex.org/W2141154822","https://openalex.org/W2146715037"],"related_works":["https://openalex.org/W1521772560","https://openalex.org/W2152262712","https://openalex.org/W3167506726","https://openalex.org/W2381119662","https://openalex.org/W2376559135","https://openalex.org/W1968089739","https://openalex.org/W2068586906","https://openalex.org/W2358049071","https://openalex.org/W2356714989","https://openalex.org/W2132062426"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}