{"id":"https://openalex.org/W2402539620","doi":"https://doi.org/10.1007/978-3-319-22756-6_60","title":"A Study on the Effect of Dirt on an Inspection Surface on Defect Detection in Visual Inspection Utilizing Peripheral Vision","display_name":"A Study on the Effect of Dirt on an Inspection Surface on Defect Detection in Visual Inspection Utilizing Peripheral Vision","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2402539620","doi":"https://doi.org/10.1007/978-3-319-22756-6_60","mag":"2402539620"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-22756-6_60","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-22756-6_60","pdf_url":null,"source":{"id":"https://openalex.org/S4210185096","display_name":"IFIP advances in information and communication technology","issn_l":"1868-422X","issn":["1868-422X","1868-4238"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-01417598","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104046237","display_name":"Ryosuke Nakajima","orcid":null},"institutions":[{"id":"https://openalex.org/I131231118","display_name":"Aoyama Gakuin University","ror":"https://ror.org/002rw7y37","country_code":"JP","type":"education","lineage":["https://openalex.org/I131231118"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Ryosuke Nakajima","raw_affiliation_strings":["Aoyama Gakuin University, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Aoyama Gakuin University, Kanagawa, Japan","institution_ids":["https://openalex.org/I131231118"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008807046","display_name":"Yuta Asano","orcid":"https://orcid.org/0000-0002-0898-7802"},"institutions":[{"id":"https://openalex.org/I131231118","display_name":"Aoyama Gakuin University","ror":"https://ror.org/002rw7y37","country_code":"JP","type":"education","lineage":["https://openalex.org/I131231118"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuta Asano","raw_affiliation_strings":["Aoyama Gakuin University, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Aoyama Gakuin University, Kanagawa, Japan","institution_ids":["https://openalex.org/I131231118"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048897839","display_name":"Takuya HIDA","orcid":"https://orcid.org/0000-0002-9333-5082"},"institutions":[{"id":"https://openalex.org/I131231118","display_name":"Aoyama Gakuin University","ror":"https://ror.org/002rw7y37","country_code":"JP","type":"education","lineage":["https://openalex.org/I131231118"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuya Hida","raw_affiliation_strings":["Aoyama Gakuin University, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Aoyama Gakuin University, Kanagawa, Japan","institution_ids":["https://openalex.org/I131231118"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022786070","display_name":"Toshiyuki Matsumoto","orcid":"https://orcid.org/0000-0001-7726-0829"},"institutions":[{"id":"https://openalex.org/I131231118","display_name":"Aoyama Gakuin University","ror":"https://ror.org/002rw7y37","country_code":"JP","type":"education","lineage":["https://openalex.org/I131231118"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki Matsumoto","raw_affiliation_strings":["Aoyama Gakuin University, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Aoyama Gakuin University, Kanagawa, Japan","institution_ids":["https://openalex.org/I131231118"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5104046237"],"corresponding_institution_ids":["https://openalex.org/I131231118"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1971393,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"492","last_page":"499"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dirt","display_name":"Dirt","score":0.9249159693717957},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.7506632804870605},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6141449809074402},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5855094790458679},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.49954915046691895},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4473362863063812},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4388331174850464},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30627351999282837},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2718670666217804},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.23127833008766174},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17163559794425964},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.14480268955230713},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.10208714008331299}],"concepts":[{"id":"https://openalex.org/C2778582501","wikidata":"https://www.wikidata.org/wiki/Q555882","display_name":"Dirt","level":2,"score":0.9249159693717957},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.7506632804870605},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6141449809074402},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5855094790458679},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.49954915046691895},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4473362863063812},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4388331174850464},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30627351999282837},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2718670666217804},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.23127833008766174},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17163559794425964},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.14480268955230713},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.10208714008331299}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-319-22756-6_60","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-22756-6_60","pdf_url":null,"source":{"id":"https://openalex.org/S4210185096","display_name":"IFIP advances in information and communication technology","issn_l":"1868-422X","issn":["1868-422X","1868-4238"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},{"id":"pmh:oai:HAL:hal-01417598v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01417598","pdf_url":null,"source":{"id":"https://openalex.org/S4406922276","display_name":"INRIA a CCSD electronic archive server","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IFIP International Conference on Advances in Production Management Systems (APMS), Sep 2015, Tokyo, Japan. pp.492-499, ⟨10.1007/978-3-319-22756-6_60⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-01417598v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01417598","pdf_url":null,"source":{"id":"https://openalex.org/S4406922276","display_name":"INRIA a CCSD electronic archive server","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IFIP International Conference on Advances in Production Management Systems (APMS), Sep 2015, Tokyo, Japan. pp.492-499, ⟨10.1007/978-3-319-22756-6_60⟩","raw_type":"Conference papers"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W1999688897"],"related_works":["https://openalex.org/W2493185854","https://openalex.org/W849857824","https://openalex.org/W2090582288","https://openalex.org/W617381866","https://openalex.org/W2339456629","https://openalex.org/W1986703546","https://openalex.org/W3150775531","https://openalex.org/W1965696824","https://openalex.org/W2795879497","https://openalex.org/W2002822631"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}