{"id":"https://openalex.org/W614759211","doi":"https://doi.org/10.1007/978-3-319-13963-0_33","title":"The Application of Independent Component Analysis Method on the Mura Defect Inspection of LCD Process","display_name":"The Application of Independent Component Analysis Method on the Mura Defect Inspection of LCD Process","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W614759211","doi":"https://doi.org/10.1007/978-3-319-13963-0_33","mag":"614759211"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-13963-0_33","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-13963-0_33","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017388383","display_name":"Xin Bi","orcid":"https://orcid.org/0000-0002-2645-1112"},"institutions":[{"id":"https://openalex.org/I148128674","display_name":"University of Shanghai for Science and Technology","ror":"https://ror.org/00ay9v204","country_code":"CN","type":"education","lineage":["https://openalex.org/I148128674"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Bi","raw_affiliation_strings":["College of Shanghai Medical Instrumentation, University of Shanghai for Science and Technology, Shanghai, China","University of Shanghai for Science and Technology)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Shanghai Medical Instrumentation, University of Shanghai for Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I148128674"]},{"raw_affiliation_string":"University of Shanghai for Science and Technology)","institution_ids":["https://openalex.org/I148128674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101840143","display_name":"Xiaoping Xu","orcid":"https://orcid.org/0000-0001-9656-6233"},"institutions":[{"id":"https://openalex.org/I148128674","display_name":"University of Shanghai for Science and Technology","ror":"https://ror.org/00ay9v204","country_code":"CN","type":"education","lineage":["https://openalex.org/I148128674"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoping Xu","raw_affiliation_strings":["College of Shanghai Medical Instrumentation, University of Shanghai for Science and Technology, Shanghai, China","University of Shanghai for Science and Technology)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Shanghai Medical Instrumentation, University of Shanghai for Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I148128674"]},{"raw_affiliation_string":"University of Shanghai for Science and Technology)","institution_ids":["https://openalex.org/I148128674"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009534267","display_name":"Jinhua Shen","orcid":"https://orcid.org/0000-0003-4439-4972"},"institutions":[{"id":"https://openalex.org/I4210162588","display_name":"Shanghai Micro Electronics Equipment (China)","ror":"https://ror.org/056eew379","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210162588"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhua Shen","raw_affiliation_strings":["Shanghai Micro Electronics Equipment Co.,LTD., Shanghai, China","Shanghai Micro Electronics Equipment Co.,LTD"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Micro Electronics Equipment Co.,LTD., Shanghai, China","institution_ids":[]},{"raw_affiliation_string":"Shanghai Micro Electronics Equipment Co.,LTD","institution_ids":["https://openalex.org/I4210162588"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"321","last_page":"330"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mura","display_name":"Mura","score":0.8407787084579468},{"id":"https://openalex.org/keywords/homomorphic-filtering","display_name":"Homomorphic filtering","score":0.8329552412033081},{"id":"https://openalex.org/keywords/brightness","display_name":"Brightness","score":0.8065224885940552},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6234836578369141},{"id":"https://openalex.org/keywords/moir\u00e9-pattern","display_name":"Moir\u00e9 pattern","score":0.6178857684135437},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6066192984580994},{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.5856872200965881},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5332351326942444},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5188432931900024},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.48142334818840027},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4448254704475403},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.43584245443344116},{"id":"https://openalex.org/keywords/image-enhancement","display_name":"Image enhancement","score":0.19373467564582825},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.15842896699905396},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06382700800895691}],"concepts":[{"id":"https://openalex.org/C2776147852","wikidata":"https://www.wikidata.org/wiki/Q6937160","display_name":"Mura","level":3,"score":0.8407787084579468},{"id":"https://openalex.org/C56683213","wikidata":"https://www.wikidata.org/wiki/Q4143008","display_name":"Homomorphic filtering","level":4,"score":0.8329552412033081},{"id":"https://openalex.org/C125245961","wikidata":"https://www.wikidata.org/wiki/Q221656","display_name":"Brightness","level":2,"score":0.8065224885940552},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6234836578369141},{"id":"https://openalex.org/C70000540","wikidata":"https://www.wikidata.org/wiki/Q26468","display_name":"Moir\u00e9 pattern","level":2,"score":0.6178857684135437},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6066192984580994},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.5856872200965881},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5332351326942444},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5188432931900024},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.48142334818840027},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4448254704475403},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.43584245443344116},{"id":"https://openalex.org/C3017601658","wikidata":"https://www.wikidata.org/wiki/Q545981","display_name":"Image enhancement","level":3,"score":0.19373467564582825},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15842896699905396},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06382700800895691},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-13963-0_33","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-13963-0_33","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1493914388","https://openalex.org/W1506808117","https://openalex.org/W1967347776","https://openalex.org/W1981041935","https://openalex.org/W2019502123","https://openalex.org/W2043376388","https://openalex.org/W2068509546","https://openalex.org/W2088871026","https://openalex.org/W2100974241","https://openalex.org/W2355730501","https://openalex.org/W2380480323","https://openalex.org/W2900551493","https://openalex.org/W7038528597"],"related_works":["https://openalex.org/W4300472483","https://openalex.org/W2883564816","https://openalex.org/W1979381067","https://openalex.org/W2947890201","https://openalex.org/W2384941964","https://openalex.org/W2210286149","https://openalex.org/W2142955084","https://openalex.org/W2333947975","https://openalex.org/W614759211","https://openalex.org/W2376253973"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}