{"id":"https://openalex.org/W208206822","doi":"https://doi.org/10.1007/978-3-319-07773-4_54","title":"Research on the System Reliability Modeling Based on Markov Process and Reliability Block Diagram","display_name":"Research on the System Reliability Modeling Based on Markov Process and Reliability Block Diagram","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W208206822","doi":"https://doi.org/10.1007/978-3-319-07773-4_54","mag":"208206822"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-07773-4_54","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-07773-4_54","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082015307","display_name":"Guochang Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I194716290","display_name":"China Academy of Space Technology","ror":"https://ror.org/025397a59","country_code":"CN","type":"government","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guochang Zhou","raw_affiliation_strings":["China Academy of Space Technology(Xi\u2019an), Xi\u2019an, China","China Academy of Space Technology (Xi'an)"],"affiliations":[{"raw_affiliation_string":"China Academy of Space Technology(Xi\u2019an), Xi\u2019an, China","institution_ids":["https://openalex.org/I194716290"]},{"raw_affiliation_string":"China Academy of Space Technology (Xi'an)","institution_ids":["https://openalex.org/I194716290"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103144961","display_name":"Baolong Guo","orcid":"https://orcid.org/0000-0001-9531-4632"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baolong Guo","raw_affiliation_strings":["School of Aerospace Science and Technology, Xidian University, Xi\u2019an, China","Xidian Univ"],"affiliations":[{"raw_affiliation_string":"School of Aerospace Science and Technology, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Xidian Univ","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074363493","display_name":"Xiang Gao","orcid":"https://orcid.org/0000-0003-1200-276X"},"institutions":[{"id":"https://openalex.org/I194716290","display_name":"China Academy of Space Technology","ror":"https://ror.org/025397a59","country_code":"CN","type":"government","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiang Gao","raw_affiliation_strings":["China Academy of Space Technology(Xi\u2019an), Xi\u2019an, China","China Academy of Space Technology (Xi'an)"],"affiliations":[{"raw_affiliation_string":"China Academy of Space Technology(Xi\u2019an), Xi\u2019an, China","institution_ids":["https://openalex.org/I194716290"]},{"raw_affiliation_string":"China Academy of Space Technology (Xi'an)","institution_ids":["https://openalex.org/I194716290"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067578751","display_name":"Dan Zhao","orcid":"https://orcid.org/0000-0003-0195-6031"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dan Zhao","raw_affiliation_strings":["School of Aerospace Science and Technology, Xidian University, Xi\u2019an, China","Xidian Univ"],"affiliations":[{"raw_affiliation_string":"School of Aerospace Science and Technology, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Xidian Univ","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100634103","display_name":"Yunyi Yan","orcid":"https://orcid.org/0000-0001-8669-8451"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunyi Yan","raw_affiliation_strings":["School of Aerospace Science and Technology, Xidian University, Xi\u2019an, China","Xidian Univ"],"affiliations":[{"raw_affiliation_string":"School of Aerospace Science and Technology, Xidian University, Xi\u2019an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Xidian Univ","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5082015307"],"corresponding_institution_ids":["https://openalex.org/I194716290"],"apc_list":null,"apc_paid":null,"fwci":1.1759,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76256684,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"545","last_page":"553"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9760000109672546,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9760000109672546,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-block-diagram","display_name":"Reliability block diagram","score":0.9696066379547119},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7902677059173584},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7654628753662109},{"id":"https://openalex.org/keywords/block-diagram","display_name":"Block diagram","score":0.642810046672821},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6336627006530762},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.5893350839614868},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.5655527710914612},{"id":"https://openalex.org/keywords/markov-model","display_name":"Markov model","score":0.5531896948814392},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4826648533344269},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.273725688457489},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15639963746070862},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11352312564849854},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.09473049640655518},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09192869067192078},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.0637185275554657}],"concepts":[{"id":"https://openalex.org/C18074226","wikidata":"https://www.wikidata.org/wiki/Q7310986","display_name":"Reliability block diagram","level":3,"score":0.9696066379547119},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7902677059173584},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7654628753662109},{"id":"https://openalex.org/C149227320","wikidata":"https://www.wikidata.org/wiki/Q884718","display_name":"Block diagram","level":2,"score":0.642810046672821},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6336627006530762},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.5893350839614868},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5655527710914612},{"id":"https://openalex.org/C163836022","wikidata":"https://www.wikidata.org/wiki/Q6771326","display_name":"Markov model","level":3,"score":0.5531896948814392},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4826648533344269},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.273725688457489},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15639963746070862},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11352312564849854},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.09473049640655518},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09192869067192078},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0637185275554657},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-07773-4_54","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-07773-4_54","pdf_url":null,"source":{"id":"https://openalex.org/S2764905038","display_name":"Advances in intelligent systems and computing","issn_l":"2194-5357","issn":["2194-5357","2194-5365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Intelligent Systems and Computing","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W289052539","https://openalex.org/W304999917","https://openalex.org/W792423925","https://openalex.org/W1988778215","https://openalex.org/W2006733177","https://openalex.org/W2055996661","https://openalex.org/W2100313702","https://openalex.org/W2154859700","https://openalex.org/W2155113732","https://openalex.org/W2496512073","https://openalex.org/W2626617782"],"related_works":["https://openalex.org/W2061728408","https://openalex.org/W2055996661","https://openalex.org/W1539694279","https://openalex.org/W2372005449","https://openalex.org/W4317465184","https://openalex.org/W208206822","https://openalex.org/W2085079545","https://openalex.org/W2522372915","https://openalex.org/W2350431126","https://openalex.org/W3189051998"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}