{"id":"https://openalex.org/W4404125070","doi":"https://doi.org/10.1007/978-3-031-73223-2_7","title":"Nickel and\u00a0Diming Your GAN: A Dual-Method Approach to\u00a0Enhancing GAN Efficiency via\u00a0Knowledge Distillation","display_name":"Nickel and\u00a0Diming Your GAN: A Dual-Method Approach to\u00a0Enhancing GAN Efficiency via\u00a0Knowledge Distillation","publication_year":2024,"publication_date":"2024-11-07","ids":{"openalex":"https://openalex.org/W4404125070","doi":"https://doi.org/10.1007/978-3-031-73223-2_7"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-031-73223-2_7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-031-73223-2_7","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104310148","display_name":"Sangyeop Yeo","orcid":"https://orcid.org/0000-0002-5305-3443"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sangyeop Yeo","raw_affiliation_strings":["Laboratory of Advanced Imaging Technology (LAIT) Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-5305-3443","affiliations":[{"raw_affiliation_string":"Laboratory of Advanced Imaging Technology (LAIT) Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086998377","display_name":"Yoojin Jang","orcid":"https://orcid.org/0000-0001-8150-3715"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yoojin Jang","raw_affiliation_strings":["Laboratory of Advanced Imaging Technology (LAIT) Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-8150-3715","affiliations":[{"raw_affiliation_string":"Laboratory of Advanced Imaging Technology (LAIT) Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089933293","display_name":"Jaejun Yoo","orcid":"https://orcid.org/0000-0001-5252-9668"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaejun Yoo","raw_affiliation_strings":["Laboratory of Advanced Imaging Technology (LAIT) Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5252-9668","affiliations":[{"raw_affiliation_string":"Laboratory of Advanced Imaging Technology (LAIT) Ulsan National Institute of Science and Technology (UNIST), Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5104310148"],"corresponding_institution_ids":["https://openalex.org/I48566637"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.8199,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.82356125,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"104","last_page":"121"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10775","display_name":"Generative Adversarial Networks and Image Synthesis","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10775","display_name":"Generative Adversarial Networks and Image Synthesis","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14319","display_name":"Currency Recognition and Detection","score":0.9406999945640564,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","score":0.9401000142097473,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7160210609436035},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.6927012801170349},{"id":"https://openalex.org/keywords/distillation","display_name":"Distillation","score":0.6328959465026855},{"id":"https://openalex.org/keywords/gallium-nitride","display_name":"Gallium nitride","score":0.48033419251441956},{"id":"https://openalex.org/keywords/nickel","display_name":"Nickel","score":0.4566885232925415},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4350753128528595},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35700997710227966},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35482466220855713},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.18937578797340393},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.12677481770515442},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.08861550688743591},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.08740034699440002},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07440444827079773}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7160210609436035},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.6927012801170349},{"id":"https://openalex.org/C204030448","wikidata":"https://www.wikidata.org/wiki/Q101017","display_name":"Distillation","level":2,"score":0.6328959465026855},{"id":"https://openalex.org/C2778871202","wikidata":"https://www.wikidata.org/wiki/Q411713","display_name":"Gallium nitride","level":3,"score":0.48033419251441956},{"id":"https://openalex.org/C504270822","wikidata":"https://www.wikidata.org/wiki/Q744","display_name":"Nickel","level":2,"score":0.4566885232925415},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4350753128528595},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35700997710227966},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35482466220855713},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.18937578797340393},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12677481770515442},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.08861550688743591},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.08740034699440002},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07440444827079773},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-031-73223-2_7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-031-73223-2_7","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1834627138","https://openalex.org/W2125865219","https://openalex.org/W2891158090","https://openalex.org/W2962770929","https://openalex.org/W2963140444","https://openalex.org/W2963470893","https://openalex.org/W2983484869","https://openalex.org/W2986891417","https://openalex.org/W2991256359","https://openalex.org/W3026885507","https://openalex.org/W3034600949","https://openalex.org/W3035204081","https://openalex.org/W3035574324","https://openalex.org/W3094786017","https://openalex.org/W3094954720","https://openalex.org/W3118608800","https://openalex.org/W3135367836","https://openalex.org/W3159481202","https://openalex.org/W3166541011","https://openalex.org/W3173855227","https://openalex.org/W3192333284","https://openalex.org/W4214926101","https://openalex.org/W4221167590","https://openalex.org/W4225526221","https://openalex.org/W4285981784","https://openalex.org/W4312933868","https://openalex.org/W4312988721","https://openalex.org/W4313008441","https://openalex.org/W4381785796","https://openalex.org/W4382240112","https://openalex.org/W4385976136","https://openalex.org/W4386071798","https://openalex.org/W4386075818","https://openalex.org/W4386075985","https://openalex.org/W4386076458","https://openalex.org/W4390872407","https://openalex.org/W4402754154","https://openalex.org/W6600018615","https://openalex.org/W6600223405","https://openalex.org/W6602254124","https://openalex.org/W6608513201"],"related_works":["https://openalex.org/W1996245093","https://openalex.org/W2084892924","https://openalex.org/W2068832895","https://openalex.org/W2122158692","https://openalex.org/W3138114114","https://openalex.org/W2050989731","https://openalex.org/W4244932605","https://openalex.org/W1998457510","https://openalex.org/W1985844811","https://openalex.org/W2314659633"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}