{"id":"https://openalex.org/W4312900343","doi":"https://doi.org/10.1007/978-3-031-21867-5_12","title":"On the Reliability of Real-Time Operating System on Embedded Soft Processor for Space Applications","display_name":"On the Reliability of Real-Time Operating System on Embedded Soft Processor for Space Applications","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4312900343","doi":"https://doi.org/10.1007/978-3-031-21867-5_12"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-031-21867-5_12","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-031-21867-5_12","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019244323","display_name":"Andrea Portaluri","orcid":"https://orcid.org/0000-0002-3597-1523"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Andrea Portaluri","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004083312","display_name":"Sarah Azimi","orcid":"https://orcid.org/0000-0002-9169-6140"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sarah Azimi","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018567565","display_name":"Corrado De Sio","orcid":"https://orcid.org/0000-0003-4212-3052"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Corrado De Sio","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014704226","display_name":"Daniele Rizzieri","orcid":"https://orcid.org/0000-0002-2976-101X"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Daniele Rizzieri","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":"https://orcid.org/0000-0002-3080-2560"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Sterpone","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5019244323"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":2.5718,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.91404715,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"181","last_page":"193"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microblaze","display_name":"MicroBlaze","score":0.8681578636169434},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7410228252410889},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.7066826820373535},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6830757856369019},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6456786394119263},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5890588164329529},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5822224617004395},{"id":"https://openalex.org/keywords/real-time-operating-system","display_name":"Real-time operating system","score":0.563214898109436},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5580280423164368},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.5420052409172058},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.5086079835891724},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3849952518939972},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.203994482755661},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1957249641418457},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1393042802810669}],"concepts":[{"id":"https://openalex.org/C2777575374","wikidata":"https://www.wikidata.org/wiki/Q1644704","display_name":"MicroBlaze","level":3,"score":0.8681578636169434},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7410228252410889},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7066826820373535},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6830757856369019},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6456786394119263},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5890588164329529},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5822224617004395},{"id":"https://openalex.org/C28472234","wikidata":"https://www.wikidata.org/wiki/Q213666","display_name":"Real-time operating system","level":2,"score":0.563214898109436},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5580280423164368},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.5420052409172058},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.5086079835891724},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3849952518939972},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.203994482755661},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1957249641418457},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1393042802810669},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-031-21867-5_12","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-031-21867-5_12","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1905244427","https://openalex.org/W2049041102","https://openalex.org/W2056300928","https://openalex.org/W2160342930","https://openalex.org/W2320141985","https://openalex.org/W2520921847","https://openalex.org/W2774641151","https://openalex.org/W2912412330","https://openalex.org/W2944028880","https://openalex.org/W3026432130","https://openalex.org/W3106556803","https://openalex.org/W3122141613","https://openalex.org/W3166559827","https://openalex.org/W3171483342","https://openalex.org/W3174835652","https://openalex.org/W3206577983","https://openalex.org/W3209703278","https://openalex.org/W3214843324","https://openalex.org/W4200137232","https://openalex.org/W4236277055"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2331588649","https://openalex.org/W2078707653","https://openalex.org/W1976069557","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2969553121","https://openalex.org/W2593605297","https://openalex.org/W2782341877"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}