{"id":"https://openalex.org/W4309491084","doi":"https://doi.org/10.1007/978-3-031-21065-5_12","title":"Enhanced RGB Image Processing Method for Automatic 2D and 3D Defect Inspection on Shiny Surfaces","display_name":"Enhanced RGB Image Processing Method for Automatic 2D and 3D Defect Inspection on Shiny Surfaces","publication_year":2022,"publication_date":"2022-11-18","ids":{"openalex":"https://openalex.org/W4309491084","doi":"https://doi.org/10.1007/978-3-031-21065-5_12"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-031-21065-5_12","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-031-21065-5_12","pdf_url":null,"source":{"id":"https://openalex.org/S4210169156","display_name":"Lecture notes in networks and systems","issn_l":"2367-3370","issn":["2367-3370","2367-3389"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319972","host_organization_name":"Springer International Publishing","host_organization_lineage":["https://openalex.org/P4310319972","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer International Publishing","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Networks and Systems","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084494955","display_name":"Luis Monz\u00f3n","orcid":"https://orcid.org/0000-0001-9128-3074"},"institutions":[{"id":"https://openalex.org/I4210150815","display_name":"Instituto Tecnol\u00f3gico de Arag\u00f3n","ror":"https://ror.org/05sep9w93","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210150815"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Luis Monz\u00f3n","raw_affiliation_strings":["Instituto Tecnol\u00f3gico de Arag\u00f3n, Mar\u00eda de Luna, 7-8, 50018, Zaragoza, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto Tecnol\u00f3gico de Arag\u00f3n, Mar\u00eda de Luna, 7-8, 50018, Zaragoza, Spain","institution_ids":["https://openalex.org/I4210150815"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064656216","display_name":"Daniel Cant\u00f3n","orcid":null},"institutions":[{"id":"https://openalex.org/I4210150815","display_name":"Instituto Tecnol\u00f3gico de Arag\u00f3n","ror":"https://ror.org/05sep9w93","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210150815"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Daniel Cant\u00f3n","raw_affiliation_strings":["Instituto Tecnol\u00f3gico de Arag\u00f3n, Mar\u00eda de Luna, 7-8, 50018, Zaragoza, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto Tecnol\u00f3gico de Arag\u00f3n, Mar\u00eda de Luna, 7-8, 50018, Zaragoza, Spain","institution_ids":["https://openalex.org/I4210150815"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072346343","display_name":"Fernando Sierra","orcid":"https://orcid.org/0000-0001-9849-6945"},"institutions":[{"id":"https://openalex.org/I4210150815","display_name":"Instituto Tecnol\u00f3gico de Arag\u00f3n","ror":"https://ror.org/05sep9w93","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210150815"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Fernando Sierra","raw_affiliation_strings":["Instituto Tecnol\u00f3gico de Arag\u00f3n, Mar\u00eda de Luna, 7-8, 50018, Zaragoza, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto Tecnol\u00f3gico de Arag\u00f3n, Mar\u00eda de Luna, 7-8, 50018, Zaragoza, Spain","institution_ids":["https://openalex.org/I4210150815"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086251993","display_name":"Mar\u00eda T. L\u00e1zaro","orcid":"https://orcid.org/0000-0002-7742-2442"},"institutions":[{"id":"https://openalex.org/I4210150815","display_name":"Instituto Tecnol\u00f3gico de Arag\u00f3n","ror":"https://ror.org/05sep9w93","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210150815"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Mar\u00eda Teresa L\u00e1zaro","raw_affiliation_strings":["Instituto Tecnol\u00f3gico de Arag\u00f3n, Mar\u00eda de Luna, 7-8, 50018, Zaragoza, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto Tecnol\u00f3gico de Arag\u00f3n, Mar\u00eda de Luna, 7-8, 50018, Zaragoza, Spain","institution_ids":["https://openalex.org/I4210150815"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5084494955"],"corresponding_institution_ids":["https://openalex.org/I4210150815"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39933811,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"139","last_page":"150"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.805842399597168},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7783560752868652},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6308897137641907},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.6134068369865417},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4989020824432373},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4233802556991577},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4210670292377472},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.41968604922294617},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.4016706347465515}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.805842399597168},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7783560752868652},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6308897137641907},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.6134068369865417},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4989020824432373},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4233802556991577},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4210670292377472},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.41968604922294617},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.4016706347465515}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-031-21065-5_12","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-031-21065-5_12","pdf_url":null,"source":{"id":"https://openalex.org/S4210169156","display_name":"Lecture notes in networks and systems","issn_l":"2367-3370","issn":["2367-3370","2367-3389"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319972","host_organization_name":"Springer International Publishing","host_organization_lineage":["https://openalex.org/P4310319972","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer International Publishing","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Networks and Systems","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W195785743","https://openalex.org/W2071207683","https://openalex.org/W2167667767","https://openalex.org/W2171735203","https://openalex.org/W2612454721","https://openalex.org/W2998291476","https://openalex.org/W3024889357","https://openalex.org/W4234124304"],"related_works":["https://openalex.org/W2283162247","https://openalex.org/W4212983513","https://openalex.org/W2524507886","https://openalex.org/W2314488738","https://openalex.org/W2394038673","https://openalex.org/W4295539746","https://openalex.org/W2115397382","https://openalex.org/W1985239973","https://openalex.org/W1998208097","https://openalex.org/W2283652788"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}