{"id":"https://openalex.org/W3207179252","doi":"https://doi.org/10.1007/978-3-030-89098-8_17","title":"Surface Crack Detection of Rubber Insulator Based on Machine Vision","display_name":"Surface Crack Detection of Rubber Insulator Based on Machine Vision","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3207179252","doi":"https://doi.org/10.1007/978-3-030-89098-8_17","mag":"3207179252"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-89098-8_17","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-89098-8_17","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100461874","display_name":"Jingwen Wang","orcid":"https://orcid.org/0000-0002-1405-4697"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"JingWen Wang","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369916","display_name":"Chen Li","orcid":"https://orcid.org/0000-0003-1545-8885"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Li","raw_affiliation_strings":["School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wu Han, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wu Han, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100437262","display_name":"Xu Zhang","orcid":"https://orcid.org/0000-0002-8098-8893"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Zhang","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101476540","display_name":"Yujie Jiang","orcid":"https://orcid.org/0000-0002-9320-2888"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"YuJie Jiang","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100461874"],"corresponding_institution_ids":["https://openalex.org/I113940042"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.2555,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.80123758,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"175","last_page":"185"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12923","display_name":"Digital Image Processing Techniques","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/natural-rubber","display_name":"Natural rubber","score":0.7115961313247681},{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.6518263816833496},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6055687665939331},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5007603168487549},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.45826297998428345},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4567822217941284},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.451689749956131},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.4275955855846405},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.42348992824554443},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.41286951303482056},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4049394130706787},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3431628942489624},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.31588536500930786},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.16599729657173157},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16487479209899902},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.10012272000312805},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07270458340644836}],"concepts":[{"id":"https://openalex.org/C176933379","wikidata":"https://www.wikidata.org/wiki/Q131877","display_name":"Natural rubber","level":2,"score":0.7115961313247681},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.6518263816833496},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6055687665939331},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5007603168487549},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.45826297998428345},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4567822217941284},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.451689749956131},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4275955855846405},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.42348992824554443},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.41286951303482056},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4049394130706787},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3431628942489624},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31588536500930786},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16599729657173157},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16487479209899902},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.10012272000312805},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07270458340644836},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-89098-8_17","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-89098-8_17","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2052393437","https://openalex.org/W2065533005","https://openalex.org/W2071355008","https://openalex.org/W2792524872","https://openalex.org/W3113332748"],"related_works":["https://openalex.org/W2109252598","https://openalex.org/W886882817","https://openalex.org/W1512878983","https://openalex.org/W2326594127","https://openalex.org/W4290989699","https://openalex.org/W4255766185","https://openalex.org/W1520120059","https://openalex.org/W2354793777","https://openalex.org/W1990120177","https://openalex.org/W2518516791"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}