{"id":"https://openalex.org/W3166831198","doi":"https://doi.org/10.1007/978-3-030-77417-2_28","title":"Research on Automatic Test Technology of Embedded System Based on Cloud Platform","display_name":"Research on Automatic Test Technology of Embedded System Based on Cloud Platform","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3166831198","doi":"https://doi.org/10.1007/978-3-030-77417-2_28","mag":"3166831198"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-77417-2_28","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-77417-2_28","pdf_url":null,"source":{"id":"https://openalex.org/S4393917809","display_name":"Lecture notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering","issn_l":"1867-8211","issn":["1867-8211","1867-822X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103779032","display_name":"Xia Wei","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129906","display_name":"Xi\u2019an International University","ror":"https://ror.org/02w30qy89","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210129906"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xia Wei","raw_affiliation_strings":["Xi\u2019an International University, Xian, 710000, China","Xi'an International University, Xian, 710000, China"],"affiliations":[{"raw_affiliation_string":"Xi\u2019an International University, Xian, 710000, China","institution_ids":["https://openalex.org/I4210129906"]},{"raw_affiliation_string":"Xi'an International University, Xian, 710000, China","institution_ids":["https://openalex.org/I4210129906"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5103779032"],"corresponding_institution_ids":["https://openalex.org/I4210129906"],"apc_list":null,"apc_paid":null,"fwci":0.5454,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.62565986,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"374","last_page":"379"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13832","display_name":"Advanced Decision-Making Techniques","score":0.8640999794006348,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13832","display_name":"Advanced Decision-Making Techniques","score":0.8640999794006348,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14025","display_name":"Educational Technology and Assessment","score":0.7901999950408936,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6209524869918823},{"id":"https://openalex.org/keywords/system-integration-testing","display_name":"System integration testing","score":0.6145356297492981},{"id":"https://openalex.org/keywords/cloud-computing","display_name":"Cloud computing","score":0.5886905193328857},{"id":"https://openalex.org/keywords/integration-testing","display_name":"Integration testing","score":0.5647174715995789},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5197298526763916},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4936474561691284},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.46962621808052063},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4400365948677063},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.43626081943511963},{"id":"https://openalex.org/keywords/systems-development-life-cycle","display_name":"Systems development life cycle","score":0.4352230131626129},{"id":"https://openalex.org/keywords/embedded-software","display_name":"Embedded software","score":0.4334380626678467},{"id":"https://openalex.org/keywords/unit-testing","display_name":"Unit testing","score":0.4323922395706177},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4000851511955261},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.3804396986961365},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3704753816127777},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.3467821478843689},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.33817553520202637},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.3225570321083069},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3024224638938904}],"concepts":[{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6209524869918823},{"id":"https://openalex.org/C111524372","wikidata":"https://www.wikidata.org/wiki/Q7663718","display_name":"System integration testing","level":5,"score":0.6145356297492981},{"id":"https://openalex.org/C79974875","wikidata":"https://www.wikidata.org/wiki/Q483639","display_name":"Cloud computing","level":2,"score":0.5886905193328857},{"id":"https://openalex.org/C107683887","wikidata":"https://www.wikidata.org/wiki/Q782466","display_name":"Integration testing","level":3,"score":0.5647174715995789},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5197298526763916},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4936474561691284},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.46962621808052063},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4400365948677063},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.43626081943511963},{"id":"https://openalex.org/C120617098","wikidata":"https://www.wikidata.org/wiki/Q559486","display_name":"Systems development life cycle","level":5,"score":0.4352230131626129},{"id":"https://openalex.org/C154488198","wikidata":"https://www.wikidata.org/wiki/Q1335007","display_name":"Embedded software","level":3,"score":0.4334380626678467},{"id":"https://openalex.org/C148027188","wikidata":"https://www.wikidata.org/wiki/Q907375","display_name":"Unit testing","level":3,"score":0.4323922395706177},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4000851511955261},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.3804396986961365},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3704753816127777},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.3467821478843689},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.33817553520202637},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.3225570321083069},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3024224638938904},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-77417-2_28","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-77417-2_28","pdf_url":null,"source":{"id":"https://openalex.org/S4393917809","display_name":"Lecture notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering","issn_l":"1867-8211","issn":["1867-8211","1867-822X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5299999713897705,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2790536622","https://openalex.org/W2793115980","https://openalex.org/W2793289160","https://openalex.org/W2793522686","https://openalex.org/W2793906359","https://openalex.org/W2801458278","https://openalex.org/W2811287194","https://openalex.org/W2811456382","https://openalex.org/W2922451033","https://openalex.org/W2988331271","https://openalex.org/W3212759698"],"related_works":["https://openalex.org/W1551963888","https://openalex.org/W2355117330","https://openalex.org/W1593545861","https://openalex.org/W107462476","https://openalex.org/W2063289013","https://openalex.org/W2378850411","https://openalex.org/W2143874096","https://openalex.org/W2392222982","https://openalex.org/W654934078","https://openalex.org/W4388937055"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}