{"id":"https://openalex.org/W3162431595","doi":"https://doi.org/10.1007/978-3-030-75762-5_27","title":"Improved Topology Extraction Using Discriminative Parameter Mining of Logs","display_name":"Improved Topology Extraction Using Discriminative Parameter Mining of Logs","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3162431595","doi":"https://doi.org/10.1007/978-3-030-75762-5_27","mag":"3162431595"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-75762-5_27","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-75762-5_27","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104082307","display_name":"Atri Mandal","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103279","display_name":"IBM Research - India","ror":"https://ror.org/014wt7r80","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210103279","https://openalex.org/I4210114115"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Atri Mandal","raw_affiliation_strings":["IBM Research, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"IBM Research, Bangalore, India","institution_ids":["https://openalex.org/I4210103279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048534784","display_name":"Saranya Gupta","orcid":null},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Saranya Gupta","raw_affiliation_strings":["CUHK, Hong Kong, Hong Kong SAR"],"affiliations":[{"raw_affiliation_string":"CUHK, Hong Kong, Hong Kong SAR","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112322219","display_name":"Shivali Agarwal","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103279","display_name":"IBM Research - India","ror":"https://ror.org/014wt7r80","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210103279","https://openalex.org/I4210114115"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shivali Agarwal","raw_affiliation_strings":["IBM Research, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"IBM Research, Bangalore, India","institution_ids":["https://openalex.org/I4210103279"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109508156","display_name":"Prateeti Mohapatra","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103279","display_name":"IBM Research - India","ror":"https://ror.org/014wt7r80","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210103279","https://openalex.org/I4210114115"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Prateeti Mohapatra","raw_affiliation_strings":["IBM Research, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"IBM Research, Bangalore, India","institution_ids":["https://openalex.org/I4210103279"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5104082307"],"corresponding_institution_ids":["https://openalex.org/I4210103279"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.7306,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.83447624,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"333","last_page":"345"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9692999720573425,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10538","display_name":"Data Mining Algorithms and Applications","score":0.9668999910354614,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8509345054626465},{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.8392921090126038},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5986105799674988},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5242800116539001},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4923900365829468},{"id":"https://openalex.org/keywords/information-extraction","display_name":"Information extraction","score":0.443342924118042},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.40305620431900024},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.37282782793045044},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.061112672090530396},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.05647900700569153},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0415249764919281}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8509345054626465},{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.8392921090126038},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5986105799674988},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5242800116539001},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4923900365829468},{"id":"https://openalex.org/C195807954","wikidata":"https://www.wikidata.org/wiki/Q1662562","display_name":"Information extraction","level":2,"score":0.443342924118042},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.40305620431900024},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.37282782793045044},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.061112672090530396},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.05647900700569153},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0415249764919281},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-75762-5_27","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-75762-5_27","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W46959185","https://openalex.org/W1537198022","https://openalex.org/W1661413208","https://openalex.org/W2098695822","https://openalex.org/W2171867449","https://openalex.org/W2208211896","https://openalex.org/W2493916176","https://openalex.org/W2508465325","https://openalex.org/W2754665629","https://openalex.org/W2899695116","https://openalex.org/W2901719959","https://openalex.org/W2966971704","https://openalex.org/W6628970784"],"related_works":["https://openalex.org/W2965546495","https://openalex.org/W4389116644","https://openalex.org/W2153315159","https://openalex.org/W3103844505","https://openalex.org/W259157601","https://openalex.org/W4205463238","https://openalex.org/W2110523656","https://openalex.org/W1482209366","https://openalex.org/W2521627374","https://openalex.org/W2981954115"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}