{"id":"https://openalex.org/W3016329803","doi":"https://doi.org/10.1007/978-3-030-67661-2_10","title":"Knowledge Elicitation Using Deep Metric Learning and Psychometric Testing","display_name":"Knowledge Elicitation Using Deep Metric Learning and Psychometric Testing","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3016329803","doi":"https://doi.org/10.1007/978-3-030-67661-2_10","mag":"3016329803"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-67661-2_10","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-67661-2_10","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.tue.nl/en/publications/0b18fa86-de73-4e47-af9f-045b1d89ae4f","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Lu Yin","orcid":null},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Lu Yin","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Vlado Menkovski","orcid":null},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Vlado Menkovski","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"last","author":{"id":null,"display_name":"Mykola Pechenizkiy","orcid":null},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mykola Pechenizkiy","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I83019370"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I83019370"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.00327462,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"154","last_page":"169"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11448","display_name":"Face recognition and analysis","score":0.4277999997138977,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11448","display_name":"Face recognition and analysis","score":0.4277999997138977,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11307","display_name":"Domain Adaptation and Few-Shot Learning","score":0.1046999990940094,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.05260000005364418,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.7286999821662903},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.7049000263214111},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.546999990940094},{"id":"https://openalex.org/keywords/fidelity","display_name":"Fidelity","score":0.5460000038146973},{"id":"https://openalex.org/keywords/domain-knowledge","display_name":"Domain knowledge","score":0.5364000201225281},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.49079999327659607},{"id":"https://openalex.org/keywords/annotation","display_name":"Annotation","score":0.4415999948978424},{"id":"https://openalex.org/keywords/synthetic-data","display_name":"Synthetic data","score":0.33000001311302185},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.3181000053882599}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8258000016212463},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.7286999821662903},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.7049000263214111},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6251999735832214},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.567799985408783},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.546999990940094},{"id":"https://openalex.org/C2776459999","wikidata":"https://www.wikidata.org/wiki/Q2119376","display_name":"Fidelity","level":2,"score":0.5460000038146973},{"id":"https://openalex.org/C207685749","wikidata":"https://www.wikidata.org/wiki/Q2088941","display_name":"Domain knowledge","level":2,"score":0.5364000201225281},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.49079999327659607},{"id":"https://openalex.org/C2776321320","wikidata":"https://www.wikidata.org/wiki/Q857525","display_name":"Annotation","level":2,"score":0.4415999948978424},{"id":"https://openalex.org/C160920958","wikidata":"https://www.wikidata.org/wiki/Q7662746","display_name":"Synthetic data","level":2,"score":0.33000001311302185},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.3181000053882599},{"id":"https://openalex.org/C136389625","wikidata":"https://www.wikidata.org/wiki/Q334384","display_name":"Supervised learning","level":3,"score":0.314300000667572},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.31189998984336853},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.31150001287460327},{"id":"https://openalex.org/C51632099","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Training set","level":2,"score":0.30660000443458557},{"id":"https://openalex.org/C198043062","wikidata":"https://www.wikidata.org/wiki/Q180953","display_name":"Metric space","level":2,"score":0.30649998784065247},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.2922999858856201},{"id":"https://openalex.org/C120567893","wikidata":"https://www.wikidata.org/wiki/Q1582085","display_name":"Knowledge extraction","level":2,"score":0.29109999537467957},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.29030001163482666},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.28610000014305115},{"id":"https://openalex.org/C2776502983","wikidata":"https://www.wikidata.org/wiki/Q690182","display_name":"Contrast (vision)","level":2,"score":0.2831999957561493},{"id":"https://openalex.org/C120936955","wikidata":"https://www.wikidata.org/wiki/Q2155640","display_name":"Empirical research","level":2,"score":0.2745000123977661},{"id":"https://openalex.org/C184337299","wikidata":"https://www.wikidata.org/wiki/Q1437428","display_name":"Semantics (computer science)","level":2,"score":0.2718000113964081},{"id":"https://openalex.org/C204321447","wikidata":"https://www.wikidata.org/wiki/Q30642","display_name":"Natural language processing","level":1,"score":0.27079999446868896},{"id":"https://openalex.org/C22019652","wikidata":"https://www.wikidata.org/wiki/Q331309","display_name":"Overfitting","level":3,"score":0.2703000009059906},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.2669999897480011},{"id":"https://openalex.org/C105002631","wikidata":"https://www.wikidata.org/wiki/Q4833645","display_name":"Subject-matter expert","level":3,"score":0.257999986410141}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/978-3-030-67661-2_10","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-67661-2_10","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"pmh:oai:pure.tue.nl:openaire/0b18fa86-de73-4e47-af9f-045b1d89ae4f","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/0b18fa86-de73-4e47-af9f-045b1d89ae4f","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Yin, L, Menkovski, V & Pechenizkiy, M 2021, Knowledge Elicitation Using Deep Metric Learning and Psychometric Testing. in F Hutter, K Kersting, J Lijffijt & I Valera (eds), Machine Learning and Knowledge Discovery in Databases : European Conference, ECML PKDD 2020, Ghent, Belgium, September 14\u201318, 2020, Proceedings, Part II. Lecture Notes in Computer Science (LNCS), vol. 12458, Lecture Notes in Artificial Intelligence (LNAI), vol. 12458, Springer, Cham, pp. 154-169, 2020 European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases (ECML PKDD 2020), Ghent, Belgium, 14/09/20. https://doi.org/10.1007/978-3-030-67661-2_10","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:arXiv.org:2004.06353","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2004.06353","pdf_url":"https://arxiv.org/pdf/2004.06353","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:pure.tue.nl:openaire/0b18fa86-de73-4e47-af9f-045b1d89ae4f","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/0b18fa86-de73-4e47-af9f-045b1d89ae4f","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Yin, L, Menkovski, V & Pechenizkiy, M 2021, Knowledge Elicitation Using Deep Metric Learning and Psychometric Testing. in F Hutter, K Kersting, J Lijffijt & I Valera (eds), Machine Learning and Knowledge Discovery in Databases : European Conference, ECML PKDD 2020, Ghent, Belgium, September 14\u201318, 2020, Proceedings, Part II. Lecture Notes in Computer Science (LNCS), vol. 12458, Lecture Notes in Artificial Intelligence (LNAI), vol. 12458, Springer, Cham, pp. 154-169, 2020 European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases (ECML PKDD 2020), Ghent, Belgium, 14/09/20. https://doi.org/10.1007/978-3-030-67661-2_10","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1982374456","https://openalex.org/W2033255535","https://openalex.org/W2036718463","https://openalex.org/W2071889678","https://openalex.org/W2096733369","https://openalex.org/W2099025623","https://openalex.org/W2106097867","https://openalex.org/W2128999403","https://openalex.org/W2138621090","https://openalex.org/W2583115687","https://openalex.org/W2606377603","https://openalex.org/W2606611007","https://openalex.org/W2745407736","https://openalex.org/W2895347732","https://openalex.org/W2963026686","https://openalex.org/W2963350250","https://openalex.org/W4250042253","https://openalex.org/W4252283762","https://openalex.org/W6600679772"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2020-04-24T00:00:00"}