{"id":"https://openalex.org/W3102173658","doi":"https://doi.org/10.1007/978-3-030-62463-7_10","title":"A Location Method for Reliability-Critical Paths Based on Monte Carlo Search Tree","display_name":"A Location Method for Reliability-Critical Paths Based on Monte Carlo Search Tree","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3102173658","doi":"https://doi.org/10.1007/978-3-030-62463-7_10","mag":"3102173658"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-62463-7_10","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-62463-7_10","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079385121","display_name":"Ziwen Sun","orcid":"https://orcid.org/0000-0002-5992-6444"},"institutions":[{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ziwen Sun","raw_affiliation_strings":["Zhejiang University of Technology, Hangzhou, 310023, China"],"raw_orcid":"https://orcid.org/0000-0002-5992-6444","affiliations":[{"raw_affiliation_string":"Zhejiang University of Technology, Hangzhou, 310023, China","institution_ids":["https://openalex.org/I55712492"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086798461","display_name":"Qiou Ji","orcid":"https://orcid.org/0000-0002-2823-2618"},"institutions":[{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiou Ji","raw_affiliation_strings":["Zhejiang University of Technology, Hangzhou, 310023, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University of Technology, Hangzhou, 310023, China","institution_ids":["https://openalex.org/I55712492"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101830169","display_name":"Zecheng Wu","orcid":"https://orcid.org/0009-0004-0704-998X"},"institutions":[{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zecheng Wu","raw_affiliation_strings":["Zhejiang University of Technology, Hangzhou, 310023, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University of Technology, Hangzhou, 310023, China","institution_ids":["https://openalex.org/I55712492"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045358806","display_name":"Aizhu Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aizhu Liu","raw_affiliation_strings":["Zhejiang University of Technology, Hangzhou, 310023, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University of Technology, Hangzhou, 310023, China","institution_ids":["https://openalex.org/I55712492"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5079385121"],"corresponding_institution_ids":["https://openalex.org/I55712492"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.31137184,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"100","last_page":"114"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7581576108932495},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7212598919868469},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6956068873405457},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6026483774185181},{"id":"https://openalex.org/keywords/tree","display_name":"Tree (set theory)","score":0.5472812056541443},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5213809609413147},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5132691860198975},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.43409112095832825},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.38855549693107605},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.35864830017089844},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3492634892463684},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12500345706939697},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08483472466468811},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08270496129989624}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7581576108932495},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7212598919868469},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6956068873405457},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6026483774185181},{"id":"https://openalex.org/C113174947","wikidata":"https://www.wikidata.org/wiki/Q2859736","display_name":"Tree (set theory)","level":2,"score":0.5472812056541443},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5213809609413147},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5132691860198975},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.43409112095832825},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38855549693107605},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.35864830017089844},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3492634892463684},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12500345706939697},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08483472466468811},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08270496129989624},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-62463-7_10","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-62463-7_10","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2047357356","https://openalex.org/W2057841119","https://openalex.org/W2061705354","https://openalex.org/W2071310017","https://openalex.org/W2117895177","https://openalex.org/W2141816486","https://openalex.org/W2151980349","https://openalex.org/W2152468865","https://openalex.org/W2170851517","https://openalex.org/W2568508485","https://openalex.org/W2590068080","https://openalex.org/W2766447205","https://openalex.org/W2808639217","https://openalex.org/W2904112784","https://openalex.org/W2950061491","https://openalex.org/W2977724802","https://openalex.org/W4243927440"],"related_works":["https://openalex.org/W4244913946","https://openalex.org/W2074526596","https://openalex.org/W4242010157","https://openalex.org/W2158651403","https://openalex.org/W2109352426","https://openalex.org/W2106268153","https://openalex.org/W4312239443","https://openalex.org/W2244070856","https://openalex.org/W2093227051","https://openalex.org/W1602382472"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}