{"id":"https://openalex.org/W3096574175","doi":"https://doi.org/10.1007/978-3-030-61705-9_55","title":"Local Binary Pattern Features to Detect Anomalies in Machined Workpiece","display_name":"Local Binary Pattern Features to Detect Anomalies in Machined Workpiece","publication_year":2020,"publication_date":"2020-01-01","ids":{"openalex":"https://openalex.org/W3096574175","doi":"https://doi.org/10.1007/978-3-030-61705-9_55","mag":"3096574175"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-61705-9_55","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-61705-9_55","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000068274","display_name":"L\u00eddia S\u00e1nchez-Gonz\u00e1lez","orcid":"https://orcid.org/0000-0002-0760-1170"},"institutions":[{"id":"https://openalex.org/I8833935","display_name":"Universidad de Le\u00f3n","ror":"https://ror.org/02tzt0b78","country_code":"ES","type":"education","lineage":["https://openalex.org/I8833935"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Lidia S\u00e1nchez-Gonz\u00e1lez","raw_affiliation_strings":["Departamento de Ingenier\u00edas Mec\u00e1nica, Inform\u00e1tica y Aeroespacial, Universidad de Le\u00f3n, 24071, Le\u00f3n, Spain"],"raw_orcid":"https://orcid.org/0000-0002-0760-1170","affiliations":[{"raw_affiliation_string":"Departamento de Ingenier\u00edas Mec\u00e1nica, Inform\u00e1tica y Aeroespacial, Universidad de Le\u00f3n, 24071, Le\u00f3n, Spain","institution_ids":["https://openalex.org/I8833935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065154757","display_name":"Virginia Riego del Castillo","orcid":"https://orcid.org/0000-0003-3389-0786"},"institutions":[{"id":"https://openalex.org/I8833935","display_name":"Universidad de Le\u00f3n","ror":"https://ror.org/02tzt0b78","country_code":"ES","type":"education","lineage":["https://openalex.org/I8833935"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Virginia Riego","raw_affiliation_strings":["Departamento de Ingenier\u00edas Mec\u00e1nica, Inform\u00e1tica y Aeroespacial, Universidad de Le\u00f3n, 24071, Le\u00f3n, Spain"],"raw_orcid":"https://orcid.org/0000-0003-3389-0786","affiliations":[{"raw_affiliation_string":"Departamento de Ingenier\u00edas Mec\u00e1nica, Inform\u00e1tica y Aeroespacial, Universidad de Le\u00f3n, 24071, Le\u00f3n, Spain","institution_ids":["https://openalex.org/I8833935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007689548","display_name":"Manuel Castej\u00f3n\u2010Limas","orcid":"https://orcid.org/0000-0002-5152-4555"},"institutions":[{"id":"https://openalex.org/I8833935","display_name":"Universidad de Le\u00f3n","ror":"https://ror.org/02tzt0b78","country_code":"ES","type":"education","lineage":["https://openalex.org/I8833935"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Manuel Castej\u00f3n-Limas","raw_affiliation_strings":["Departamento de Ingenier\u00edas Mec\u00e1nica, Inform\u00e1tica y Aeroespacial, Universidad de Le\u00f3n, 24071, Le\u00f3n, Spain"],"raw_orcid":"https://orcid.org/0000-0002-5152-4555","affiliations":[{"raw_affiliation_string":"Departamento de Ingenier\u00edas Mec\u00e1nica, Inform\u00e1tica y Aeroespacial, Universidad de Le\u00f3n, 24071, Le\u00f3n, Spain","institution_ids":["https://openalex.org/I8833935"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014935641","display_name":"Laura Fern\u00e1ndez-Robles","orcid":"https://orcid.org/0000-0001-6573-8477"},"institutions":[{"id":"https://openalex.org/I8833935","display_name":"Universidad de Le\u00f3n","ror":"https://ror.org/02tzt0b78","country_code":"ES","type":"education","lineage":["https://openalex.org/I8833935"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Laura Fern\u00e1ndez-Robles","raw_affiliation_strings":["Departamento de Ingenier\u00edas Mec\u00e1nica, Inform\u00e1tica y Aeroespacial, Universidad de Le\u00f3n, 24071, Le\u00f3n, Spain"],"raw_orcid":"https://orcid.org/0000-0001-6573-8477","affiliations":[{"raw_affiliation_string":"Departamento de Ingenier\u00edas Mec\u00e1nica, Inform\u00e1tica y Aeroespacial, Universidad de Le\u00f3n, 24071, Le\u00f3n, Spain","institution_ids":["https://openalex.org/I8833935"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5000068274"],"corresponding_institution_ids":["https://openalex.org/I8833935"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.21114825,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"665","last_page":"673"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6940548419952393},{"id":"https://openalex.org/keywords/local-binary-patterns","display_name":"Local binary patterns","score":0.6053648591041565},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5849626660346985},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5832434296607971},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5689257383346558},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5688738226890564},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.567168653011322},{"id":"https://openalex.org/keywords/texture","display_name":"Texture (cosmology)","score":0.5333886742591858},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4999725818634033},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.49197694659233093},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.4842228889465332},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.41329631209373474},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.3687257468700409},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.36449897289276123},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16076555848121643},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.13855770230293274},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09558466076850891},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.07972341775894165}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6940548419952393},{"id":"https://openalex.org/C87335442","wikidata":"https://www.wikidata.org/wiki/Q2494345","display_name":"Local binary patterns","level":4,"score":0.6053648591041565},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5849626660346985},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5832434296607971},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5689257383346558},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5688738226890564},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.567168653011322},{"id":"https://openalex.org/C2781195486","wikidata":"https://www.wikidata.org/wiki/Q289436","display_name":"Texture (cosmology)","level":3,"score":0.5333886742591858},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4999725818634033},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.49197694659233093},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.4842228889465332},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.41329631209373474},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3687257468700409},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.36449897289276123},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16076555848121643},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.13855770230293274},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09558466076850891},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.07972341775894165},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-61705-9_55","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-61705-9_55","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life in Land","score":0.47999998927116394,"id":"https://metadata.un.org/sdg/15"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W771829126","https://openalex.org/W1866817428","https://openalex.org/W1994967090","https://openalex.org/W2001412060","https://openalex.org/W2017745767","https://openalex.org/W2035034399","https://openalex.org/W2044465660","https://openalex.org/W2070882938","https://openalex.org/W2102919172","https://openalex.org/W2163352848","https://openalex.org/W2196029350","https://openalex.org/W2280622868","https://openalex.org/W2492985111","https://openalex.org/W2772727138","https://openalex.org/W2904702446","https://openalex.org/W2907066882","https://openalex.org/W2909430258","https://openalex.org/W2969915407","https://openalex.org/W2971114662","https://openalex.org/W2972227710","https://openalex.org/W2993303538"],"related_works":["https://openalex.org/W2055219403","https://openalex.org/W2791313072","https://openalex.org/W3166997759","https://openalex.org/W2794489335","https://openalex.org/W2080437822","https://openalex.org/W2153027217","https://openalex.org/W2855870609","https://openalex.org/W1987527207","https://openalex.org/W2152785806","https://openalex.org/W2320103770"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}