{"id":"https://openalex.org/W2970972850","doi":"https://doi.org/10.1007/978-3-030-26601-1_2","title":"Graceful Degradation Design Process for Autonomous Driving System","display_name":"Graceful Degradation Design Process for Autonomous Driving System","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2970972850","doi":"https://doi.org/10.1007/978-3-030-26601-1_2","mag":"2970972850"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-26601-1_2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-26601-1_2","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073806128","display_name":"Tasuku Ishigooka","orcid":"https://orcid.org/0009-0008-0795-7370"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Tasuku Ishigooka","raw_affiliation_strings":["Research and Development Group, Hitachi Ltd., Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Research and Development Group, Hitachi Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005058882","display_name":"Satoshi Otsuka","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Otsuka","raw_affiliation_strings":["Research and Development Group, Hitachi Ltd., Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Research and Development Group, Hitachi Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005554230","display_name":"Kazuyoshi Serizawa","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuyoshi Serizawa","raw_affiliation_strings":["Hitachi Automotive Systems Ltd., Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Hitachi Automotive Systems Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109874081","display_name":"Ryo TSUCHIYA","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryo Tsuchiya","raw_affiliation_strings":["Hitachi Automotive Systems Ltd., Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Hitachi Automotive Systems Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056685719","display_name":"Fumio Narisawa","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fumio Narisawa","raw_affiliation_strings":["Hitachi Automotive Systems Ltd., Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Hitachi Automotive Systems Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I65143321"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5073806128"],"corresponding_institution_ids":["https://openalex.org/I65143321"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":3.4685,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.93375112,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"19","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.9830999970436096,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.982699990272522,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.798413872718811},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.7048017978668213},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6765134334564209},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6715450286865234},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6295052766799927},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5712696313858032},{"id":"https://openalex.org/keywords/process-automation-system","display_name":"Process automation system","score":0.4875742793083191},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.44314831495285034},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4430459439754486},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4279105067253113},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4245920777320862},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.1632353663444519},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13048622012138367},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10130089521408081}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.798413872718811},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.7048017978668213},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6765134334564209},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6715450286865234},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6295052766799927},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5712696313858032},{"id":"https://openalex.org/C21457203","wikidata":"https://www.wikidata.org/wiki/Q4056293","display_name":"Process automation system","level":3,"score":0.4875742793083191},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.44314831495285034},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4430459439754486},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4279105067253113},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4245920777320862},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.1632353663444519},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13048622012138367},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10130089521408081},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-26601-1_2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-26601-1_2","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W642092214","https://openalex.org/W2051228755","https://openalex.org/W2077903831","https://openalex.org/W2153726799","https://openalex.org/W2538361090","https://openalex.org/W2613682588","https://openalex.org/W2885798252","https://openalex.org/W2887899377","https://openalex.org/W2888126138"],"related_works":["https://openalex.org/W2381742191","https://openalex.org/W2390581407","https://openalex.org/W2384002254","https://openalex.org/W2167610914","https://openalex.org/W2204392445","https://openalex.org/W2365103596","https://openalex.org/W2371278243","https://openalex.org/W4387011833","https://openalex.org/W4248723619","https://openalex.org/W2380790276"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}