{"id":"https://openalex.org/W2948698927","doi":"https://doi.org/10.1007/978-3-030-20518-8_19","title":"Flatness Defect Detection and Classification in Hot Rolled Steel Strips Using Convolutional Neural Networks","display_name":"Flatness Defect Detection and Classification in Hot Rolled Steel Strips Using Convolutional Neural Networks","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2948698927","doi":"https://doi.org/10.1007/978-3-030-20518-8_19","mag":"2948698927"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-20518-8_19","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-20518-8_19","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081753833","display_name":"Marco Vannocci","orcid":null},"institutions":[{"id":"https://openalex.org/I162290304","display_name":"Scuola Superiore Sant'Anna","ror":"https://ror.org/025602r80","country_code":"IT","type":"education","lineage":["https://openalex.org/I162290304"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Marco Vannocci","raw_affiliation_strings":["TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]},{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033430620","display_name":"Antonio Ritacco","orcid":null},"institutions":[{"id":"https://openalex.org/I162290304","display_name":"Scuola Superiore Sant'Anna","ror":"https://ror.org/025602r80","country_code":"IT","type":"education","lineage":["https://openalex.org/I162290304"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Ritacco","raw_affiliation_strings":["TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]},{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025022190","display_name":"Angelo Castellano","orcid":null},"institutions":[{"id":"https://openalex.org/I162290304","display_name":"Scuola Superiore Sant'Anna","ror":"https://ror.org/025602r80","country_code":"IT","type":"education","lineage":["https://openalex.org/I162290304"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Angelo Castellano","raw_affiliation_strings":["TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]},{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001982487","display_name":"Filippo Galli","orcid":"https://orcid.org/0000-0002-2279-3545"},"institutions":[{"id":"https://openalex.org/I162290304","display_name":"Scuola Superiore Sant'Anna","ror":"https://ror.org/025602r80","country_code":"IT","type":"education","lineage":["https://openalex.org/I162290304"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Filippo Galli","raw_affiliation_strings":["TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]},{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070598302","display_name":"Marco Vannucci","orcid":"https://orcid.org/0000-0002-6115-1588"},"institutions":[{"id":"https://openalex.org/I162290304","display_name":"Scuola Superiore Sant'Anna","ror":"https://ror.org/025602r80","country_code":"IT","type":"education","lineage":["https://openalex.org/I162290304"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Vannucci","raw_affiliation_strings":["TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]},{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044243938","display_name":"Vincenzo Iannino","orcid":"https://orcid.org/0000-0001-5924-7057"},"institutions":[{"id":"https://openalex.org/I162290304","display_name":"Scuola Superiore Sant'Anna","ror":"https://ror.org/025602r80","country_code":"IT","type":"education","lineage":["https://openalex.org/I162290304"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Vincenzo Iannino","raw_affiliation_strings":["TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]},{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033400760","display_name":"Valentina Colla","orcid":"https://orcid.org/0000-0002-9574-0575"},"institutions":[{"id":"https://openalex.org/I162290304","display_name":"Scuola Superiore Sant'Anna","ror":"https://ror.org/025602r80","country_code":"IT","type":"education","lineage":["https://openalex.org/I162290304"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Valentina Colla","raw_affiliation_strings":["TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant\u2019Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]},{"raw_affiliation_string":"TeCIP Institute, ICT-COISP Center, Scuola Superiore Sant'Anna, Via G. Moruzzi 1, 56124, Pisa, Italy","institution_ids":["https://openalex.org/I162290304"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5081753833"],"corresponding_institution_ids":["https://openalex.org/I162290304"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":7.0628,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.97552671,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"220","last_page":"234"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9782000184059143,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/strips","display_name":"STRIPS","score":0.9236366748809814},{"id":"https://openalex.org/keywords/flatness","display_name":"Flatness (cosmology)","score":0.8065159320831299},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6335090398788452},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5575046539306641},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5418172478675842},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5075153112411499},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4757230579853058},{"id":"https://openalex.org/keywords/strip-steel","display_name":"Strip steel","score":0.46657881140708923},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4604964256286621},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.4362000823020935},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.42182764410972595},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41111063957214355},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3249087929725647},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1791180670261383},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.136723130941391},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0780085027217865}],"concepts":[{"id":"https://openalex.org/C200925200","wikidata":"https://www.wikidata.org/wiki/Q7624170","display_name":"STRIPS","level":2,"score":0.9236366748809814},{"id":"https://openalex.org/C2778530986","wikidata":"https://www.wikidata.org/wiki/Q5457948","display_name":"Flatness (cosmology)","level":3,"score":0.8065159320831299},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6335090398788452},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5575046539306641},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5418172478675842},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5075153112411499},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4757230579853058},{"id":"https://openalex.org/C2780242121","wikidata":"https://www.wikidata.org/wiki/Q7624097","display_name":"Strip steel","level":2,"score":0.46657881140708923},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4604964256286621},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.4362000823020935},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.42182764410972595},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41111063957214355},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3249087929725647},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1791180670261383},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.136723130941391},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0780085027217865},{"id":"https://openalex.org/C26405456","wikidata":"https://www.wikidata.org/wiki/Q338","display_name":"Cosmology","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-030-20518-8_19","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-20518-8_19","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"pmh:oai:www.iris.sssup.it:11382/530156","is_oa":false,"landing_page_url":"http://hdl.handle.net/11382/530156","pdf_url":null,"source":{"id":"https://openalex.org/S4377196376","display_name":"CINECA IRIS Institutional Research Information System (Sant'Anna School of Advanced Studies)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I162290304","host_organization_name":"Scuola Superiore Sant'Anna","host_organization_lineage":["https://openalex.org/I162290304"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W574630740","https://openalex.org/W603220729","https://openalex.org/W1522301498","https://openalex.org/W1533861849","https://openalex.org/W1564419782","https://openalex.org/W1652242680","https://openalex.org/W1673310716","https://openalex.org/W1677182931","https://openalex.org/W1686810756","https://openalex.org/W1799366690","https://openalex.org/W1885262319","https://openalex.org/W1969174319","https://openalex.org/W1972923418","https://openalex.org/W2062118960","https://openalex.org/W2064014153","https://openalex.org/W2066359763","https://openalex.org/W2078087367","https://openalex.org/W2096943734","https://openalex.org/W2097117768","https://openalex.org/W2111445042","https://openalex.org/W2112796928","https://openalex.org/W2117539524","https://openalex.org/W2133212356","https://openalex.org/W2139176774","https://openalex.org/W2171578796","https://openalex.org/W2183790810","https://openalex.org/W2194775991","https://openalex.org/W2315950530","https://openalex.org/W2419597278","https://openalex.org/W2555410679","https://openalex.org/W2560920040","https://openalex.org/W2597357081","https://openalex.org/W2790707365","https://openalex.org/W2883507261","https://openalex.org/W2895288506","https://openalex.org/W2911964244","https://openalex.org/W2912934387","https://openalex.org/W2963446712","https://openalex.org/W3038058348","https://openalex.org/W4212875434","https://openalex.org/W4252233461"],"related_works":["https://openalex.org/W1983108222","https://openalex.org/W2468442818","https://openalex.org/W2069681419","https://openalex.org/W2466505019","https://openalex.org/W2349360459","https://openalex.org/W2368078208","https://openalex.org/W1970977770","https://openalex.org/W2558114781","https://openalex.org/W2139963745","https://openalex.org/W2390358840"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}