{"id":"https://openalex.org/W2908440707","doi":"https://doi.org/10.1007/978-3-030-05931-6_14","title":"Information-Rich Manufacturing Metrology","display_name":"Information-Rich Manufacturing Metrology","publication_year":2018,"publication_date":"2018-12-31","ids":{"openalex":"https://openalex.org/W2908440707","doi":"https://doi.org/10.1007/978-3-030-05931-6_14","mag":"2908440707"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-05931-6_14","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-05931-6_14","pdf_url":null,"source":{"id":"https://openalex.org/S4210185096","display_name":"IFIP advances in information and communication technology","issn_l":"1868-422X","issn":["1868-422X","1868-4238"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://inria.hal.science/hal-02115838","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002204160","display_name":"Richard Leach","orcid":"https://orcid.org/0000-0001-5777-067X"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Richard Leach","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057425563","display_name":"Patrick Bointon","orcid":"https://orcid.org/0000-0002-7405-8825"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Patrick Bointon","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050664549","display_name":"Xiaobing Feng","orcid":"https://orcid.org/0000-0002-3328-5247"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Xiaobing Feng","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084185483","display_name":"Simon Lawes","orcid":null},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Simon Lawes","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017633397","display_name":"Samanta Piano","orcid":"https://orcid.org/0000-0003-4862-9652"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Samanta Piano","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088869627","display_name":"Nicola Senin","orcid":"https://orcid.org/0000-0002-9556-0363"},"institutions":[{"id":"https://openalex.org/I27483092","display_name":"University of Perugia","ror":"https://ror.org/00x27da85","country_code":"IT","type":"education","lineage":["https://openalex.org/I27483092"]},{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB","IT"],"is_corresponding":false,"raw_author_name":"Nicola Senin","raw_affiliation_strings":["Department of Engineering, University of Perugia, 06125, Perugia, Italy","Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Perugia, 06125, Perugia, Italy","institution_ids":["https://openalex.org/I27483092"]},{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007436361","display_name":"Danny Sims-Waterhouse","orcid":null},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Danny Sims-Waterhouse","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019807731","display_name":"Petros Stavroulakis","orcid":"https://orcid.org/0000-0003-3769-1020"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Petros Stavroulakis","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027011883","display_name":"Rong Su","orcid":"https://orcid.org/0000-0003-0776-3716"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Rong Su","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041677990","display_name":"Wahyudin P. Syam","orcid":"https://orcid.org/0000-0002-4553-9611"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Wahyudin Syam","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062541280","display_name":"Matthew Thomas","orcid":"https://orcid.org/0000-0001-7855-4730"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Matthew Thomas","raw_affiliation_strings":["Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK"],"affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK","institution_ids":["https://openalex.org/I142263535"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5002204160"],"corresponding_institution_ids":["https://openalex.org/I142263535"],"apc_list":null,"apc_paid":null,"fwci":5.4132,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.96390299,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"145","last_page":"157"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.8847223520278931},{"id":"https://openalex.org/keywords/performance-measurement","display_name":"Performance measurement","score":0.5065222978591919},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5064672231674194},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.4939344525337219},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46868211030960083},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.45419245958328247},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.44813403487205505},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.43789488077163696},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.42236781120300293},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3809624910354614},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.35477226972579956},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35222333669662476},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.3317405879497528},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2288573980331421},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12048307061195374},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11140629649162292},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.08207878470420837},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07646241784095764},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0750865638256073}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8847223520278931},{"id":"https://openalex.org/C141571065","wikidata":"https://www.wikidata.org/wiki/Q1771949","display_name":"Performance measurement","level":2,"score":0.5065222978591919},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5064672231674194},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.4939344525337219},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46868211030960083},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.45419245958328247},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.44813403487205505},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.43789488077163696},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.42236781120300293},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3809624910354614},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.35477226972579956},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35222333669662476},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.3317405879497528},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2288573980331421},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12048307061195374},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11140629649162292},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.08207878470420837},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07646241784095764},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0750865638256073},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-3-030-05931-6_14","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-05931-6_14","pdf_url":null,"source":{"id":"https://openalex.org/S4210185096","display_name":"IFIP advances in information and communication technology","issn_l":"1868-422X","issn":["1868-422X","1868-4238"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP Advances in Information and Communication Technology","raw_type":"book-chapter"},{"id":"pmh:oai:HAL:hal-02115838v1","is_oa":true,"landing_page_url":"https://inria.hal.science/hal-02115838","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"8th International Precision Assembly Seminar (IPAS), Jan 2018, Chamonix, France. pp.145-157, ⟨10.1007/978-3-030-05931-6_14⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-02115838v1","is_oa":true,"landing_page_url":"https://inria.hal.science/hal-02115838","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"8th International Precision Assembly Seminar (IPAS), Jan 2018, Chamonix, France. pp.145-157, ⟨10.1007/978-3-030-05931-6_14⟩","raw_type":"Conference papers"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G5459522345","display_name":null,"funder_award_id":"EP/M008983/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G7400666756","display_name":null,"funder_award_id":"EP/R028826/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W581040779","https://openalex.org/W1169485761","https://openalex.org/W1550126066","https://openalex.org/W1551071722","https://openalex.org/W1952878045","https://openalex.org/W1965232111","https://openalex.org/W1970294808","https://openalex.org/W1980985654","https://openalex.org/W1983577980","https://openalex.org/W1988632918","https://openalex.org/W1997526216","https://openalex.org/W2003692676","https://openalex.org/W2006219965","https://openalex.org/W2008334070","https://openalex.org/W2009518030","https://openalex.org/W2011793322","https://openalex.org/W2025397186","https://openalex.org/W2028544373","https://openalex.org/W2035381059","https://openalex.org/W2065849276","https://openalex.org/W2073419926","https://openalex.org/W2093656291","https://openalex.org/W2160276089","https://openalex.org/W2166177908","https://openalex.org/W2173750543","https://openalex.org/W2216911839","https://openalex.org/W2250894080","https://openalex.org/W2257660580","https://openalex.org/W2303531378","https://openalex.org/W2318117916","https://openalex.org/W2327982333","https://openalex.org/W2342663163","https://openalex.org/W2345939069","https://openalex.org/W2395351561","https://openalex.org/W2415791065","https://openalex.org/W2561372454","https://openalex.org/W2586844817","https://openalex.org/W2591642545","https://openalex.org/W2728247727","https://openalex.org/W2739121344","https://openalex.org/W2760349024","https://openalex.org/W2763520982"],"related_works":["https://openalex.org/W1998546186","https://openalex.org/W2061967405","https://openalex.org/W2392646414","https://openalex.org/W2174860717","https://openalex.org/W2590542424","https://openalex.org/W2110528520","https://openalex.org/W2071668446","https://openalex.org/W2085930114","https://openalex.org/W2352147004","https://openalex.org/W3025740557"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}