{"id":"https://openalex.org/W2908447766","doi":"https://doi.org/10.1007/978-3-030-05499-1_8","title":"Detection and Classification of Faulty Weft Threads Using Both Feature-Based and Deep Convolutional Machine Learning Methods","display_name":"Detection and Classification of Faulty Weft Threads Using Both Feature-Based and Deep Convolutional Machine Learning Methods","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2908447766","doi":"https://doi.org/10.1007/978-3-030-05499-1_8","mag":"2908447766"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-05499-1_8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-030-05499-1_8","pdf_url":"https://link.springer.com/content/pdf/10.1007/978-3-030-05499-1_8.pdf","source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://link.springer.com/content/pdf/10.1007/978-3-030-05499-1_8.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061663719","display_name":"Marcin Kopaczka","orcid":"https://orcid.org/0000-0002-3695-4696"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Marcin Kopaczka","raw_affiliation_strings":["Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078694411","display_name":"Marco Saggiomo","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marco Saggiomo","raw_affiliation_strings":["Institut f\u00fcr Textiltechnik, RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Textiltechnik, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062528119","display_name":"Moritz G\u00fcttler","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Moritz G\u00fcttler","raw_affiliation_strings":["Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113928082","display_name":"Kevin Kielholz","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Kevin Kielholz","raw_affiliation_strings":["Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064747056","display_name":"Dorit Merhof","orcid":"https://orcid.org/0000-0002-1672-2185"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dorit Merhof","raw_affiliation_strings":["Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5061663719"],"corresponding_institution_ids":["https://openalex.org/I887968799"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.6299,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.82102575,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"141","last_page":"163"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8828263282775879},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7495406270027161},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7447032928466797},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.6617578864097595},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.563414990901947},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.518955409526825},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4985053539276123},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.49240267276763916},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.47665935754776},{"id":"https://openalex.org/keywords/contextual-image-classification","display_name":"Contextual image classification","score":0.45540934801101685},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.4450829029083252},{"id":"https://openalex.org/keywords/feature-engineering","display_name":"Feature engineering","score":0.43815332651138306},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.41271206736564636},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.39862683415412903},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3021416962146759}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8828263282775879},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7495406270027161},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7447032928466797},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.6617578864097595},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.563414990901947},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.518955409526825},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4985053539276123},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.49240267276763916},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.47665935754776},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.45540934801101685},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.4450829029083252},{"id":"https://openalex.org/C2778827112","wikidata":"https://www.wikidata.org/wiki/Q22245680","display_name":"Feature engineering","level":3,"score":0.43815332651138306},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.41271206736564636},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.39862683415412903},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3021416962146759},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-05499-1_8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-030-05499-1_8","pdf_url":"https://link.springer.com/content/pdf/10.1007/978-3-030-05499-1_8.pdf","source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":{"id":"doi:10.1007/978-3-030-05499-1_8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-3-030-05499-1_8","pdf_url":"https://link.springer.com/content/pdf/10.1007/978-3-030-05499-1_8.pdf","source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2908447766.pdf"},"referenced_works_count":15,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W1972556843","https://openalex.org/W2022158372","https://openalex.org/W2027812614","https://openalex.org/W2034851609","https://openalex.org/W2103329953","https://openalex.org/W2109925328","https://openalex.org/W2161969291","https://openalex.org/W2163352848","https://openalex.org/W2171181782","https://openalex.org/W2278458638","https://openalex.org/W2528999066","https://openalex.org/W2783235335","https://openalex.org/W2893844675","https://openalex.org/W2911964244"],"related_works":["https://openalex.org/W3037187668","https://openalex.org/W2397288865","https://openalex.org/W4234772502","https://openalex.org/W2368524271","https://openalex.org/W4247116873","https://openalex.org/W2576709312","https://openalex.org/W2023657818","https://openalex.org/W2977327189","https://openalex.org/W2017449983","https://openalex.org/W2340724640"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2026-03-11T06:11:40.159057","created_date":"2025-10-10T00:00:00"}