{"id":"https://openalex.org/W2901700683","doi":"https://doi.org/10.1007/978-3-030-04303-2_10","title":"Intelligent Monitoring of Transformer Insulation Using Convolutional Neural Networks","display_name":"Intelligent Monitoring of Transformer Insulation Using Convolutional Neural Networks","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2901700683","doi":"https://doi.org/10.1007/978-3-030-04303-2_10","mag":"2901700683"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-04303-2_10","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-04303-2_10","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052583897","display_name":"Wei Lee Woon","orcid":"https://orcid.org/0000-0002-6155-1741"},"institutions":[{"id":"https://openalex.org/I176601375","display_name":"Khalifa University of Science and Technology","ror":"https://ror.org/05hffr360","country_code":"AE","type":"education","lineage":["https://openalex.org/I176601375"]}],"countries":["AE"],"is_corresponding":true,"raw_author_name":"Wei Lee Woon","raw_affiliation_strings":["Department of Computer Science, Masdar Institute, Khalifa University of Science and Technology, P.O. Box 127788, Abu Dhabi, UAE","Masdar Institute (Khalifa University), Abu Dhabi, United Arab Emirates"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Masdar Institute, Khalifa University of Science and Technology, P.O. Box 127788, Abu Dhabi, UAE","institution_ids":["https://openalex.org/I176601375"]},{"raw_affiliation_string":"Masdar Institute (Khalifa University), Abu Dhabi, United Arab Emirates","institution_ids":["https://openalex.org/I176601375"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005863795","display_name":"Zeyar Aung","orcid":"https://orcid.org/0000-0001-5990-9305"},"institutions":[{"id":"https://openalex.org/I176601375","display_name":"Khalifa University of Science and Technology","ror":"https://ror.org/05hffr360","country_code":"AE","type":"education","lineage":["https://openalex.org/I176601375"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Zeyar Aung","raw_affiliation_strings":["Department of Computer Science, Masdar Institute, Khalifa University of Science and Technology, P.O. Box 127788, Abu Dhabi, UAE","Masdar Institute (Khalifa University), Abu Dhabi, United Arab Emirates"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Masdar Institute, Khalifa University of Science and Technology, P.O. Box 127788, Abu Dhabi, UAE","institution_ids":["https://openalex.org/I176601375"]},{"raw_affiliation_string":"Masdar Institute (Khalifa University), Abu Dhabi, United Arab Emirates","institution_ids":["https://openalex.org/I176601375"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078618705","display_name":"Ayman El\u2010Hag","orcid":"https://orcid.org/0000-0003-3270-5358"},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Ayman El-Hag","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Waterloo, 200 University Avenue West, Waterloo, ON, N2l 3G1, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Waterloo, 200 University Avenue West, Waterloo, ON, N2l 3G1, Canada","institution_ids":["https://openalex.org/I151746483"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5052583897"],"corresponding_institution_ids":["https://openalex.org/I176601375"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":3.311,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.92176871,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"127","last_page":"136"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8108921051025391},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.6918811202049255},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5966718196868896},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5716425776481628},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5472256541252136},{"id":"https://openalex.org/keywords/feature-engineering","display_name":"Feature engineering","score":0.5134254693984985},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.46855980157852173},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.45271408557891846},{"id":"https://openalex.org/keywords/feature-learning","display_name":"Feature learning","score":0.43579578399658203},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4343872666358948},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.4293195605278015},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4113260805606842},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11024758219718933},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10121038556098938}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8108921051025391},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.6918811202049255},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5966718196868896},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5716425776481628},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5472256541252136},{"id":"https://openalex.org/C2778827112","wikidata":"https://www.wikidata.org/wiki/Q22245680","display_name":"Feature engineering","level":3,"score":0.5134254693984985},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.46855980157852173},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.45271408557891846},{"id":"https://openalex.org/C59404180","wikidata":"https://www.wikidata.org/wiki/Q17013334","display_name":"Feature learning","level":2,"score":0.43579578399658203},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4343872666358948},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.4293195605278015},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4113260805606842},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11024758219718933},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10121038556098938},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-04303-2_10","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-04303-2_10","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8299999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1495427147","https://openalex.org/W1969701395","https://openalex.org/W2096620497","https://openalex.org/W2209859245","https://openalex.org/W2327160354","https://openalex.org/W2336207438","https://openalex.org/W2537070193","https://openalex.org/W2613161123","https://openalex.org/W2787894218","https://openalex.org/W4249913952"],"related_works":["https://openalex.org/W4398232961","https://openalex.org/W374694393","https://openalex.org/W3199964822","https://openalex.org/W4232132981","https://openalex.org/W4238046985","https://openalex.org/W3164948662","https://openalex.org/W4386223158","https://openalex.org/W4309346246","https://openalex.org/W3003242282","https://openalex.org/W3153597579"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}