{"id":"https://openalex.org/W2900711006","doi":"https://doi.org/10.1007/978-3-030-04272-1_13","title":"Transient Fault Detection and Recovery Mechanisms in \u03bcC/OS-II","display_name":"Transient Fault Detection and Recovery Mechanisms in \u03bcC/OS-II","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2900711006","doi":"https://doi.org/10.1007/978-3-030-04272-1_13","mag":"2900711006"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-04272-1_13","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-04272-1_13","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079161583","display_name":"Chengrui He","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengrui He","raw_affiliation_strings":["School of Software, Beihang University, Beijing, 100191, China","School of Software, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Software, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Software, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100425766","display_name":"Li Zhang","orcid":"https://orcid.org/0000-0003-3807-6556"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Zhang","raw_affiliation_strings":["School of Software, Beihang University, Beijing, 100191, China","School of Software, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Software, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Software, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100367484","display_name":"Gang Wang","orcid":"https://orcid.org/0009-0007-4891-2892"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gang Wang","raw_affiliation_strings":["School of Computer Science and Engineering, Beihang University, Beijing, 100191, China","School of Computer Science and Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Computer Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068450082","display_name":"Ziqi Zhen","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziqi Zhen","raw_affiliation_strings":["School of Computer Science and Engineering, Beihang University, Beijing, 100191, China","School of Computer Science and Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Computer Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100435749","display_name":"Lei Wang","orcid":"https://orcid.org/0000-0001-7380-3283"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lei Wang","raw_affiliation_strings":["School of Computer Science and Engineering, Beihang University, Beijing, 100191, China","School of Computer Science and Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Computer Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100435749"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19483375,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"202","last_page":"218"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7988922595977783},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.6705336570739746},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.652833878993988},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6405429840087891},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.5627433061599731},{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.5263330340385437},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5158857107162476},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4892585277557373},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4833047389984131},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4732540249824524},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4667902886867523},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4253504276275635},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4178307056427002},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4133254587650299},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2980753779411316},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2306329607963562},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.18154177069664001},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.17452988028526306},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.10125264525413513},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09694412350654602}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7988922595977783},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.6705336570739746},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.652833878993988},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6405429840087891},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.5627433061599731},{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.5263330340385437},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5158857107162476},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4892585277557373},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4833047389984131},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4732540249824524},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4667902886867523},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4253504276275635},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4178307056427002},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4133254587650299},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2980753779411316},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2306329607963562},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.18154177069664001},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.17452988028526306},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.10125264525413513},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09694412350654602},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-04272-1_13","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-04272-1_13","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1500767621","https://openalex.org/W1571177138","https://openalex.org/W1579817686","https://openalex.org/W1624374080","https://openalex.org/W1948378536","https://openalex.org/W1981514768","https://openalex.org/W2006217446","https://openalex.org/W2016220788","https://openalex.org/W2048751700","https://openalex.org/W2053815526","https://openalex.org/W2062807721","https://openalex.org/W2069786740","https://openalex.org/W2070933574","https://openalex.org/W2072474552","https://openalex.org/W2073515001","https://openalex.org/W2097418232","https://openalex.org/W2104189106","https://openalex.org/W2105364434","https://openalex.org/W2108643692","https://openalex.org/W2109079327","https://openalex.org/W2118407118","https://openalex.org/W2145930995","https://openalex.org/W2149100296","https://openalex.org/W2150267144","https://openalex.org/W2151677873","https://openalex.org/W2160410291","https://openalex.org/W2169596872","https://openalex.org/W2169992527","https://openalex.org/W2184407775","https://openalex.org/W2316133648","https://openalex.org/W2326698379","https://openalex.org/W2328215921","https://openalex.org/W2328440124","https://openalex.org/W2368550879","https://openalex.org/W2522822891","https://openalex.org/W2535178133","https://openalex.org/W2737207175","https://openalex.org/W4244078624","https://openalex.org/W6903781492"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2622269177","https://openalex.org/W1523508240","https://openalex.org/W2102538861","https://openalex.org/W2122334461","https://openalex.org/W2165400042","https://openalex.org/W2078707653","https://openalex.org/W2086616086","https://openalex.org/W4211237868","https://openalex.org/W1553526993"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}