{"id":"https://openalex.org/W2896309381","doi":"https://doi.org/10.1007/978-3-030-02450-5_27","title":"Model Based Testing of Cyber-Physical Systems","display_name":"Model Based Testing of Cyber-Physical Systems","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2896309381","doi":"https://doi.org/10.1007/978-3-030-02450-5_27","mag":"2896309381"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-02450-5_27","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-02450-5_27","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035558228","display_name":"Teck Ping Khoo","orcid":null},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Teck Ping Khoo","raw_affiliation_strings":["Singapore University of Technology and Design, Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"Singapore University of Technology and Design, Singapore, Singapore","institution_ids":["https://openalex.org/I152815399"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5035558228"],"corresponding_institution_ids":["https://openalex.org/I152815399"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.2534,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.78974359,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"423","last_page":"426"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7569781541824341},{"id":"https://openalex.org/keywords/interoperability","display_name":"Interoperability","score":0.7441359162330627},{"id":"https://openalex.org/keywords/certification","display_name":"Certification","score":0.7049121260643005},{"id":"https://openalex.org/keywords/model-based-testing","display_name":"Model-based testing","score":0.669204592704773},{"id":"https://openalex.org/keywords/cyber-physical-system","display_name":"Cyber-physical system","score":0.6507854461669922},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5195955634117126},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.5004227161407471},{"id":"https://openalex.org/keywords/conformance-testing","display_name":"Conformance testing","score":0.49273422360420227},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46632128953933716},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34120792150497437},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.33205991983413696},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.32111209630966187},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.2748093605041504},{"id":"https://openalex.org/keywords/standardization","display_name":"Standardization","score":0.24287176132202148},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.21544858813285828},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10855218768119812},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10174092650413513}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7569781541824341},{"id":"https://openalex.org/C20136886","wikidata":"https://www.wikidata.org/wiki/Q749647","display_name":"Interoperability","level":2,"score":0.7441359162330627},{"id":"https://openalex.org/C46304622","wikidata":"https://www.wikidata.org/wiki/Q374814","display_name":"Certification","level":2,"score":0.7049121260643005},{"id":"https://openalex.org/C165825675","wikidata":"https://www.wikidata.org/wiki/Q1399743","display_name":"Model-based testing","level":4,"score":0.669204592704773},{"id":"https://openalex.org/C179768478","wikidata":"https://www.wikidata.org/wiki/Q1120057","display_name":"Cyber-physical system","level":2,"score":0.6507854461669922},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5195955634117126},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.5004227161407471},{"id":"https://openalex.org/C76844732","wikidata":"https://www.wikidata.org/wiki/Q4072285","display_name":"Conformance testing","level":3,"score":0.49273422360420227},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46632128953933716},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34120792150497437},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.33205991983413696},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.32111209630966187},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.2748093605041504},{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.24287176132202148},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.21544858813285828},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10855218768119812},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10174092650413513},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-02450-5_27","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-02450-5_27","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1966061495","https://openalex.org/W1981433115","https://openalex.org/W1999393241","https://openalex.org/W2007206096","https://openalex.org/W2131131861","https://openalex.org/W3124769650"],"related_works":["https://openalex.org/W1696745455","https://openalex.org/W2087696154","https://openalex.org/W196322901","https://openalex.org/W1546012326","https://openalex.org/W2026287330","https://openalex.org/W1844021982","https://openalex.org/W1559390702","https://openalex.org/W1530540819","https://openalex.org/W1560641661","https://openalex.org/W2145505903"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}