{"id":"https://openalex.org/W2890339986","doi":"https://doi.org/10.1007/978-3-030-00015-8_26","title":"Fast Three-Phase Fabric Defect Detection","display_name":"Fast Three-Phase Fabric Defect Detection","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2890339986","doi":"https://doi.org/10.1007/978-3-030-00015-8_26","mag":"2890339986"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-030-00015-8_26","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-00015-8_26","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009585171","display_name":"Jielin Jiang","orcid":"https://orcid.org/0000-0002-7191-8674"},"institutions":[{"id":"https://openalex.org/I200845125","display_name":"Nanjing University of Information Science and Technology","ror":"https://ror.org/02y0rxk19","country_code":"CN","type":"education","lineage":["https://openalex.org/I200845125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jielin Jiang","raw_affiliation_strings":["School of Computer and Software, Jiangsu Engineering Center of Network Monitoring, Nanjing University of Information Science and Technology, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"School of Computer and Software, Jiangsu Engineering Center of Network Monitoring, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100783116","display_name":"Yan Cui","orcid":"https://orcid.org/0009-0003-5909-3299"},"institutions":[{"id":"https://openalex.org/I152031979","display_name":"Nanjing Normal University","ror":"https://ror.org/036trcv74","country_code":"CN","type":"education","lineage":["https://openalex.org/I152031979"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yan Cui","raw_affiliation_strings":["College of Mathematics and Information Science, Nanjing Normal University of Special Education, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Mathematics and Information Science, Nanjing Normal University of Special Education, Nanjing, China","institution_ids":["https://openalex.org/I152031979"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053171293","display_name":"Zilong Jin","orcid":"https://orcid.org/0000-0001-5608-7748"},"institutions":[{"id":"https://openalex.org/I200845125","display_name":"Nanjing University of Information Science and Technology","ror":"https://ror.org/02y0rxk19","country_code":"CN","type":"education","lineage":["https://openalex.org/I200845125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zilong Jin","raw_affiliation_strings":["School of Computer and Software, Jiangsu Engineering Center of Network Monitoring, Nanjing University of Information Science and Technology, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"School of Computer and Software, Jiangsu Engineering Center of Network Monitoring, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100602236","display_name":"Chunnian Fan","orcid":"https://orcid.org/0000-0002-3970-7594"},"institutions":[{"id":"https://openalex.org/I200845125","display_name":"Nanjing University of Information Science and Technology","ror":"https://ror.org/02y0rxk19","country_code":"CN","type":"education","lineage":["https://openalex.org/I200845125"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunnian Fan","raw_affiliation_strings":["School of Computer and Software, Jiangsu Engineering Center of Network Monitoring, Nanjing University of Information Science and Technology, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"School of Computer and Software, Jiangsu Engineering Center of Network Monitoring, Nanjing University of Information Science and Technology, Nanjing, China","institution_ids":["https://openalex.org/I200845125"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100783116"],"corresponding_institution_ids":["https://openalex.org/I152031979"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.1315,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.81065089,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"302","last_page":"312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8124173283576965},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4345843195915222},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05498224496841431}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8124173283576965},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4345843195915222},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05498224496841431},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-030-00015-8_26","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-030-00015-8_26","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1588043677","https://openalex.org/W1605442204","https://openalex.org/W1852849178","https://openalex.org/W1985563622","https://openalex.org/W1992117926","https://openalex.org/W1993954744","https://openalex.org/W2011406694","https://openalex.org/W2019483202","https://openalex.org/W2026313760","https://openalex.org/W2028555403","https://openalex.org/W2031821661","https://openalex.org/W2033548270","https://openalex.org/W2037951414","https://openalex.org/W2044465660","https://openalex.org/W2082233783","https://openalex.org/W2090421651","https://openalex.org/W2102669124","https://openalex.org/W2121166252","https://openalex.org/W2160547390","https://openalex.org/W2162241465","https://openalex.org/W2169029660","https://openalex.org/W2893844675"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2093578348","https://openalex.org/W2376932109","https://openalex.org/W2382290278","https://openalex.org/W2049775471","https://openalex.org/W2350741829","https://openalex.org/W3004735627"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}