{"id":"https://openalex.org/W158292190","doi":"https://doi.org/10.1007/978-1-4419-7418-1_3","title":"Effect of Variations and Variation Tolerance in Logic Circuits","display_name":"Effect of Variations and Variation Tolerance in Logic Circuits","publication_year":2010,"publication_date":"2010-10-25","ids":{"openalex":"https://openalex.org/W158292190","doi":"https://doi.org/10.1007/978-1-4419-7418-1_3","mag":"158292190"},"language":"en","primary_location":{"id":"doi:10.1007/978-1-4419-7418-1_3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-1-4419-7418-1_3","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Low-Power Variation-Tolerant Design in Nanometer Silicon","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085567454","display_name":"Swaroop Ghosh","orcid":"https://orcid.org/0000-0001-8753-490X"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Swaroop Ghosh","raw_affiliation_strings":["Intel Corporation, Portland, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Portland, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5085567454"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0606745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"83","last_page":"108"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.7154865264892578},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5974478125572205},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.554029643535614},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5017354488372803},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46973666548728943},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.4641408324241638},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.42424917221069336},{"id":"https://openalex.org/keywords/pass-transistor-logic","display_name":"Pass transistor logic","score":0.4201302230358124},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.4200105667114258},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4118198752403259},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4086650609970093},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3416964113712311},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.34087035059928894},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3056831657886505},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1300625503063202}],"concepts":[{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.7154865264892578},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5974478125572205},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.554029643535614},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5017354488372803},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46973666548728943},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.4641408324241638},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.42424917221069336},{"id":"https://openalex.org/C198521697","wikidata":"https://www.wikidata.org/wiki/Q7142438","display_name":"Pass transistor logic","level":4,"score":0.4201302230358124},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.4200105667114258},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4118198752403259},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4086650609970093},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3416964113712311},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.34087035059928894},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3056831657886505},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1300625503063202},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-1-4419-7418-1_3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-1-4419-7418-1_3","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Low-Power Variation-Tolerant Design in Nanometer Silicon","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":119,"referenced_works":["https://openalex.org/W65564217","https://openalex.org/W973491057","https://openalex.org/W1498071943","https://openalex.org/W1527137186","https://openalex.org/W1538951169","https://openalex.org/W1555014838","https://openalex.org/W1600691640","https://openalex.org/W1661368752","https://openalex.org/W1966741973","https://openalex.org/W1967709031","https://openalex.org/W1970806136","https://openalex.org/W1972949192","https://openalex.org/W1979183030","https://openalex.org/W1979184985","https://openalex.org/W1981374083","https://openalex.org/W1986056825","https://openalex.org/W1991431227","https://openalex.org/W1992129270","https://openalex.org/W1998200478","https://openalex.org/W2006589289","https://openalex.org/W2013505240","https://openalex.org/W2035894108","https://openalex.org/W2035925997","https://openalex.org/W2038840127","https://openalex.org/W2042352336","https://openalex.org/W2043318181","https://openalex.org/W2046465070","https://openalex.org/W2046737467","https://openalex.org/W2051973459","https://openalex.org/W2052501105","https://openalex.org/W2055298964","https://openalex.org/W2057955128","https://openalex.org/W2066698193","https://openalex.org/W2098040113","https://openalex.org/W2099679924","https://openalex.org/W2100379261","https://openalex.org/W2100890870","https://openalex.org/W2101301454","https://openalex.org/W2101686625","https://openalex.org/W2104363718","https://openalex.org/W2104677471","https://openalex.org/W2105102111","https://openalex.org/W2106236629","https://openalex.org/W2107919924","https://openalex.org/W2108498028","https://openalex.org/W2109551271","https://openalex.org/W2112414127","https://openalex.org/W2112870827","https://openalex.org/W2113115586","https://openalex.org/W2114344835","https://openalex.org/W2116359224","https://openalex.org/W2117076170","https://openalex.org/W2117648153","https://openalex.org/W2117656819","https://openalex.org/W2118260076","https://openalex.org/W2118955652","https://openalex.org/W2120802493","https://openalex.org/W2121319784","https://openalex.org/W2121536510","https://openalex.org/W2122421989","https://openalex.org/W2125456413","https://openalex.org/W2125892790","https://openalex.org/W2126835634","https://openalex.org/W2127036509","https://openalex.org/W2127877371","https://openalex.org/W2128090256","https://openalex.org/W2129960401","https://openalex.org/W2131742416","https://openalex.org/W2131909792","https://openalex.org/W2132438916","https://openalex.org/W2135682921","https://openalex.org/W2136103183","https://openalex.org/W2136403269","https://openalex.org/W2136586884","https://openalex.org/W2137509664","https://openalex.org/W2139344695","https://openalex.org/W2140839100","https://openalex.org/W2141565132","https://openalex.org/W2141907973","https://openalex.org/W2142726556","https://openalex.org/W2142787660","https://openalex.org/W2142908374","https://openalex.org/W2143901474","https://openalex.org/W2149447807","https://openalex.org/W2149866574","https://openalex.org/W2150375993","https://openalex.org/W2151802820","https://openalex.org/W2156064231","https://openalex.org/W2156691787","https://openalex.org/W2157210245","https://openalex.org/W2158705165","https://openalex.org/W2158955861","https://openalex.org/W2159874000","https://openalex.org/W2161648718","https://openalex.org/W2164178706","https://openalex.org/W2167678606","https://openalex.org/W2168101540","https://openalex.org/W2168713471","https://openalex.org/W2172181553","https://openalex.org/W2174801549","https://openalex.org/W2178304595","https://openalex.org/W2197932458","https://openalex.org/W3142888977","https://openalex.org/W3143610959","https://openalex.org/W3144669234","https://openalex.org/W3145424647","https://openalex.org/W3147111312","https://openalex.org/W3152061493","https://openalex.org/W4231119589","https://openalex.org/W4233418229","https://openalex.org/W4236432903","https://openalex.org/W4237900519","https://openalex.org/W4238868554","https://openalex.org/W4243727935","https://openalex.org/W4245518849","https://openalex.org/W4253934962","https://openalex.org/W4254774981","https://openalex.org/W4254813888","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2145801698","https://openalex.org/W2588941787","https://openalex.org/W1968762246","https://openalex.org/W2132796854","https://openalex.org/W1599902002","https://openalex.org/W2079245511","https://openalex.org/W2055691299","https://openalex.org/W2584544613","https://openalex.org/W1983471457","https://openalex.org/W1973928325"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}