{"id":"https://openalex.org/W1590132460","doi":"https://doi.org/10.1007/978-0-387-73661-7_17","title":"Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles","display_name":"Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles","publication_year":2007,"publication_date":"2007-09-11","ids":{"openalex":"https://openalex.org/W1590132460","doi":"https://doi.org/10.1007/978-0-387-73661-7_17","mag":"1590132460"},"language":"en","primary_location":{"id":"doi:10.1007/978-0-387-73661-7_17","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-0-387-73661-7_17","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP International Federation for Information Proc","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00194261","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072882870","display_name":"N. Badereddine","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"N. Badereddine","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","Universit\u00e9 de Montpellier II / CNRS"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Universit\u00e9 de Montpellier II / CNRS","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Girard","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","Universit\u00e9 de Montpellier II / CNRS"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Universit\u00e9 de Montpellier II / CNRS","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032771604","display_name":"S. Pravossoudovitch","orcid":null},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Pravossoudovitch","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","Universit\u00e9 de Montpellier II / CNRS"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Universit\u00e9 de Montpellier II / CNRS","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089236739","display_name":"A. Virazel","orcid":"https://orcid.org/0000-0001-7398-7107"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Virazel","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","Universit\u00e9 de Montpellier II / CNRS"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Universit\u00e9 de Montpellier II / CNRS","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025395912","display_name":"C. Landrault","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Landrault","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","Universit\u00e9 de Montpellier II / CNRS"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpel, Universit\u00e9 de Montpellier II / CNRS, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Universit\u00e9 de Montpellier II / CNRS","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5072882870"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":1.9956,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.86394052,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"267","last_page":"281"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6905032396316528},{"id":"https://openalex.org/keywords/simulated-annealing","display_name":"Simulated annealing","score":0.6690148115158081},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6193469166755676},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5885012149810791},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5015718936920166},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.47500789165496826},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4744452238082886},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.46742600202560425},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.45858997106552124},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.44953233003616333},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.42597782611846924},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.40581226348876953},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.36762097477912903},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3662567436695099},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2625008821487427},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21153229475021362},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15345126390457153},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07553267478942871}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6905032396316528},{"id":"https://openalex.org/C126980161","wikidata":"https://www.wikidata.org/wiki/Q863783","display_name":"Simulated annealing","level":2,"score":0.6690148115158081},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6193469166755676},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5885012149810791},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5015718936920166},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.47500789165496826},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4744452238082886},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.46742600202560425},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.45858997106552124},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.44953233003616333},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.42597782611846924},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.40581226348876953},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.36762097477912903},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3662567436695099},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2625008821487427},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21153229475021362},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15345126390457153},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07553267478942871},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/978-0-387-73661-7_17","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-0-387-73661-7_17","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IFIP International Federation for Information Proc","raw_type":"book-chapter"},{"id":"pmh:oai:HAL:lirmm-00194261v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00194261","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"VLSI-Soc: From Systems to Silicon, pp.267-281, 2007, 978-0-387-73661-7","raw_type":"Book sections"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-00194261v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00194261","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"VLSI-Soc: From Systems to Silicon, pp.267-281, 2007, 978-0-387-73661-7","raw_type":"Book sections"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.44999998807907104}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1496730449","https://openalex.org/W1528223898","https://openalex.org/W1557977552","https://openalex.org/W1559215823","https://openalex.org/W1568407911","https://openalex.org/W1767514545","https://openalex.org/W1820769975","https://openalex.org/W1825637665","https://openalex.org/W1862469596","https://openalex.org/W2024060531","https://openalex.org/W2106303764","https://openalex.org/W2119691242","https://openalex.org/W2160621850"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W2789883751","https://openalex.org/W2075356617","https://openalex.org/W2408214455","https://openalex.org/W2019719714","https://openalex.org/W2364150359","https://openalex.org/W2154529098","https://openalex.org/W2156546262","https://openalex.org/W2140015776"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}