{"id":"https://openalex.org/W22896613","doi":"https://doi.org/10.1007/978-0-387-73137-7_31","title":"Design and Prototyping of an Industrial Fault Clustering System Combining Image Processing and Artificial Neural Network Based Approaches","display_name":"Design and Prototyping of an Industrial Fault Clustering System Combining Image Processing and Artificial Neural Network Based Approaches","publication_year":2007,"publication_date":"2007-09-28","ids":{"openalex":"https://openalex.org/W22896613","doi":"https://doi.org/10.1007/978-0-387-73137-7_31","mag":"22896613"},"language":"en","primary_location":{"id":"doi:10.1007/978-0-387-73137-7_31","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-0-387-73137-7_31","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Information Processing and Protection","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024892882","display_name":"Matthieu Voiry","orcid":null},"institutions":[{"id":"https://openalex.org/I2800365227","display_name":"Paris-Est Sup","ror":"https://ror.org/0268ecp52","country_code":"FR","type":"education","lineage":["https://openalex.org/I2800365227"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Matthieu Voiry","raw_affiliation_strings":["Images, Signals, and Intelligent System Laboratory, (LISSI / EA 3956), Paris-XII-Val de Marne University, Senart Institute of Technology, Avenue Pierre Point, Lieusaint, 77127, France","SAGEM REOSC, Avenue de la Tour Maury, Saint Pierre du Perray, 91280, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Images, Signals, and Intelligent System Laboratory, (LISSI / EA 3956), Paris-XII-Val de Marne University, Senart Institute of Technology, Avenue Pierre Point, Lieusaint, 77127, France","institution_ids":["https://openalex.org/I2800365227"]},{"raw_affiliation_string":"SAGEM REOSC, Avenue de la Tour Maury, Saint Pierre du Perray, 91280, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103352331","display_name":"V\u00e9ronique Amarger","orcid":null},"institutions":[{"id":"https://openalex.org/I2800365227","display_name":"Paris-Est Sup","ror":"https://ror.org/0268ecp52","country_code":"FR","type":"education","lineage":["https://openalex.org/I2800365227"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"V\u00e9ronique Amarger","raw_affiliation_strings":["Images, Signals, and Intelligent System Laboratory, (LISSI / EA 3956), Paris-XII-Val de Marne University, Senart Institute of Technology, Avenue Pierre Point, Lieusaint, 77127, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Images, Signals, and Intelligent System Laboratory, (LISSI / EA 3956), Paris-XII-Val de Marne University, Senart Institute of Technology, Avenue Pierre Point, Lieusaint, 77127, France","institution_ids":["https://openalex.org/I2800365227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074887428","display_name":"Kurosh Madani","orcid":"https://orcid.org/0000-0002-1749-9122"},"institutions":[{"id":"https://openalex.org/I2800365227","display_name":"Paris-Est Sup","ror":"https://ror.org/0268ecp52","country_code":"FR","type":"education","lineage":["https://openalex.org/I2800365227"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Kurosh Madani","raw_affiliation_strings":["Images, Signals, and Intelligent System Laboratory, (LISSI / EA 3956), Paris-XII-Val de Marne University, Senart Institute of Technology, Avenue Pierre Point, Lieusaint, 77127, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Images, Signals, and Intelligent System Laboratory, (LISSI / EA 3956), Paris-XII-Val de Marne University, Senart Institute of Technology, Avenue Pierre Point, Lieusaint, 77127, France","institution_ids":["https://openalex.org/I2800365227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013906288","display_name":"Fran\u00e7ois Houbre","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fran\u00e7ois Houbre","raw_affiliation_strings":["SAGEM REOSC, Avenue de la Tour Maury, Saint Pierre du Perray, 91280, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SAGEM REOSC, Avenue de la Tour Maury, Saint Pierre du Perray, 91280, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.00473,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"351","last_page":"360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.97079998254776,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6763763427734375},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6576352715492249},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6525322794914246},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.6520081758499146},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5488083362579346},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.5319020748138428},{"id":"https://openalex.org/keywords/rapid-prototyping","display_name":"Rapid prototyping","score":0.5261691808700562},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5026769638061523},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4416285753250122},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.400784432888031},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3395046591758728},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22993972897529602}],"concepts":[{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6763763427734375},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6576352715492249},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6525322794914246},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.6520081758499146},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5488083362579346},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.5319020748138428},{"id":"https://openalex.org/C2780395129","wikidata":"https://www.wikidata.org/wiki/Q1128971","display_name":"Rapid prototyping","level":2,"score":0.5261691808700562},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5026769638061523},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4416285753250122},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.400784432888031},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3395046591758728},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22993972897529602},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-0-387-73137-7_31","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-0-387-73137-7_31","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in Information Processing and Protection","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W99225746","https://openalex.org/W623647263","https://openalex.org/W1679913846","https://openalex.org/W1984990385","https://openalex.org/W1988263087","https://openalex.org/W1988299413","https://openalex.org/W2046282429","https://openalex.org/W2046401020","https://openalex.org/W2170198760","https://openalex.org/W2171209182","https://openalex.org/W2503285126","https://openalex.org/W2776478051","https://openalex.org/W4245176872","https://openalex.org/W4253819336"],"related_works":["https://openalex.org/W2804364458","https://openalex.org/W4298130764","https://openalex.org/W2132641928","https://openalex.org/W2090259340","https://openalex.org/W4310225030","https://openalex.org/W2083665254","https://openalex.org/W2393816671","https://openalex.org/W1534720161","https://openalex.org/W2804957450","https://openalex.org/W2942177010"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}