{"id":"https://openalex.org/W1504998316","doi":"https://doi.org/10.1007/3-540-61730-2_43","title":"Metastability characteristics testing for programmable logic design","display_name":"Metastability characteristics testing for programmable logic design","publication_year":1996,"publication_date":"1996-01-01","ids":{"openalex":"https://openalex.org/W1504998316","doi":"https://doi.org/10.1007/3-540-61730-2_43","mag":"1504998316"},"language":"en","primary_location":{"id":"doi:10.1007/3-540-61730-2_43","is_oa":false,"landing_page_url":"https://doi.org/10.1007/3-540-61730-2_43","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053718614","display_name":"Branka Medved Rogina","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123216","display_name":"Rudjer Boskovic Institute","ror":"https://ror.org/02mw21745","country_code":"HR","type":"facility","lineage":["https://openalex.org/I4210123216"]}],"countries":["HR"],"is_corresponding":true,"raw_author_name":"Branka Medved Rogina","raw_affiliation_strings":["Ru\u0111er Bo\u0161kovi\u0107 Institute, Bijeni\u010dka 54, 10000, Zagreb, Croatia","Ru\u0111er Bo\u0161kovi\u0107 Institute"],"affiliations":[{"raw_affiliation_string":"Ru\u0111er Bo\u0161kovi\u0107 Institute, Bijeni\u010dka 54, 10000, Zagreb, Croatia","institution_ids":["https://openalex.org/I4210123216"]},{"raw_affiliation_string":"Ru\u0111er Bo\u0161kovi\u0107 Institute","institution_ids":["https://openalex.org/I4210123216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060739808","display_name":"Karolj Skala","orcid":"https://orcid.org/0000-0003-3325-2119"},"institutions":[{"id":"https://openalex.org/I4210123216","display_name":"Rudjer Boskovic Institute","ror":"https://ror.org/02mw21745","country_code":"HR","type":"facility","lineage":["https://openalex.org/I4210123216"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Karolj Skala","raw_affiliation_strings":["Ru\u0111er Bo\u0161kovi\u0107 Institute, Bijeni\u010dka 54, 10000, Zagreb, Croatia","Ru\u0111er Bo\u0161kovi\u0107 Institute"],"affiliations":[{"raw_affiliation_string":"Ru\u0111er Bo\u0161kovi\u0107 Institute, Bijeni\u010dka 54, 10000, Zagreb, Croatia","institution_ids":["https://openalex.org/I4210123216"]},{"raw_affiliation_string":"Ru\u0111er Bo\u0161kovi\u0107 Institute","institution_ids":["https://openalex.org/I4210123216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014351837","display_name":"Bo\u017eidar Vojnovi\u0107","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123216","display_name":"Rudjer Boskovic Institute","ror":"https://ror.org/02mw21745","country_code":"HR","type":"facility","lineage":["https://openalex.org/I4210123216"]}],"countries":["HR"],"is_corresponding":false,"raw_author_name":"Bo\u017eidar Vojnovi\u0107","raw_affiliation_strings":["Ru\u0111er Bo\u0161kovi\u0107 Institute, Bijeni\u010dka 54, 10000, Zagreb, Croatia","Ru\u0111er Bo\u0161kovi\u0107 Institute"],"affiliations":[{"raw_affiliation_string":"Ru\u0111er Bo\u0161kovi\u0107 Institute, Bijeni\u010dka 54, 10000, Zagreb, Croatia","institution_ids":["https://openalex.org/I4210123216"]},{"raw_affiliation_string":"Ru\u0111er Bo\u0161kovi\u0107 Institute","institution_ids":["https://openalex.org/I4210123216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5053718614"],"corresponding_institution_ids":["https://openalex.org/I4210123216"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.9709,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.84507591,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"381","last_page":"388"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.8544298410415649},{"id":"https://openalex.org/keywords/metastability","display_name":"Metastability","score":0.752526044845581},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7170217037200928},{"id":"https://openalex.org/keywords/programmable-logic-device","display_name":"Programmable logic device","score":0.5738584399223328},{"id":"https://openalex.org/keywords/bistability","display_name":"Bistability","score":0.5497820377349854},{"id":"https://openalex.org/keywords/logic-synthesis","display_name":"Logic synthesis","score":0.5210779905319214},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5140910744667053},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.495569109916687},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.4431118369102478},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42714792490005493},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3700112998485565},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3078137934207916},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2983434498310089},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1777142882347107},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.16492465138435364},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1537117063999176},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12458375096321106},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.12057343125343323}],"concepts":[{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.8544298410415649},{"id":"https://openalex.org/C89464430","wikidata":"https://www.wikidata.org/wiki/Q849516","display_name":"Metastability","level":2,"score":0.752526044845581},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7170217037200928},{"id":"https://openalex.org/C206274596","wikidata":"https://www.wikidata.org/wiki/Q1063837","display_name":"Programmable logic device","level":2,"score":0.5738584399223328},{"id":"https://openalex.org/C97292510","wikidata":"https://www.wikidata.org/wiki/Q2304620","display_name":"Bistability","level":2,"score":0.5497820377349854},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.5210779905319214},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5140910744667053},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.495569109916687},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.4431118369102478},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42714792490005493},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3700112998485565},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3078137934207916},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2983434498310089},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1777142882347107},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.16492465138435364},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1537117063999176},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12458375096321106},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.12057343125343323},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/3-540-61730-2_43","is_oa":false,"landing_page_url":"https://doi.org/10.1007/3-540-61730-2_43","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"display_name":"Life in Land","id":"https://metadata.un.org/sdg/15"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1600643888","https://openalex.org/W1955859602","https://openalex.org/W2012155933","https://openalex.org/W2036460278","https://openalex.org/W2057082489","https://openalex.org/W2121168480","https://openalex.org/W2266982353","https://openalex.org/W2419076439","https://openalex.org/W3203560114"],"related_works":["https://openalex.org/W3105918491","https://openalex.org/W2147419146","https://openalex.org/W2386022279","https://openalex.org/W2135636985","https://openalex.org/W2101877870","https://openalex.org/W2108229542","https://openalex.org/W2197466303","https://openalex.org/W1607849496","https://openalex.org/W3148292035","https://openalex.org/W2462231960"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-01-15T23:16:33.117629","created_date":"2025-10-10T00:00:00"}