{"id":"https://openalex.org/W1492515827","doi":"https://doi.org/10.1007/3-540-45798-4_14","title":"Software Reliability and Rejuvenation: Modeling and Analysis","display_name":"Software Reliability and Rejuvenation: Modeling and Analysis","publication_year":2002,"publication_date":"2002-01-01","ids":{"openalex":"https://openalex.org/W1492515827","doi":"https://doi.org/10.1007/3-540-45798-4_14","mag":"1492515827"},"language":"en","primary_location":{"id":"doi:10.1007/3-540-45798-4_14","is_oa":true,"landing_page_url":"https://doi.org/10.1007/3-540-45798-4_14","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F3-540-45798-4_14.pdf","source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://link.springer.com/content/pdf/10.1007%2F3-540-45798-4_14.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036851432","display_name":"Kishor S. Trivedi","orcid":"https://orcid.org/0000-0001-7396-6330"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kishor S. Trivedi","raw_affiliation_strings":["Dept. of Electrical & Computer Engineering, Duke University, Durham, USA","Duke University"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical & Computer Engineering, Duke University, Durham, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Duke University","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111465617","display_name":"Kalyanaraman Vaidyanathan","orcid":null},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kalyanaraman Vaidyanathan","raw_affiliation_strings":["Dept. of Electrical & Computer Engineering, Duke University, Durham, USA","Duke University"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical & Computer Engineering, Duke University, Durham, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Duke University","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5036851432"],"corresponding_institution_ids":["https://openalex.org/I170897317"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.2811,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.60537241,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"318","last_page":"345"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6616269946098328},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6454154253005981},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.6233155131340027},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.6110739707946777},{"id":"https://openalex.org/keywords/software-maintenance","display_name":"Software maintenance","score":0.5924015641212463},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.5796599984169006},{"id":"https://openalex.org/keywords/software-sizing","display_name":"Software sizing","score":0.5324740409851074},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5257171988487244},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.5168595910072327},{"id":"https://openalex.org/keywords/software-metric","display_name":"Software metric","score":0.5162458419799805},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5027737617492676},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4697437882423401},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4513520300388336},{"id":"https://openalex.org/keywords/verification-and-validation","display_name":"Verification and validation","score":0.4445461630821228},{"id":"https://openalex.org/keywords/rejuvenation","display_name":"Rejuvenation","score":0.43264734745025635},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.42582112550735474},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.3646794557571411},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21560192108154297},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.17952901124954224}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6616269946098328},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6454154253005981},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.6233155131340027},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.6110739707946777},{"id":"https://openalex.org/C101317890","wikidata":"https://www.wikidata.org/wiki/Q940053","display_name":"Software maintenance","level":4,"score":0.5924015641212463},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.5796599984169006},{"id":"https://openalex.org/C201515116","wikidata":"https://www.wikidata.org/wiki/Q7554363","display_name":"Software sizing","level":5,"score":0.5324740409851074},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5257171988487244},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.5168595910072327},{"id":"https://openalex.org/C82214349","wikidata":"https://www.wikidata.org/wiki/Q657339","display_name":"Software metric","level":5,"score":0.5162458419799805},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5027737617492676},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4697437882423401},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4513520300388336},{"id":"https://openalex.org/C48002344","wikidata":"https://www.wikidata.org/wiki/Q2919644","display_name":"Verification and validation","level":2,"score":0.4445461630821228},{"id":"https://openalex.org/C112224295","wikidata":"https://www.wikidata.org/wiki/Q2297001","display_name":"Rejuvenation","level":2,"score":0.43264734745025635},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.42582112550735474},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.3646794557571411},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21560192108154297},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.17952901124954224},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C74909509","wikidata":"https://www.wikidata.org/wiki/Q10387","display_name":"Gerontology","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/3-540-45798-4_14","is_oa":true,"landing_page_url":"https://doi.org/10.1007/3-540-45798-4_14","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F3-540-45798-4_14.pdf","source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":{"id":"doi:10.1007/3-540-45798-4_14","is_oa":true,"landing_page_url":"https://doi.org/10.1007/3-540-45798-4_14","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F3-540-45798-4_14.pdf","source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1492515827.pdf","grobid_xml":"https://content.openalex.org/works/W1492515827.grobid-xml"},"referenced_works_count":49,"referenced_works":["https://openalex.org/W51211239","https://openalex.org/W202200800","https://openalex.org/W1486034269","https://openalex.org/W1500893261","https://openalex.org/W1513764144","https://openalex.org/W1523509419","https://openalex.org/W1524620946","https://openalex.org/W1587236616","https://openalex.org/W1821730155","https://openalex.org/W1874259713","https://openalex.org/W1893433911","https://openalex.org/W1951687984","https://openalex.org/W1969657871","https://openalex.org/W1979868167","https://openalex.org/W1992580876","https://openalex.org/W1996989781","https://openalex.org/W1999667809","https://openalex.org/W2006075444","https://openalex.org/W2014122495","https://openalex.org/W2019646169","https://openalex.org/W2055631879","https://openalex.org/W2066660519","https://openalex.org/W2067182386","https://openalex.org/W2070215238","https://openalex.org/W2079729471","https://openalex.org/W2107038128","https://openalex.org/W2107863205","https://openalex.org/W2109192777","https://openalex.org/W2119239145","https://openalex.org/W2124731241","https://openalex.org/W2144984544","https://openalex.org/W2149629982","https://openalex.org/W2149803257","https://openalex.org/W2151793631","https://openalex.org/W2156138095","https://openalex.org/W2156205360","https://openalex.org/W2160381742","https://openalex.org/W2169246841","https://openalex.org/W2185757956","https://openalex.org/W2273779226","https://openalex.org/W2799087070","https://openalex.org/W2913066018","https://openalex.org/W2987457134","https://openalex.org/W4210616753","https://openalex.org/W4250489070","https://openalex.org/W4255469293","https://openalex.org/W6638337804","https://openalex.org/W6698813454","https://openalex.org/W6750481014"],"related_works":["https://openalex.org/W3016442572","https://openalex.org/W2552613587","https://openalex.org/W2560424246","https://openalex.org/W2068483578","https://openalex.org/W2099880542","https://openalex.org/W2021760171","https://openalex.org/W2182881874","https://openalex.org/W4312718078","https://openalex.org/W56970666","https://openalex.org/W1492515827"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}