{"id":"https://openalex.org/W2107683532","doi":"https://doi.org/10.1007/3-540-44989-2_76","title":"Adaptive Stochastic Classifier for Noisy pH-ISFET Measurements","display_name":"Adaptive Stochastic Classifier for Noisy pH-ISFET Measurements","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2107683532","doi":"https://doi.org/10.1007/3-540-44989-2_76","mag":"2107683532"},"language":"en","primary_location":{"id":"doi:10.1007/3-540-44989-2_76","is_oa":false,"landing_page_url":"https://doi.org/10.1007/3-540-44989-2_76","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034034713","display_name":"Tong Boon Tang","orcid":"https://orcid.org/0000-0002-5721-6828"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Tong Boon Tang","raw_affiliation_strings":["School of Engineering and Electronics, The University of Edinburgh, Edinburgh, EH9 3JL, UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering and Electronics, The University of Edinburgh, Edinburgh, EH9 3JL, UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112447815","display_name":"Hsin Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Hsin Chen","raw_affiliation_strings":["School of Engineering and Electronics, The University of Edinburgh, Edinburgh, EH9 3JL, UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering and Electronics, The University of Edinburgh, Edinburgh, EH9 3JL, UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5105524416","display_name":"Alan F. Murray","orcid":null},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Alan F. Murray","raw_affiliation_strings":["School of Engineering and Electronics, The University of Edinburgh, Edinburgh, EH9 3JL, UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering and Electronics, The University of Edinburgh, Edinburgh, EH9 3JL, UK","institution_ids":["https://openalex.org/I98677209"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5034034713"],"corresponding_institution_ids":["https://openalex.org/I98677209"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":3.7544,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.94339623,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"638","last_page":"645"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/isfet","display_name":"ISFET","score":0.911725640296936},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.753450870513916},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.625531017780304},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5329087376594543},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.4237763285636902},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.33166512846946716},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.23544472455978394},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11789208650588989},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0938049852848053},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.07943233847618103}],"concepts":[{"id":"https://openalex.org/C154275363","wikidata":"https://www.wikidata.org/wiki/Q904133","display_name":"ISFET","level":5,"score":0.911725640296936},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.753450870513916},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.625531017780304},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5329087376594543},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.4237763285636902},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.33166512846946716},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.23544472455978394},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11789208650588989},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0938049852848053},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.07943233847618103},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/3-540-44989-2_76","is_oa":false,"landing_page_url":"https://doi.org/10.1007/3-540-44989-2_76","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1566070243","https://openalex.org/W1570415379","https://openalex.org/W1813659000","https://openalex.org/W1924339273","https://openalex.org/W2072931302","https://openalex.org/W2085779969","https://openalex.org/W2116064496","https://openalex.org/W2130313186","https://openalex.org/W2134473801","https://openalex.org/W2153418329","https://openalex.org/W3207342693"],"related_works":["https://openalex.org/W1538524231","https://openalex.org/W289198894","https://openalex.org/W2791209250","https://openalex.org/W4210319942","https://openalex.org/W4240238736","https://openalex.org/W4310534299","https://openalex.org/W1536484730","https://openalex.org/W2033914206","https://openalex.org/W2042327336","https://openalex.org/W2049864679"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}