{"id":"https://openalex.org/W1851577554","doi":"https://doi.org/10.1007/3-540-44843-8_72","title":"A Study on Insuring the Full Reliability of Finite State Machine","display_name":"A Study on Insuring the Full Reliability of Finite State Machine","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W1851577554","doi":"https://doi.org/10.1007/3-540-44843-8_72","mag":"1851577554"},"language":"en","primary_location":{"id":"doi:10.1007/3-540-44843-8_72","is_oa":false,"landing_page_url":"https://doi.org/10.1007/3-540-44843-8_72","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100507718","display_name":"Sun-Woong Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sunwoong Yang","raw_affiliation_strings":["Department of Computing, Graduate School, Soongsil University, 1-1, Sangdo-5Dong, Dongjak-Ku, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computing, Graduate School, Soongsil University, 1-1, Sangdo-5Dong, Dongjak-Ku, Seoul, Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031555243","display_name":"MoonJoon Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"MoonJoon Kim","raw_affiliation_strings":["Department of Computing, Graduate School, Soongsil University, 1-1, Sangdo-5Dong, Dongjak-Ku, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computing, Graduate School, Soongsil University, 1-1, Sangdo-5Dong, Dongjak-Ku, Seoul, Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031070386","display_name":"Jaeheung Park","orcid":"https://orcid.org/0000-0002-5062-8264"},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"JaeHeung Park","raw_affiliation_strings":["Department of Computing, Graduate School, Soongsil University, 1-1, Sangdo-5Dong, Dongjak-Ku, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computing, Graduate School, Soongsil University, 1-1, Sangdo-5Dong, Dongjak-Ku, Seoul, Korea","institution_ids":["https://openalex.org/I141371507"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109438440","display_name":"Hoon Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I141371507","display_name":"Soongsil University","ror":"https://ror.org/017xnm587","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoon Chang","raw_affiliation_strings":["School of Computing, Soongsil University, 1-1, Sangdo-5Dong, Dongjak-Ku, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"School of Computing, Soongsil University, 1-1, Sangdo-5Dong, Dongjak-Ku, Seoul, Korea","institution_ids":["https://openalex.org/I141371507"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100507718"],"corresponding_institution_ids":["https://openalex.org/I141371507"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.7891,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.69746193,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":"3","first_page":"656","last_page":"663"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/finite-state-machine","display_name":"Finite-state machine","score":0.8122933506965637},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7897856831550598},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7410107254981995},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6608818769454956},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6521992087364197},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6113253235816956},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5807166695594788},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.5405153036117554},{"id":"https://openalex.org/keywords/extended-finite-state-machine","display_name":"Extended finite-state machine","score":0.5014474391937256},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4861442744731903},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4781516492366791},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.4744628071784973},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4549235701560974},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4131571054458618},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.39961257576942444},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3788982331752777},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3488112688064575},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3372683525085449},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.25506073236465454},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09351891279220581},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09148144721984863},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07027164101600647}],"concepts":[{"id":"https://openalex.org/C167822520","wikidata":"https://www.wikidata.org/wiki/Q176452","display_name":"Finite-state machine","level":2,"score":0.8122933506965637},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7897856831550598},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7410107254981995},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6608818769454956},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6521992087364197},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6113253235816956},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5807166695594788},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.5405153036117554},{"id":"https://openalex.org/C181062253","wikidata":"https://www.wikidata.org/wiki/Q5421886","display_name":"Extended finite-state machine","level":3,"score":0.5014474391937256},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4861442744731903},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4781516492366791},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.4744628071784973},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4549235701560974},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4131571054458618},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.39961257576942444},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3788982331752777},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3488112688064575},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3372683525085449},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.25506073236465454},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09351891279220581},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09148144721984863},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07027164101600647},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/3-540-44843-8_72","is_oa":false,"landing_page_url":"https://doi.org/10.1007/3-540-44843-8_72","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"mag:1538649559","is_oa":false,"landing_page_url":"http://www.jics.or.kr/journals/jics/digital-library/183","pdf_url":null,"source":{"id":"https://openalex.org/S4306515680","display_name":"Journal of Internet Computing and services","issn_l":"1598-0170","issn":["1598-0170","2287-1136"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"Journal of Internet Computing and services","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W615030097","https://openalex.org/W1483338234","https://openalex.org/W1855007419","https://openalex.org/W1997565760","https://openalex.org/W2085249459","https://openalex.org/W2106571261","https://openalex.org/W2131395796","https://openalex.org/W2160753176","https://openalex.org/W4302084786"],"related_works":["https://openalex.org/W2103079041","https://openalex.org/W2947266479","https://openalex.org/W2369589212","https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W1579528621","https://openalex.org/W2141620082","https://openalex.org/W2140497172","https://openalex.org/W2168652618","https://openalex.org/W2127247647"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}