{"id":"https://openalex.org/W2138732068","doi":"https://doi.org/10.1007/11901914_30","title":"A Semantic Framework for Test Coverage","display_name":"A Semantic Framework for Test Coverage","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2138732068","doi":"https://doi.org/10.1007/11901914_30","mag":"2138732068"},"language":"en","primary_location":{"id":"doi:10.1007/11901914_30","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11901914_30","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.utwente.nl/en/publications/e20ea2f0-ef0b-4bbb-ba44-6b0efb58cd85","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036298038","display_name":"Laura Brand\u00e1n Briones","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Laura Brand\u00e1n Briones","raw_affiliation_strings":["Faculty of Computer Science, University of Twente, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Computer Science, University of Twente, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070465089","display_name":"Ed Brinksma","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ed Brinksma","raw_affiliation_strings":["Embedded Systems Institute, The Netherlands","Faculty of Computer Science, University of Twente, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Embedded Systems Institute, The Netherlands","institution_ids":[]},{"raw_affiliation_string":"Faculty of Computer Science, University of Twente, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053065289","display_name":"Mari\u00eblle Stoelinga","orcid":"https://orcid.org/0000-0001-6793-8165"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mari\u00eblle Stoelinga","raw_affiliation_strings":["Faculty of Computer Science, University of Twente, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Computer Science, University of Twente, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5036298038"],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.5257,"has_fulltext":true,"cited_by_count":20,"citation_normalized_percentile":{"value":0.82337992,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"399","last_page":"414"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.8048776388168335},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7577094435691833},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.6504566669464111},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.5059525370597839},{"id":"https://openalex.org/keywords/model-based-testing","display_name":"Model-based testing","score":0.48751065135002136},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4768332540988922},{"id":"https://openalex.org/keywords/suite","display_name":"Suite","score":0.4352797269821167},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.43359240889549255},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.3723703622817993},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3290208578109741},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.16681107878684998},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11155310273170471}],"concepts":[{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.8048776388168335},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7577094435691833},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.6504566669464111},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.5059525370597839},{"id":"https://openalex.org/C165825675","wikidata":"https://www.wikidata.org/wiki/Q1399743","display_name":"Model-based testing","level":4,"score":0.48751065135002136},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4768332540988922},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.4352797269821167},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43359240889549255},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.3723703622817993},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3290208578109741},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.16681107878684998},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11155310273170471},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0}],"mesh":[],"locations_count":8,"locations":[{"id":"doi:10.1007/11901914_30","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11901914_30","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"pmh:oai:pure.tue.nl:openaire_cris_publications/d956fab9-7b86-4211-ab3c-af28fe42cfaf","is_oa":false,"landing_page_url":"https://research.tue.nl/en/publications/d956fab9-7b86-4211-ab3c-af28fe42cfaf","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Brand\u00e1n Briones, L, Brinksma, E & Stoelinga, M I A 2006, A semantic framework for test coverage. in S Graf & W Zhang (eds), Automated Technology for Verification and Analysis (Proceedings 4th International Symposium, ATVA 2006, Beijing, China, October 23-26, 2006). Lecture Notes in Computer Science, vol. 4218, Springer, Berlin, pp. 399-414. https://doi.org/10.1007/11901914_30","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/e20ea2f0-ef0b-4bbb-ba44-6b0efb58cd85","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/e20ea2f0-ef0b-4bbb-ba44-6b0efb58cd85","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Brandan Briones, L, Brinksma, H & Stoelinga, M I A 2006, A Semantic Framework for Test Coverage. in S Graf & W Zhang (eds), Automated Technology for Verification and Analysis : 4th International Symposium, ATVA 2006, Beijing, China, October 23-26, 2006. Proceedings. Lecture Notes in Computer Science, vol. 4218, Springer, Berlin, pp. 399-414, 4th International Symposium on Automated Technology for Verification and Analysis, ATVA 2006, Beijing, China, 23/10/06. https://doi.org/10.1007/11901914_30","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:662907","is_oa":false,"landing_page_url":"http://library.tue.nl/csp/dare/LinkToRepository.csp?recordnumber=662907","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:library.tue.nl:662907","is_oa":false,"landing_page_url":"http://repository.tue.nl/662907","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:ris.utwente.nl:publications/c368385d-6950-490f-9f96-0930b26891a2","is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/c368385d-6950-490f-9f96-0930b26891a2","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:tue:oai:pure.tue.nl:publications/d956fab9-7b86-4211-ab3c-af28fe42cfaf","is_oa":false,"landing_page_url":"https://research.tue.nl/nl/publications/d956fab9-7b86-4211-ab3c-af28fe42cfaf","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Automated Technology for Verification and Analysis (Proceedings 4th International Symposium, ATVA 2006, Beijing, China, October 23-26, 2006), 399 - 414","raw_type":"info:eu-repo/semantics/conferencepaper"},{"id":"pmh:ut:oai:ris.utwente.nl:publications/e20ea2f0-ef0b-4bbb-ba44-6b0efb58cd85","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/a-semantic-framework-for-test-coverage(e20ea2f0-ef0b-4bbb-ba44-6b0efb58cd85).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Automated Technology for Verification and Analysis: 4th International Symposium, ATVA 2006, Beijing, China, October 23-26, 2006. Proceedings, 399 - 414","raw_type":"info:eu-repo/semantics/conferencepaper"}],"best_oa_location":{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/e20ea2f0-ef0b-4bbb-ba44-6b0efb58cd85","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/e20ea2f0-ef0b-4bbb-ba44-6b0efb58cd85","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Brandan Briones, L, Brinksma, H & Stoelinga, M I A 2006, A Semantic Framework for Test Coverage. in S Graf & W Zhang (eds), Automated Technology for Verification and Analysis : 4th International Symposium, ATVA 2006, Beijing, China, October 23-26, 2006. Proceedings. Lecture Notes in Computer Science, vol. 4218, Springer, Berlin, pp. 399-414, 4th International Symposium on Automated Technology for Verification and Analysis, ATVA 2006, Beijing, China, 23/10/06. https://doi.org/10.1007/11901914_30","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G629491556","display_name":null,"funder_award_id":"(NWO)","funder_id":"https://openalex.org/F4320321800","funder_display_name":"Nederlandse Organisatie voor Wetenschappelijk Onderzoek"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"},{"id":"https://openalex.org/F4320321800","display_name":"Nederlandse Organisatie voor Wetenschappelijk Onderzoek","ror":"https://ror.org/04jsz6e67"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W150374354","https://openalex.org/W1498542756","https://openalex.org/W1522465028","https://openalex.org/W1586966546","https://openalex.org/W1810828758","https://openalex.org/W1969671537","https://openalex.org/W2004929506","https://openalex.org/W2043603923","https://openalex.org/W2068201344","https://openalex.org/W2110287808","https://openalex.org/W2112640524","https://openalex.org/W2114642899","https://openalex.org/W2119488343","https://openalex.org/W2120713211","https://openalex.org/W2130732685","https://openalex.org/W2138732068","https://openalex.org/W2150154671","https://openalex.org/W2157144873","https://openalex.org/W3010856131"],"related_works":["https://openalex.org/W1968494916","https://openalex.org/W1888619389","https://openalex.org/W2028796071","https://openalex.org/W2086860371","https://openalex.org/W3022870375","https://openalex.org/W2795302276","https://openalex.org/W2521771266","https://openalex.org/W2768752771","https://openalex.org/W3047487993","https://openalex.org/W4376482197"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}