{"id":"https://openalex.org/W1607894563","doi":"https://doi.org/10.1007/11861898_60","title":"Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images","display_name":"Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W1607894563","doi":"https://doi.org/10.1007/11861898_60","mag":"1607894563"},"language":"en","primary_location":{"id":"doi:10.1007/11861898_60","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11861898_60","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039317835","display_name":"Dirk St\u00f6\u00dfel","orcid":null},"institutions":[{"id":"https://openalex.org/I20121455","display_name":"Bielefeld University","ror":"https://ror.org/02hpadn98","country_code":"DE","type":"education","lineage":["https://openalex.org/I20121455"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Dirk St\u00f6\u00dfel","raw_affiliation_strings":["Applied Computer Science, Faculty of Technology, Bielefeld University, P.O. Box 100131, 33501, Bielefeld, Germany"],"affiliations":[{"raw_affiliation_string":"Applied Computer Science, Faculty of Technology, Bielefeld University, P.O. Box 100131, 33501, Bielefeld, Germany","institution_ids":["https://openalex.org/I20121455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079251562","display_name":"Gerhard Sagerer","orcid":null},"institutions":[{"id":"https://openalex.org/I20121455","display_name":"Bielefeld University","ror":"https://ror.org/02hpadn98","country_code":"DE","type":"education","lineage":["https://openalex.org/I20121455"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Gerhard Sagerer","raw_affiliation_strings":["Applied Computer Science, Faculty of Technology, Bielefeld University, P.O. Box 100131, 33501, Bielefeld, Germany"],"affiliations":[{"raw_affiliation_string":"Applied Computer Science, Faculty of Technology, Bielefeld University, P.O. Box 100131, 33501, Bielefeld, Germany","institution_ids":["https://openalex.org/I20121455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5039317835"],"corresponding_institution_ids":["https://openalex.org/I20121455"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.1687,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.81299886,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"597","last_page":"606"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7804056406021118},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.761493444442749},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7304009199142456},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.6926813721656799},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.5875576734542847},{"id":"https://openalex.org/keywords/monocular","display_name":"Monocular","score":0.5596762299537659},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5362927317619324},{"id":"https://openalex.org/keywords/pose","display_name":"Pose","score":0.5299450159072876},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4596424102783203},{"id":"https://openalex.org/keywords/particle-filter","display_name":"Particle filter","score":0.45771756768226624},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.43785449862480164},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.435791552066803},{"id":"https://openalex.org/keywords/monocular-vision","display_name":"Monocular vision","score":0.43208375573158264},{"id":"https://openalex.org/keywords/3d-pose-estimation","display_name":"3D pose estimation","score":0.4242894649505615},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10519981384277344},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08611732721328735}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7804056406021118},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.761493444442749},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7304009199142456},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.6926813721656799},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.5875576734542847},{"id":"https://openalex.org/C65909025","wikidata":"https://www.wikidata.org/wiki/Q1945033","display_name":"Monocular","level":2,"score":0.5596762299537659},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5362927317619324},{"id":"https://openalex.org/C52102323","wikidata":"https://www.wikidata.org/wiki/Q1671968","display_name":"Pose","level":2,"score":0.5299450159072876},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4596424102783203},{"id":"https://openalex.org/C52421305","wikidata":"https://www.wikidata.org/wiki/Q1151499","display_name":"Particle filter","level":3,"score":0.45771756768226624},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.43785449862480164},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.435791552066803},{"id":"https://openalex.org/C158829959","wikidata":"https://www.wikidata.org/wiki/Q1640606","display_name":"Monocular vision","level":2,"score":0.43208375573158264},{"id":"https://openalex.org/C36613465","wikidata":"https://www.wikidata.org/wiki/Q4636322","display_name":"3D pose estimation","level":3,"score":0.4242894649505615},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10519981384277344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08611732721328735},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/11861898_60","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11861898_60","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"pmh:oai:pub.librecat.org:2618201","is_oa":false,"landing_page_url":"https://pub.uni-bielefeld.de/record/2618201","pdf_url":null,"source":{"id":"https://openalex.org/S4306401671","display_name":"PUB \u2013 Publications at Bielefeld University (Bielefeld University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I20121455","host_organization_name":"Bielefeld University","host_organization_lineage":["https://openalex.org/I20121455"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"St\u00f6\u00dfel D, Sagerer G. Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images. In: Franke K, M\u00fcller K-R, Nickolay B, Sch\u00e4fer R, eds. <em>Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings</em>. Lecture Notes in Computer Science, 4174. Heidelberg, Germany: Springer-Verlag;  2006: 597-606.","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W83635139","https://openalex.org/W1489514848","https://openalex.org/W1496207650","https://openalex.org/W1500796970","https://openalex.org/W1516767093","https://openalex.org/W1602797708","https://openalex.org/W1910898529","https://openalex.org/W2000630595","https://openalex.org/W2049981393","https://openalex.org/W2067191022","https://openalex.org/W2069537876","https://openalex.org/W2084406405","https://openalex.org/W2096196978","https://openalex.org/W2099046646","https://openalex.org/W2118741216","https://openalex.org/W2149107824","https://openalex.org/W2502896360","https://openalex.org/W2800394774","https://openalex.org/W3017143921"],"related_works":["https://openalex.org/W4253893311","https://openalex.org/W2798721181","https://openalex.org/W3201205132","https://openalex.org/W3213997683","https://openalex.org/W4287600488","https://openalex.org/W4312694060","https://openalex.org/W4386075737","https://openalex.org/W4281696776","https://openalex.org/W4318148659","https://openalex.org/W4307623796"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}