{"id":"https://openalex.org/W1510823152","doi":"https://doi.org/10.1007/11760191_149","title":"Prediction of Plasma Enhanced Deposition Process Using GA-Optimized GRNN","display_name":"Prediction of Plasma Enhanced Deposition Process Using GA-Optimized GRNN","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W1510823152","doi":"https://doi.org/10.1007/11760191_149","mag":"1510823152"},"language":"en","primary_location":{"id":"doi:10.1007/11760191_149","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11760191_149","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088194281","display_name":"Byungwhan Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Byungwhan Kim","raw_affiliation_strings":["Department of Electronic Engineering, Sejong University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Sejong University, Seoul, Korea","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053396598","display_name":"Dukwoo Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dukwoo Lee","raw_affiliation_strings":["Department of Electronic Engineering, Sejong University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Sejong University, Seoul, Korea","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109884927","display_name":"Seung Soo Han","orcid":null},"institutions":[{"id":"https://openalex.org/I89440247","display_name":"Myongji University","ror":"https://ror.org/00s9dpb54","country_code":"KR","type":"education","lineage":["https://openalex.org/I89440247"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung Soo Han","raw_affiliation_strings":["Department of Information Engineering, Myongji University, Yongin, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Myongji University, Yongin, Korea","institution_ids":["https://openalex.org/I89440247"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5088194281"],"corresponding_institution_ids":["https://openalex.org/I28777354"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":1.5798,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.84927212,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1020","last_page":"1027"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.978600025177002,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.978600025177002,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.705716073513031},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6441771984100342},{"id":"https://openalex.org/keywords/regression","display_name":"Regression","score":0.5931923389434814},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.5189933180809021},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5026957988739014},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5013265609741211},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.48730528354644775},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.445323646068573},{"id":"https://openalex.org/keywords/deposition","display_name":"Deposition (geology)","score":0.4369981288909912},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4306855797767639},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.4266614615917206},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4184541404247284},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.23882073163986206},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1664251983165741},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16461598873138428}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.705716073513031},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6441771984100342},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.5931923389434814},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.5189933180809021},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5026957988739014},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5013265609741211},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.48730528354644775},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.445323646068573},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.4369981288909912},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4306855797767639},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.4266614615917206},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4184541404247284},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.23882073163986206},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1664251983165741},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16461598873138428},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/11760191_149","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11760191_149","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1973590274","https://openalex.org/W2000776102","https://openalex.org/W2022434044","https://openalex.org/W2029949252","https://openalex.org/W2074528568","https://openalex.org/W2099154409","https://openalex.org/W2134087112","https://openalex.org/W2149723649","https://openalex.org/W2151887008","https://openalex.org/W2152150600","https://openalex.org/W2904250082","https://openalex.org/W3011460294","https://openalex.org/W3023540311","https://openalex.org/W3207342693","https://openalex.org/W4232569293","https://openalex.org/W4300402905"],"related_works":["https://openalex.org/W4289356671","https://openalex.org/W2389155397","https://openalex.org/W2165884543","https://openalex.org/W2312753042","https://openalex.org/W3186837933","https://openalex.org/W2368989808","https://openalex.org/W2034959125","https://openalex.org/W2355687852","https://openalex.org/W2621086889","https://openalex.org/W3174513558"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}