{"id":"https://openalex.org/W1557162139","doi":"https://doi.org/10.1007/11499145_60","title":"Shape-Based Co-occurrence Matrices for Defect Classification","display_name":"Shape-Based Co-occurrence Matrices for Defect Classification","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W1557162139","doi":"https://doi.org/10.1007/11499145_60","mag":"1557162139"},"language":"en","primary_location":{"id":"doi:10.1007/11499145_60","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11499145_60","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022129967","display_name":"Rami Rautkorpi","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Rami Rautkorpi","raw_affiliation_strings":["Laboratory of Computer and Information Science, Helsinki University of Technology, P.O. Box 5400, FIN-02015 HUT, Finland"],"affiliations":[{"raw_affiliation_string":"Laboratory of Computer and Information Science, Helsinki University of Technology, P.O. Box 5400, FIN-02015 HUT, Finland","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053749743","display_name":"Jukka Iivarinen","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jukka Iivarinen","raw_affiliation_strings":["Laboratory of Computer and Information Science, Helsinki University of Technology, P.O. Box 5400, FIN-02015 HUT, Finland"],"affiliations":[{"raw_affiliation_string":"Laboratory of Computer and Information Science, Helsinki University of Technology, P.O. Box 5400, FIN-02015 HUT, Finland","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5022129967"],"corresponding_institution_ids":[],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.12750366,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"588","last_page":"597"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.7310234904289246},{"id":"https://openalex.org/keywords/co-occurrence-matrix","display_name":"Co-occurrence matrix","score":0.719067394733429},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7077040672302246},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.6346706748008728},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.623680830001831},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5644907355308533},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.5535703301429749},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.44510456919670105},{"id":"https://openalex.org/keywords/contextual-image-classification","display_name":"Contextual image classification","score":0.42801183462142944},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.38347578048706055},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3566179871559143},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3288789987564087},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20069441199302673},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.16905716061592102},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.13355687260627747},{"id":"https://openalex.org/keywords/image-texture","display_name":"Image texture","score":0.06931084394454956}],"concepts":[{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.7310234904289246},{"id":"https://openalex.org/C117479156","wikidata":"https://www.wikidata.org/wiki/Q1543908","display_name":"Co-occurrence matrix","level":5,"score":0.719067394733429},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7077040672302246},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.6346706748008728},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.623680830001831},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5644907355308533},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.5535703301429749},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.44510456919670105},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.42801183462142944},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.38347578048706055},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3566179871559143},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3288789987564087},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20069441199302673},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.16905716061592102},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.13355687260627747},{"id":"https://openalex.org/C63099799","wikidata":"https://www.wikidata.org/wiki/Q17147001","display_name":"Image texture","level":4,"score":0.06931084394454956},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/11499145_60","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11499145_60","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W185774103","https://openalex.org/W1485800236","https://openalex.org/W1502599625","https://openalex.org/W1970693654","https://openalex.org/W1984648382","https://openalex.org/W2003938193","https://openalex.org/W2014121404","https://openalex.org/W2044465660","https://openalex.org/W2116044718","https://openalex.org/W2124754244","https://openalex.org/W2140504787","https://openalex.org/W2798501834","https://openalex.org/W3013905815","https://openalex.org/W7010647825"],"related_works":["https://openalex.org/W2017973481","https://openalex.org/W2366706511","https://openalex.org/W2799833988","https://openalex.org/W2369924312","https://openalex.org/W2979316862","https://openalex.org/W2565656575","https://openalex.org/W2241457321","https://openalex.org/W2096743164","https://openalex.org/W1966354130","https://openalex.org/W2076426818"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}