{"id":"https://openalex.org/W1492304173","doi":"https://doi.org/10.1007/11408901_25","title":"Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs","display_name":"Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W1492304173","doi":"https://doi.org/10.1007/11408901_25","mag":"1492304173"},"language":"en","primary_location":{"id":"doi:10.1007/11408901_25","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11408901_25","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},"type":"book-chapter","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":true,"raw_author_name":"Jaan Raik","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Raja 15, 12618, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Raja 15, 12618, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010536057","display_name":"Raimund Ubar","orcid":"https://orcid.org/0000-0001-8186-4385"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Raimund Ubar","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Raja 15, 12618, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Raja 15, 12618, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054970559","display_name":"Sergei Devadze","orcid":"https://orcid.org/0000-0001-7445-3801"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Sergei Devadze","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Raja 15, 12618, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Raja 15, 12618, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059021602","display_name":"Artur Jutman","orcid":"https://orcid.org/0000-0002-2018-5589"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Artur Jutman","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Raja 15, 12618, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Raja 15, 12618, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5010286547"],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":{"value":5000,"currency":"EUR","value_usd":5392},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.08540925,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"332","last_page":"344"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7942235469818115},{"id":"https://openalex.org/keywords/binary-decision-diagram","display_name":"Binary decision diagram","score":0.7773734331130981},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7104700207710266},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.6468609571456909},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5886727571487427},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5602977871894836},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5448375940322876},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5442185997962952},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5283708572387695},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4947664141654968},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.48689785599708557},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.46448808908462524},{"id":"https://openalex.org/keywords/logic-simulation","display_name":"Logic simulation","score":0.43320155143737793},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3348035216331482},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.27506905794143677},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2304142415523529},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.20313438773155212},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11462798714637756},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10026299953460693},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06927871704101562},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.06422734260559082}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7942235469818115},{"id":"https://openalex.org/C3309909","wikidata":"https://www.wikidata.org/wiki/Q864155","display_name":"Binary decision diagram","level":2,"score":0.7773734331130981},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7104700207710266},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.6468609571456909},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5886727571487427},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5602977871894836},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5448375940322876},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5442185997962952},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5283708572387695},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4947664141654968},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.48689785599708557},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.46448808908462524},{"id":"https://openalex.org/C64859876","wikidata":"https://www.wikidata.org/wiki/Q173673","display_name":"Logic simulation","level":3,"score":0.43320155143737793},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3348035216331482},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.27506905794143677},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2304142415523529},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.20313438773155212},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11462798714637756},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10026299953460693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06927871704101562},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06422734260559082},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/11408901_25","is_oa":false,"landing_page_url":"https://doi.org/10.1007/11408901_25","pdf_url":null,"source":{"id":"https://openalex.org/S106296714","display_name":"Lecture notes in computer science","issn_l":"0302-9743","issn":["0302-9743","1611-3349"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lecture Notes in Computer Science","raw_type":"book-chapter"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.82.754","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.82.754","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.pld.ttu.ee/~jaan/PDF/p111.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2021218329","https://openalex.org/W2069246068","https://openalex.org/W2076000316","https://openalex.org/W2152040677","https://openalex.org/W2168881618","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W3148663848","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W2278517150","https://openalex.org/W2100555553","https://openalex.org/W2061946964","https://openalex.org/W3150960233","https://openalex.org/W2147400189","https://openalex.org/W2128501201"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}