{"id":"https://openalex.org/W1988515436","doi":"https://doi.org/10.1002/cta.4490190606","title":"Parametric yield optimization of CMOS analogue circuits by quadratic statistical circuit performance models","display_name":"Parametric yield optimization of CMOS analogue circuits by quadratic statistical circuit performance models","publication_year":1991,"publication_date":"1991-11-01","ids":{"openalex":"https://openalex.org/W1988515436","doi":"https://doi.org/10.1002/cta.4490190606","mag":"1988515436"},"language":"en","primary_location":{"id":"doi:10.1002/cta.4490190606","is_oa":false,"landing_page_url":"https://doi.org/10.1002/cta.4490190606","pdf_url":null,"source":{"id":"https://openalex.org/S92132303","display_name":"International Journal of Circuit Theory and Applications","issn_l":"0098-9886","issn":["0098-9886","1097-007X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Circuit Theory and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038446813","display_name":"Tianhao Yu","orcid":"https://orcid.org/0000-0001-5406-135X"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. K. Yu","raw_affiliation_strings":["Coordinated Science Laboratory and Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1101 W. Springfield Avenue, Urbana, IL 61801, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Coordinated Science Laboratory and Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1101 W. Springfield Avenue, Urbana, IL 61801, U.S.A","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009963704","display_name":"Sung Mo Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. M. Kang","raw_affiliation_strings":["Coordinated Science Laboratory and Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1101 W. Springfield Avenue, Urbana, IL 61801, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Coordinated Science Laboratory and Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1101 W. Springfield Avenue, Urbana, IL 61801, U.S.A","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110049254","display_name":"J. Sacks","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Sacks","raw_affiliation_strings":["Department of Statistics, University of Illinois at Urbana-Champaign, 725 S. Wright Street, Champaign, IL 61820, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Statistics, University of Illinois at Urbana-Champaign, 725 S. Wright Street, Champaign, IL 61820, U.S.A","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043650697","display_name":"William J. Welch","orcid":"https://orcid.org/0000-0002-4575-3124"},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"W. J. Welch","raw_affiliation_strings":["Department of Statistics and Actuarial Science, University of Waterloo, Waterloo, Ont. N2L 3G1, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Statistics and Actuarial Science, University of Waterloo, Waterloo, Ont. N2L 3G1, Canada","institution_ids":["https://openalex.org/I151746483"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5009963704"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":{"value":3660,"currency":"USD","value_usd":3660},"apc_paid":null,"fwci":0.5035,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.6312318,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"19","issue":"6","first_page":"579","last_page":"592"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10848","display_name":"Advanced Multi-Objective Optimization Algorithms","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7507781982421875},{"id":"https://openalex.org/keywords/quadratic-equation","display_name":"Quadratic equation","score":0.6138129234313965},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5827574729919434},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5786753296852112},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.5352279543876648},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5334029197692871},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.501549243927002},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48742392659187317},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.4680573344230652},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.4592961370944977},{"id":"https://openalex.org/keywords/circuit-extraction","display_name":"Circuit extraction","score":0.42660197615623474},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3453659117221832},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.27651137113571167},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.27047309279441833},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22189012169837952},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14287030696868896},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10761728882789612},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06967082619667053}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7507781982421875},{"id":"https://openalex.org/C129844170","wikidata":"https://www.wikidata.org/wiki/Q41299","display_name":"Quadratic equation","level":2,"score":0.6138129234313965},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5827574729919434},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5786753296852112},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.5352279543876648},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5334029197692871},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.501549243927002},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48742392659187317},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.4680573344230652},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.4592961370944977},{"id":"https://openalex.org/C26490066","wikidata":"https://www.wikidata.org/wiki/Q17006835","display_name":"Circuit extraction","level":4,"score":0.42660197615623474},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3453659117221832},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.27651137113571167},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.27047309279441833},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22189012169837952},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14287030696868896},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10761728882789612},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06967082619667053},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/cta.4490190606","is_oa":false,"landing_page_url":"https://doi.org/10.1002/cta.4490190606","pdf_url":null,"source":{"id":"https://openalex.org/S92132303","display_name":"International Journal of Circuit Theory and Applications","issn_l":"0098-9886","issn":["0098-9886","1097-007X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Circuit Theory and Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1536945048","https://openalex.org/W1980263616","https://openalex.org/W1993715096","https://openalex.org/W1996504473","https://openalex.org/W2006846272","https://openalex.org/W2022480405","https://openalex.org/W2025995062","https://openalex.org/W2038669746","https://openalex.org/W2044166603","https://openalex.org/W2064206680","https://openalex.org/W2066840192","https://openalex.org/W2105222294","https://openalex.org/W2111771106","https://openalex.org/W2129255002","https://openalex.org/W2132399001","https://openalex.org/W2133930273","https://openalex.org/W3027485947","https://openalex.org/W4243645092"],"related_works":["https://openalex.org/W2390607226","https://openalex.org/W2393658466","https://openalex.org/W2383563100","https://openalex.org/W2375888161","https://openalex.org/W2355158303","https://openalex.org/W1703071360","https://openalex.org/W3034130800","https://openalex.org/W2368652795","https://openalex.org/W2375792528","https://openalex.org/W2036121598"],"abstract_inverted_index":{"Abstract":[0],"A":[1],"major":[2],"bottleneck":[3],"in":[4,16],"the":[5,17,21,29,35,51,66,83,96,99,124],"design":[6,136],"and":[7,42,94,104,127],"parametric":[8,52,67],"yield":[9,68,105],"optimization":[10],"of":[11,20,69,98,115,130],"CMOS":[12,70],"integrated":[13],"circuits":[14],"lies":[15],"high":[18],"cost":[19,31],"circuit":[22,36,59,84,116,135],"simulations.":[23],"One":[24],"method":[25,126],"that":[26,76],"significantly":[27],"reduces":[28],"simulation":[30],"is":[32,74],"to":[33,49,64,92,133],"approximate":[34],"performances":[37,85],"by":[38],"fitted":[39],"quadratic":[40,57,77,131],"models":[41,48,61,103],"then":[43],"use":[44],"these":[45],"computationally":[46],"inexpensive":[47],"optimize":[50],"yield.":[53],"In":[54],"this":[55],"paper":[56],"statistical":[58,134],"performance":[60,102],"are":[62,137],"applied":[63,91],"maximize":[65],"analogue":[71],"circuits.":[72],"It":[73],"found":[75],"polynomials":[78],"may":[79],"not":[80],"always":[81],"model":[82],"well.":[86],"However,":[87],"with":[88,110],"engineering":[89],"knowledge":[90],"identify":[93],"reduce":[95],"causes":[97],"errors,":[100],"accurate":[101],"maximization":[106],"can":[107],"be":[108],"achieved":[109],"a":[111],"reasonably":[112],"small":[113],"number":[114],"simulations,":[117],"as":[118],"illustrated":[119],"through":[120],"examples.":[121],"Distinctions":[122],"between":[123],"present":[125],"previous":[128],"applications":[129],"modelling":[132],"made.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}